SENSOR CHIP, DETECTION METHOD, AND DETECTION APPARATUS
    2.
    发明申请
    SENSOR CHIP, DETECTION METHOD, AND DETECTION APPARATUS 有权
    传感器芯片,检测方法和检测装置

    公开(公告)号:US20160073938A1

    公开(公告)日:2016-03-17

    申请号:US14951301

    申请日:2015-11-24

    IPC分类号: A61B5/1459 G01N21/65

    摘要: An exemplary sensor chip includes a substrate, a metal pattern, a proximate substance, and a light shielding layer. The metal pattern is on the substrate. The proximate substance is on or near the metal pattern. The light shielding layer is provided on the substrate so as to cover the metal pattern and the proximate substance. The light shielding layer is a layer that blocks the excitation light from going into the proximate substance, and is made of a substance which becomes degraded inside a subject.

    摘要翻译: 示例性传感器芯片包括基板,金属图案,近似物质和遮光层。 金属图案在基板上。 邻近物质在金属图案上或附近。 遮光层设置在基板上以覆盖金属图案和近似物质。 遮光层是阻止激发光进入邻近物质的层,并且由在被检体内变质的物质构成。

    METHOD AND DETECTION SYSTEM FOR DETECTING AN ANALYTE
    3.
    发明申请
    METHOD AND DETECTION SYSTEM FOR DETECTING AN ANALYTE 有权
    用于检测分析仪的方法和检测系统

    公开(公告)号:US20150233836A1

    公开(公告)日:2015-08-20

    申请号:US14705343

    申请日:2015-05-06

    IPC分类号: G01N21/65

    摘要: An exemplary sensor chip includes a substrate, a metal pattern formed on a side of the substrate that is irradiated with excitation light, and a first substance and a second substance provided near the metal pattern. A first intensity Xa of the first surface-enhanced Raman-scattered light from the first substance and a second intensity Xb of the second surface-enhanced Raman-scattered light from the second substance are detected. An intensity ratio Xc, as obtained by dividing the second intensity Xb with the first intensity Xa, is calculated.

    摘要翻译: 示例性传感器芯片包括基板,形成在基板上被激发光照射的金属图案,以及设置在金属图案附近的第一物质和第二物质。 检测来自第一物质的第一表面增强拉曼散射光的第一强度Xa和来自第二物质的第二表面增强拉曼散射光的第二强度Xb。 计算通过将第二强度Xb除以第一强度Xa而得到的强度比Xc。