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公开(公告)号：US20230236112A1
公开(公告)日：2023-07-27
申请号：US18162385
申请日：2023-01-31
发明人： Craig Prater , Kevin Kjoller , Roshan Shetty
CPC分类号： G01N21/171 , G01J3/2823 , G01J3/427 , G01J3/4406 , G01J3/4412 , G01N21/6458 , G01N21/65 , G01N2021/1714
摘要： System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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2.发明申请公开(公告)号：US20230063843A1
公开(公告)日：2023-03-02
申请号：US17796822
申请日：2021-02-01
发明人： Craig Prater , Derek Decker , David Grigg
摘要： A system for infrared analysis over a wide field area of a sample is disclosed herein that relies on interference of non-diffractively separated beams of light containing image data corresponding to the sample, as well as a photothermal effect on the sample.
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公开(公告)号：US10969405B2
公开(公告)日：2021-04-06
申请号：US15826147
申请日：2017-11-29
发明人： Roshan Shetty , Kevin Kjoller , Craig Prater
IPC分类号： G01N21/17 , G01N21/31 , G01N21/65 , G01Q30/02 , G01N21/3563
摘要： Methods and apparatus for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including atomic force microscopy, infrared spectroscopy, confocal microscopy, Raman spectroscopy and mass spectrometry. For infrared spectroscopy, a sample is illuminated with infrared light and the resulting sample distortion is read out with either a focused UV/visible light beam and/or AFM tip. Using the AFM tip or the UV/visible light beam it is possible to measure the IR absorption characteristics of a sample with spatial resolution ranging from around 1 μm or less to the nanometer scale. The combination of both techniques provides a rapid and large area survey scan with the UV/visible light and a high resolution measurement with the AFM tip. The methods and apparatus also include the ability to analyze light reflected/scattered from the sample via a Raman spectrometer for complementary analysis by Raman spectroscopy. Using a UV/vis source or IR source at higher intensity it is possible to thermally desorb material from a sample for analysis by mass spectrometry. The AFM tip can also be heated to desorb material for mass spec analysis at even higher spatial resolution.
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公开(公告)号：US20190120753A1
公开(公告)日：2019-04-25
申请号：US16155089
申请日：2018-10-09
发明人： Craig Prater , Kevin Kjoller , Roshan Shetty
IPC分类号： G01N21/35 , G01N21/65 , G01N21/59 , G01N21/552 , G01N23/20091 , G01N23/207 , H01J49/26 , H01J37/26
摘要： System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US11680892B2
公开(公告)日：2023-06-20
申请号：US17316453
申请日：2021-05-10
发明人： Craig Prater , Kevin Kjoller , Roshan Shetty
CPC分类号： G01N21/171 , G01J3/2823 , G01J3/427 , G01J3/4406 , G01J3/4412 , G01N21/6458 , G01N21/65 , G01N2021/1714
摘要： System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US11486761B2
公开(公告)日：2022-11-01
申请号：US16427866
申请日：2019-05-31
发明人： Derek Decker , Craig Prater
摘要： Apparatuses and methods for microscopic analysis of a sample using spatial light manipulation to increase signal to noise ratio are described herein.
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公开(公告)号：US11480518B2
公开(公告)日：2022-10-25
申请号：US16702094
申请日：2019-12-03
发明人： Craig Prater , David Grigg , Derek Decker
摘要： Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
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公开(公告)号：US20210164894A1
公开(公告)日：2021-06-03
申请号：US16702094
申请日：2019-12-03
发明人： Craig Prater , David Grigg , Derek Decker
摘要： Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to enhance the signal strength indicating the photothermal effect on a sample.
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公开(公告)号：US11002665B2
公开(公告)日：2021-05-11
申请号：US16465824
申请日：2017-11-29
发明人： Craig Prater , Kevin Kjoller , Roshan Shetty
摘要： System for performing chemical spectroscopy on samples from the scale of nanometers to millimeters or more with a multifunctional platform combining analytical and imaging techniques including dual beam photo-thermal spectroscopy with confocal microscopy, Raman spectroscopy, fluorescence detection, various vacuum analytical techniques and/or mass spectrometry. In embodiments described herein, the light beams of a dual-beam system are used for heating and sensing.
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公开(公告)号：US10809184B1
公开(公告)日：2020-10-20
申请号：US16366982
申请日：2019-03-27
发明人： Craig Prater , Mustafa Kansiz
摘要： Properties of a sample that are dependent upon wavelength, such as IR absorption, can be detected and deconstructed into wavelets or other basis functions. These basis functions can be compared to determine which have a relatively high likelihood of being noise or signal, and an attenuation factor can be applied to each wavelet. A spectrum can be reconstructed from these wavelets that exhibits a significantly higher signal-to-noise ratio than raw data co-adding would produce in significantly less measurement time.
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