公开(公告)号：US08773298B2

公开(公告)日：2014-07-08

申请号：US13794308

申请日：2013-03-11

Applicant: Renesas Electronics Corporation

Inventor： Takashi Matsumoto ,  Masao Ito ,  Osamu Matsumoto ,  Hiroto Suzuki

IPC: H03M1/34 ,  H03M1/38

CPC classification number: H03M1/38 ,  H03M1/0697 ,  H03M1/46

Abstract: A successive approximation register A/D converter that obtains an output of N bits interrupts operation at a timing when the operation of the successive approximation register A/D converter is affected on the basis of circuit timing in an integrated circuit. The A/D converter performs a comparison between a sampling signal and a comparison reference voltage by a sampling period in which an analog signal is sampled, a comparison period of N states in which the sampled signal is sequentially compared with a comparison voltage for each bit, and a reserve period of M states following the comparison period. When an operation is temporarily interrupted, the A/D converter performs a comparison operation of a bit, whereas the comparison is not performed in the reserve period.

Abstract translation: 在逐次逼近寄存器A / D转换器的操作基于集成电路中的电路定时受到影响的定时，获得N位输出的逐次逼近寄存器A / D转换器中断操作。 A / D转换器将采样信号和比较参考电压进行比较，其中采样模拟信号的采样周期，将采样信号顺序地与每个位的比较电压相比较的N个状态的比较周期 ，以及比较期间M州的储备期。 当操作暂时中断时，A / D转换器执行位的比较操作，而在保留期间不进行比较。

公开(公告)号：US10921359B2

公开(公告)日：2021-02-16

申请号：US16247036

申请日：2019-01-14

Applicant: RENESAS ELECTRONICS CORPORATION

Inventor： Hiroto Suzuki

IPC: G01R31/00 ,  G01R27/26 ,  H03F3/45

Abstract: A provided impedance measuring semiconductor circuit can suppress the influence of sensors on the measurements of other sensors in the measurements of the sensors. According to an embodiment, an impedance measuring semiconductor circuit includes a first resistance element, an operational amplifier having a positive input terminal and an output terminal, the positive input terminal receiving a predetermined set voltage, the output terminal being coupled to one end of the first resistance element, a first output-side switch that electrically couples or decouples a first sensor and the other end of the first resistance element, a second output-side switch that electrically couples or decouples a second sensor and the other end of the first resistance element, a first input-side switch that electrically couples or decouples the first sensor and a negative input terminal, and a second input-side switch that electrically couples or decouples the second sensor and the negative input terminal.

公开(公告)号：US09559716B1

公开(公告)日：2017-01-31

申请号：US15197447

申请日：2016-06-29

Applicant: Renesas Electronics Corporation

Inventor： Tetsuo Matsui ,  Hiroto Suzuki ,  Masaki Fujiwara ,  Tetsuro Matsuno

IPC: H03M1/06 ,  H03M1/46 ,  H03M1/12

CPC classification number: H03M1/46 ,  H03M1/069 ,  H03M1/1061 ,  H03M1/124 ,  H03M1/468

Abstract: A processing speed can be improved while the accuracy of AD conversion is enhanced. An AD converter includes: a higher-order DAC that samples an analog input signal and performs DA conversion corresponding to higher-order bits of a digital output signal; an extension DAC that performs DA conversion to positive and negative polarities on an extension bit for expanding bits of the higher-order DAC; a lower-order DAC that performs DA conversion corresponding to lower-order bits of the digital output signal; a comparator that compares a comparison reference voltage with output voltages of the higher-order DAC, the extension DAC, and the lower-order DAC; and a successive approximation logic that controls successive approximation performed by the higher-order DAC, the extension DAC, and the lower-order DAC based on a comparison result of the comparator and generates the digital output signal.

Abstract translation: 可以提高处理速度，同时提高AD转换的精度。 AD转换器包括：高阶DAC，其对模拟输入信号进行采样，并对数字输出信号的高位进行DA转换; 扩展DAC，用于在用于扩展高阶DAC的位的扩展位上执行DA转换为正极性和负极性; 执行对应于数字输出信号的低阶位的DA转换的低阶DAC; 将比较参考电压与高阶DAC，扩展DAC和低阶DAC的输出电压进行比较的比较器; 以及基于比较器的比较结果控制由高阶DAC，扩展DAC和低阶DAC执行的逐次逼近的逐次逼近逻辑，并产生数字输出信号。