GAS ANALYSIS DEVICE AND METHOD FOR DETECTING SAMPLE GAS

    公开(公告)号:US20220404312A1

    公开(公告)日:2022-12-22

    申请号:US17806805

    申请日:2022-06-14

    Abstract: The present disclosure provides a gas analysis device and a method for detecting sample gas. The gas analysis device includes: an ion mobility spectrometer including an ion mobility tube, an ion gate, a plurality of electrodes, a suppression grid, and a Faraday plate sequentially disposed in the ion mobility tube, wherein the Faraday plate is configured to receive sample ions discharged from the suppression grid, and the Faraday plate is provided with a through hole; a mass spectrometer; a gate valve disposed between the Faraday plate and an ion inlet of the mass spectrometer; and a controller configured to control an opening or closing of the gate valve to allow the sample ions discharged from the suppression grid to flow into the mass spectrometer through the through hole of the Faraday plate when the gate valve is opened.

    Drawer-type carrying device for accelerator and cabin structure for accelerator

    公开(公告)号:US11183354B2

    公开(公告)日:2021-11-23

    申请号:US16231667

    申请日:2018-12-24

    Abstract: The present disclosure provides a drawer-type carrying device for an accelerator and an cabin structure for the accelerator, the drawer-type carrying device for the accelerator includes a frame mechanism and a drawing mechanism. The frame mechanism is used for installing the accelerator; the drawing mechanism is connected with the frame mechanism and the frame mechanism is movable relative to the drawing mechanism. The cabin structure for the accelerator includes a cabin, a shielding mechanism and a drawer-type carrying device for the accelerator. The cabin has a working area and a maintenance area. The shielding mechanism is disposed in the working area and has a side opening door facing towards the maintenance area. The frame mechanism is capable of drawn from the shielding mechanism into the maintenance area when the side opening door is opened.

    Multi-ray-source accelerator and inspection method

    公开(公告)号:US11054542B2

    公开(公告)日:2021-07-06

    申请号:US16946953

    申请日:2020-07-13

    Abstract: Embodiments of the disclosure provide a multi-ray-source accelerator and an inspection method. The multi-ray-source accelerator includes: a plurality of acceleration tubes, each acceleration tube of the plurality of acceleration tubes including an acceleration tube body that defines at least one cavity, the plurality of acceleration tubes being arranged in at least one row along a straight line or an arc and connected in series with each other; and a microwave unit configured to provide a microwave field to the plurality of acceleration tubes. The plurality of acceleration tubes are arranged to allow the microwave unit to provide the microwave field from an acceleration tube at one end of the plurality of acceleration tubes so as to accelerate electron beams in cavities of all the acceleration tubes.

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