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公开(公告)号:US09171773B2
公开(公告)日:2015-10-27
申请号:US14245261
申请日:2014-04-04
发明人: Kiyoshi Arai , Osamu Usui
IPC分类号: H01L23/02 , H01L23/367 , H01L23/42 , H01L23/492 , H01L23/373 , H01L23/433 , H01L23/498 , H01L23/24 , H01L23/053
CPC分类号: H01L23/3675 , H01L23/053 , H01L23/24 , H01L23/3735 , H01L23/42 , H01L23/4334 , H01L23/492 , H01L23/49811 , H01L2224/48091 , H01L2224/73265 , H01L2924/12032 , H01L2924/1305 , H01L2924/13055 , H01L2924/13091 , H01L2924/00014 , H01L2924/00
摘要: A semiconductor device according to the present invention includes a base plate, an insulating layer provided on an upper surface of the base plate, a metal pattern provided on an upper surface of the insulating layer, a semiconductor element bonded to the metal pattern, and an insulating substrate disposed to be in contact with an upper surface of the semiconductor element. An end of the insulating substrate is located outside the semiconductor element in plan view. The end of the insulating substrate and the metal pattern are directly or indirectly bonded. The semiconductor element includes an electrode on the upper surface. A portion of the insulating substrate, in which the electrode on the upper surface of the semiconductor element overlaps in plan view, is provided with a through-hole.
摘要翻译: 根据本发明的半导体器件包括基板,设置在基板的上表面上的绝缘层,设置在绝缘层的上表面上的金属图案,接合到金属图案的半导体元件,以及 绝缘基板,设置成与半导体元件的上表面接触。 在平面图中,绝缘基板的一端位于半导体元件的外侧。 绝缘基板的端部和金属图案直接或间接地结合。 半导体元件包括在上表面上的电极。 在半导体元件的上表面上的电极在平面图中重叠的绝缘基板的一部分设置有通孔。
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公开(公告)号:US10283430B2
公开(公告)日:2019-05-07
申请号:US15234524
申请日:2016-08-11
发明人: Yasunari Hino , Kiyoshi Arai
IPC分类号: H01L23/34 , H01L23/488 , H01L23/367 , H01L23/00 , H01L21/48 , H01L23/528 , H01L23/532 , H01L25/11 , H01L25/00 , H01L23/373 , H01L23/433 , H01L23/495 , H01L23/31 , H01L21/56
摘要: In a power semiconductor device, an IGBT has a collector electrode bonded to a metal plate by a bonding material. A diode has a cathode electrode bonded to the metal plate by the bonding material. An interconnection member is bonded to an emitter electrode of the IGBT by a bonding material. The bonding material includes a bonding material and a bonding material. The bonding material is interposed between the IGBT and the interconnection member. The bonding material fills a through hole formed in the interconnection member. The bonding material reaches the bonding material and is therefore connected to the bonding material.
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3.
公开(公告)号:US11901326B2
公开(公告)日:2024-02-13
申请号:US17546695
申请日:2021-12-09
发明人: Shinsuke Asada , Satoru Ishikawa , Yuki Yano , Shohei Ogawa , Kiyoshi Arai
IPC分类号: H01L23/00
CPC分类号: H01L24/37 , H01L24/35 , H01L24/48 , H01L2224/35125 , H01L2224/3701 , H01L2224/48153
摘要: An object is to provide a semiconductor device which suppresses poor bonding between a metal pattern and an electrode terminal due to insufficient temperature rise at the time of bonding the metal pattern and the electrode terminal. The electrode terminal is branched into a plurality of branch portions in a width direction on one end side of an extending direction thereof, of the plurality of branch portions, a first branch portion and a second branch portion are bonded on the metal pattern via a bonding material, respectively, the first branch portion has a wider width than that of the second branch portion, and the bonding material between the second branch portion and the metal pattern is thinner than the bonding material between the first branch portion and the metal pattern.
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公开(公告)号:US10522482B2
公开(公告)日:2019-12-31
申请号:US16237311
申请日:2018-12-31
IPC分类号: H01L21/48 , H01L23/495 , H01L23/00 , H01L23/498 , H01L25/07 , H01L25/18 , H01L23/24 , H01L23/373
摘要: An object of the present invention is to obtain a semiconductor device having highly reliable bonding portions. The semiconductor device according to the present invention includes an insulating substrate on which a conductive pattern is formed, and an electrode terminal and a semiconductor element which are bonded to the conductive pattern, the electrode terminal and the conductive pattern are bonded by ultrasonic bonding on a bonding face, and the ultrasonic bonding is performed at a plurality of positions.
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公开(公告)号:US10475721B2
公开(公告)日:2019-11-12
申请号:US16299315
申请日:2019-03-12
发明人: Yasunari Hino , Kiyoshi Arai
IPC分类号: H01L23/00 , H01L23/367 , H01L21/48 , H01L23/532 , H01L23/528 , H01L25/00 , H01L25/11 , H01L23/373 , H01L23/433 , H01L23/495 , H01L21/56 , H01L23/31
摘要: In a power semiconductor device, an IGBT has a collector electrode bonded to a metal plate by a bonding material. A diode has a cathode electrode bonded to the metal plate by the bonding material. An interconnection member is bonded to an emitter electrode of the IGBT by a bonding material. The bonding material includes a bonding material and a bonding material. The bonding material is interposed between the IGBT and the interconnection member. The bonding material fills a through hole formed in the interconnection member. The bonding material reaches the bonding material and is therefore connected to the bonding material.
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