A provided impedance measuring semiconductor circuit can suppress the influence of sensors on the measurements of other sensors in the measurements of the sensors. According to an embodiment, an impedance measuring semiconductor circuit includes a first resistance element, an operational amplifier having a positive input terminal and an output terminal, the positive input terminal receiving a predetermined set voltage, the output terminal being coupled to one end of the first resistance element, a first output-side switch that electrically couples or decouples a first sensor and the other end of the first resistance element, a second output-side switch that electrically couples or decouples a second sensor and the other end of the first resistance element, a first input-side switch that electrically couples or decouples the first sensor and a negative input terminal, and a second input-side switch that electrically couples or decouples the second sensor and the negative input terminal.