Abstract:
A scanning beam assembly includes a beam generator to generate a beam of radiation; at least one reflector configured to deflect the beam across a field of view; and a plurality of multi-mode optical fibers for receiving radiation reflected from the field of view, wherein the optical fibers have end surfaces that face in at least two different directions, or wherein the optical fibers are configured to receive scattered radiation from an angular field of view larger than that determined by their individual numerical apertures.
Abstract:
A scanned light display system includes a light emitter array having a plurality of light sources operable to emit diverging light and an array of collimating elements positioned so that each of the collimating elements receive at least a portion of the light emitted from a corresponding one of the light sources. Each of collimating elements is configured to substantially collimate the received light from at least one corresponding light source into respective beams. The scanned beam display is operable to scan the respective beams to provide an image to a viewer. The displayed image appears substantially fixed to a viewer as the viewer's eye moves relative to the array of collimating elements. In one embodiment, each of the collimating elements is a curved mirror. In other embodiments, each of the collimating elements includes at least one lens or a curved mirror/lens pair.
Abstract:
A scanning beam assembly includes a beam generator to generate a beam of radiation; at least one reflector configured to deflect the beam across a field of view; and a plurality of multi-mode optical fibers for receiving radiation reflected from the field of view, wherein the optical fibers have end surfaces that face in at least two different directions, or wherein the optical fibers are configured to receive scattered radiation from an angular field of view larger than that determined by their individual numerical apertures.
Abstract:
An aperture plate includes an opening and a surface adjacent to the opening. The opening passes electromagnetic energy such as light to a reflector that is aligned with the opening and that directs the electromagnetic energy to a location. The surface reflects incident electromagnetic energy away from the location in a direction that is outside of the range of directions. Such an aperture plate insures that electromagnetic energy, e.g., light, strikes only the desired portions of the reflector, and that peripheral light that is outside of the aperture opening is reflected away from the location, e.g., display screen, toward which the reflector directs the electromagnetic energy. Furthermore, because such an aperture plate is mounted near the reflector, the alignment tolerances are typically less stringent than for an aperture plate mounted near the energy source.
Abstract:
An object of interest is illuminated within the field of view of a microscope objective lens located to receive light passing through the object of interest. Light transmitted through the microscope objective lens impinges upon a variable power element. The variable power element is driven with respect to the microscope objective lens to scan through multiple focal planes in the object of interest. Light transmitted from the variable power element is sensed by a sensing element or array.
Abstract:
An optical tomography system includes a light field microscope including an objective lens, a computer-controlled light source, a condenser lens assembly and a microlens array aligned along an optical axis. A carrier containing a specimen is coupled to a rotational driver for presenting varying angles of view of the specimen. A photosensor array disposed to receive photons from the objective lens. A computer is linked to control the computer-controlled light source and condenser lens assembly and the rotational driver, and coupled to receive images from the photosensor array where the light field microscope simultaneously captures a continuum of focal planes in the specimen for each of a set of the varying angles of view of the specimen.
Abstract:
The turn-on delay of a gas laser is significantly reduced by inducing a transient electric field of sufficient intensity to induce ionization in a localized region of the laser adjacent to the anode. This is accomplished by means of a coupler which couples the voltage applied to the cathode to a region of the laser immediately adjacent to the anode electrode.
Abstract:
A beam combiner includes a first beam-input face, a beam-output face, and first and second reflectors. The first beam-input face receives first and second beams of electromagnetic energy respectively having a first and second wavelengths. The first reflector reflects the first received beam toward the beam-output face, and the second reflector passes the first beam from the first reflector and reflects the received second beam toward the beam-output face. In one alternative, the first beam-input face also receives a third beam of electromagnetic energy having a third wavelength, the beam combiner includes a third reflector that reflects the received third beam toward the beam-output face, and the first and second reflectors pass the third beam from the third reflector. In another alternative, the beam combiner includes a second beam-input face that receives a third beam directed toward the beam-output face, and the first and second reflectors pass the third beam.
Abstract:
An optical probe for measuring the intensity and/or intensity distribution in a light beam is provided. The optical probe (10) includes a substrate formed of nonlight-absorbing material and a light-scattering element (12) included in the substrate. The light-scattering element has an index of refraction different from that of the substrate. The optical probe further includes an aperture stop (14) for receiving the light (16′) scattered by, refracted by, and/or reflected from the light-scattering element. The optical probe still further includes a light-measuring device (15) for measuring the intensity of the light received by the aperture stop. The light-scattering element and the aperture stop are arranged in fixed relationship with respect to each other. In operation, as an incident light beam (16) enters the substrate, some of the light strikes and is scattered by, refracted by, and/or reflected from the light-scattering element. Some of such light is then received by the aperture stop and the light-measuring device. Because the intensity of the incident light beam is proportional to the power of the light limited by the aperture stop and detected by the light-measuring device, the probe determines the intensity of the incident light. Further, moving the probe with respect to the incident light allows the probe to be used to measure the intensity distribution within the incident light at various locations.
Abstract:
A scanned light display system includes a light source operable to emit light and a curved mirror positioned to receive at least a portion of the light. The curved mirror is configured to substantially collimate the received light. The substantially collimated light is scanned to form an image by moving at least one of the light source and the curved mirror relative to each other. Alternatively, the scanned light display system includes a light source operable to emit light, a curved mirror positioned to receive some of the light, and an optical element positioned to receive light reflected from the curved mirror. The optical element is configured to substantially collimate the reflected light. The substantially collimated light is scanned to form an image by moving at least one of the light source, the curved mirror, and the optical element. Scanning mirror assemblies and methods of making are also disclosed.