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公开(公告)号：US20230236112A1
公开(公告)日：2023-07-27
申请号：US18162385
申请日：2023-01-31
发明人： Craig Prater , Kevin Kjoller , Roshan Shetty
CPC分类号： G01N21/171 , G01J3/2823 , G01J3/427 , G01J3/4406 , G01J3/4412 , G01N21/6458 , G01N21/65 , G01N2021/1714
摘要： System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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2.发明申请公开(公告)号：US20230063843A1
公开(公告)日：2023-03-02
申请号：US17796822
申请日：2021-02-01
发明人： Craig Prater , Derek Decker , David Grigg
摘要： A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.
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公开(公告)号：US10969405B2
公开(公告)日：2021-04-06
申请号：US15826147
申请日：2017-11-29
发明人： Roshan Shetty , Kevin Kjoller , Craig Prater
IPC分类号： G01N21/17 , G01N21/31 , G01N21/65 , G01Q30/02 , G01N21/3563
摘要： Methods and apparatus for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including atomic force microscopy, infrared spectroscopy, confocal microscopy, Raman spectroscopy and mass spectrometry. For infrared spectroscopy, a sample is illuminated with infrared light and the resulting sample distortion is read out with either a focused UV/visible light beam and/or AFM tip. Using the AFM tip or the UV/visible light beam it is possible to measure the IR absorption characteristics of a sample with spatial resolution ranging from around 1 μm or less to the nanometer scale. The combination of both techniques provides a rapid and large area survey scan with the UV/visible light and a high resolution measurement with the AFM tip. The methods and apparatus also include the ability to analyze light reflected/scattered from the sample via a Raman spectrometer for complementary analysis by Raman spectroscopy. Using a UV/vis source or IR source at higher intensity it is possible to thermally desorb material from a sample for analysis by mass spectrometry. The AFM tip can also be heated to desorb material for mass spec analysis at even higher spatial resolution.
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公开(公告)号：US20190120753A1
公开(公告)日：2019-04-25
申请号：US16155089
申请日：2018-10-09
发明人： Craig Prater , Kevin Kjoller , Roshan Shetty
IPC分类号： G01N21/35 , G01N21/65 , G01N21/59 , G01N21/552 , G01N23/20091 , G01N23/207 , H01J49/26 , H01J37/26
摘要： System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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5.发明公开公开(公告)号：US20240280477A1
公开(公告)日：2024-08-22
申请号：US18171161
申请日：2023-02-17
发明人： Craig Prater , Kevin Kjoller
IPC分类号： G01N21/35 , G06T5/50 , G06V10/141 , H04N23/20
CPC分类号： G01N21/35 , G06T5/50 , G06V10/141 , H04N23/20 , G06T2207/10024 , G06T2207/10048 , G06T2207/20221
摘要： Methods described herein provide improvements on composite infrared absorption imaging. Scanning patterns described herein reduce erroneous measurements caused by thermal drift, as well as optical interference that occurs between light scattering from the top surface of the sample and light scattering from an underlying substrate.
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公开(公告)号：US12066328B2
公开(公告)日：2024-08-20
申请号：US17955122
申请日：2022-09-28
发明人： Derek Decker , Craig Prater
CPC分类号： G01J3/0297 , G01J3/0216 , G01J3/0229 , G01J3/108 , G01J2003/102
摘要： Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
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7.发明公开公开(公告)号：US20240110872A1
公开(公告)日：2024-04-04
申请号：US18538506
申请日：2023-12-13
发明人： Craig Prater
IPC分类号： G01N21/64 , G01J3/02 , G01N21/3563 , G01N21/359
CPC分类号： G01N21/645 , G01J3/0227 , G01N21/3563 , G01N21/359 , G01N21/6428 , G01N21/6456 , G01N2021/3595 , G01N2021/6471
摘要： Embodiments disclosed include methods and apparatus for Fluorescent Enhanced Photothermal Infrared (FE-PTIR) spectroscopy and chemical imaging, which enables high sensitivity and high spatial resolution measurements of IR absorption with simultaneous confocal fluorescence imaging. In various embodiments, the FE-PTIR technique utilizes combined/simultaneous OPTIR and fluorescence imaging that provides significant improvements and benefits compared to previous work by simultaneous detection of both IR absorption and confocal fluorescence using the same optical detector at the same time.
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公开(公告)号：US20220065772A1
公开(公告)日：2022-03-03
申请号：US17316453
申请日：2021-05-10
发明人： Craig Prater , Kevin Kjoller , Roshan Shetty
摘要： System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US20210215601A1
公开(公告)日：2021-07-15
申请号：US17250124
申请日：2019-05-31
发明人： Craig Prater , Derek Decker , Roshan Shetty
IPC分类号： G01N21/3563 , H04N5/235 , G06T7/00 , G02B21/36 , G02B21/06
摘要： Apparatuses and methods for microscopic analysis of a sample by simultaneously characterizing infrared absorption characteristics of a plurality of spatially resolved locations are described herein. These apparatuses and methods improve sampling times while collecting microscopic data regarding composition of a sample across a wide field.
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公开(公告)号：US10942116B2
公开(公告)日：2021-03-09
申请号：US16155089
申请日：2018-10-09
发明人： Craig Prater , Kevin Kjoller , Roshan Shetty
IPC分类号： G01N21/35 , G01N21/65 , G01N21/59 , H01J37/26 , G01N23/20091 , G01N23/207 , G01N21/552 , G01N21/17 , G01N21/3563 , H01J49/26 , G01N21/47 , G01N21/64
摘要： System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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