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公开(公告)号:US20240171834A1
公开(公告)日:2024-05-23
申请号:US18425939
申请日:2024-01-29
Inventor: Yoshiki USUI , Takeshi HARADA , Masayuki YOSHIE , Kouichi KAWAMOTO , Ken NAKAMURA , Tadafumi KUROGI , Kazufumi TAKESHITA , Kenichi KUWAYAMA
Abstract: A vehicular camera includes a first shield made of metal and disposed to surround a circuit board. The first shield includes a first bottom surface portion, a second bottom surface portion disposed to be separated from the first bottom surface portion, and a connection portion connecting an entire periphery of the first bottom surface portion and an entire periphery of the second bottom surface portion. At least a first side surface portion, a second side surface portion, a third side surface portion, and a fourth side surface portion of the first shield are formed by a contiguously curved surface, and at least the first side surface portion, the second side surface portion, the third side surface portion, the fourth side surface portion, the first bottom surface portion, the connection portion, and the second bottom surface portion are formed by a contiguously curved surface.
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公开(公告)号:US20170133500A1
公开(公告)日:2017-05-11
申请号:US15415663
申请日:2017-01-25
Inventor: Ryuuji ETOU , Takeshi HARADA , Masakazu HAMADA , Tamotsu SHIBATA
IPC: H01L29/778 , H01L29/808 , H01L29/20 , H01L29/04 , H01L21/283 , H01L29/66 , H01L27/098 , H01L29/812
CPC classification number: H01L29/7787 , H01L21/28 , H01L21/283 , H01L27/098 , H01L29/045 , H01L29/1066 , H01L29/2003 , H01L29/452 , H01L29/66462 , H01L29/7786 , H01L29/808 , H01L29/812
Abstract: A nitride semiconductor device according to the present disclosure includes a substrate, a p-type GaN layer formed on a main surface of the substrate and made of AlxInyGa1-x-yN containing p-type impurities, where 0≦X
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公开(公告)号:US20180218910A1
公开(公告)日:2018-08-02
申请号:US15926636
申请日:2018-03-20
Inventor: Takeshi HARADA , Koji UTAKA
IPC: H01L21/28 , H01L27/098 , H01L29/417 , H01L29/423 , H01L29/49 , H01L29/778 , H01L29/808 , H01L29/812
CPC classification number: H01L21/28 , H01L21/28575 , H01L27/098 , H01L29/0684 , H01L29/1066 , H01L29/2003 , H01L29/32 , H01L29/417 , H01L29/423 , H01L29/452 , H01L29/49 , H01L29/66462 , H01L29/778 , H01L29/7786 , H01L29/808 , H01L29/812
Abstract: A semiconductor device includes: a substrate; a p-type GaN layer that is formed above the substrate, and includes GaN containing p-type impurities; and a Ti film formed on a surface of the p-type GaN layer. The Ti film includes a Ti film containing no nitrogen and a nitrogen-containing Ti film that is less chemically active than such Ti film. The nitrogen-containing Ti film continuously surrounds an outer periphery of the Ti film containing no nitrogen in a planar view.
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