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公开(公告)号:US11662662B2
公开(公告)日:2023-05-30
申请号:US16994957
申请日:2020-08-17
发明人: Hyunji Song , Sukkoo Hong , Sumin Kim , Yechan Kim , Juyoung Kim , Jinjoo Kim , Hyunwoo Kim , Juhyeon Park , Songse Yi
IPC分类号: G03F7/004 , G03F7/039 , C07D213/68 , C07D263/32 , C07D233/64 , C07D277/26
CPC分类号: G03F7/0045 , C07D213/68 , C07D233/64 , C07D263/32 , C07D277/26 , G03F7/0392
摘要: A photo-decomposable compound, a photoresist composition, and a method of manufacturing an IC device, the compound generating acid upon exposure and acts as a quenching base that neutralizes acid in an unexposed state and being represented by Formula 1:
wherein, in Formula 1, Ra is a C5 to C40 substituted or unsubstituted cyclic hydrocarbon group including at least one nitrogen atom, Ya is a C1 to C20 divalent linear or cyclic hydrocarbon group, n is an integer of 1 to 5, and A+ is a counter ion.-
公开(公告)号:US11681219B2
公开(公告)日:2023-06-20
申请号:US16991281
申请日:2020-08-12
发明人: Yechan Kim , Su Min Kim , Ju-Young Kim , Jinjoo Kim , Hyunwoo Kim , Juhyeon Park , Hyunji Song , Songse Yi , Suk Koo Hong
IPC分类号: G03F7/004 , C08L35/00 , C07C381/12 , C08L25/06
CPC分类号: G03F7/0045 , C07C381/12 , C08L25/06 , C08L35/00
摘要: A resist composition including a polymer; and a compound represented by Formula 1,
in Formula 1, R1 is hydrogen, a halogen, an alkyl group having 1 to 7 carbon atoms, a carbonyl group having 1 to 7 carbon atoms, an ester group having 1 to 7 carbon atoms, an acetal group having 1 to 7 carbon atoms, an alkoxy group having 1 to 7 carbon atoms, an ether group having 1 to 7 carbon atoms, or a group represented by Formula R, and R2, R3, R4 and R5 are hydrogen, a halogen, an alkyl group having 1 to 7 carbon atoms, an ester group having 1 to 7 carbon atoms, an acetal group having 1 to 7 carbon atoms, an alkoxy group having 1 to 7 carbon atoms, or an ether group having 1 to 7 carbon atoms,-
公开(公告)号:US20230152694A1
公开(公告)日:2023-05-18
申请号:US18056332
申请日:2022-11-17
发明人: HONGGU IM , Sumin Kim , Yechan Kim , Jinjoo Kim , Hyunwoo Kim , Sunghwan Park , Juhyeon Park , Jicheol Park , Giyoung Song , Sukkoo Hong
IPC分类号: G03F7/038
CPC分类号: G03F7/0384
摘要: Photoresist compositions may include a photosensitive polymer including a first repeating unit of Chemical Formula 1; a photoacid generator (PAG); and a solvent.
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