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公开(公告)号:US20240071895A1
公开(公告)日:2024-02-29
申请号:US18353279
申请日:2023-07-17
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Seoeun KYUNG , Byung Ho KIM , Youngbae KIM , Hongwon KIM , Seokwon LEE , Jae-Ean LEE , Dahee KIM
IPC: H01L23/498 , H01L23/00 , H01L23/538 , H01L25/10 , H01L25/18
CPC classification number: H01L23/49838 , H01L23/5386 , H01L24/16 , H01L25/105 , H01L25/18 , H01L23/3128 , H01L23/49822 , H01L23/5385 , H01L24/48 , H01L2224/16227 , H01L2224/48091 , H01L2224/48105 , H01L2224/48227 , H01L2225/1035 , H01L2225/1058
Abstract: A semiconductor package may include a lower redistribution layer including a lower wiring and a lower via, an embedded region on the lower redistribution layer, a core layer on the lower redistribution layer and including a core via, and an under bump structure including an under bump pad on a lower surface of the lower redistribution layer and an under bump via connecting the lower wiring and the under bump pad, the under bump pad may overlap the under bump via, the lower via, and the core via in a plan view, and the under bump via may be spaced apart from at least one of the lower via and the core via in the plan view.
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公开(公告)号:US20210407962A1
公开(公告)日:2021-12-30
申请号:US17154789
申请日:2021-01-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hongwon KIM , Junmo KOO , Yeonjoo KIM , Yunhee KIM , Jongkook KIM , Doohwan LEE , Jeongho LEE
IPC: H01L25/065 , H01L23/538 , H01L23/31 , H01L23/498 , H01L23/00
Abstract: A semiconductor package includes a base substrate, an interposer package disposed on the base substrate, and first and second semiconductor chips disposed on the interposer package, the interposer package includes a first redistribution layer, a bridge chip including a bridge circuit, and a vertical connection structure including a plurality of wiring layers, and wherein each of the first semiconductor chip and the second semiconductor chip is electrically connected to the bridge circuit and the plurality of wiring layers through the first redistribution layer.
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公开(公告)号:US20250046728A1
公开(公告)日:2025-02-06
申请号:US18429538
申请日:2024-02-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Dongwon KANG , Hongwon KIM , Changyeon SONG , Sunguk LEE , Jae-Ean LEE
IPC: H01L23/544 , H01L23/00 , H01L23/498
Abstract: A semiconductor package may include a semiconductor chip and an upper redistribution layer including a marking structure on the semiconductor chip, an upper insulating layer surrounding the marking structure, and an outer insulating layer on the upper insulating layer, wherein the marking structure may include a lower marking pattern, a marking via on the lower marking pattern, and an upper marking pattern on the marking via, the upper marking pattern may include a first conductive pattern on the marking via and a second conductive pattern on the first conductive pattern, and the second conductive pattern may be exposed by a trench defined by the outer insulating layer.
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