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公开(公告)号：US10746761B2
公开(公告)日：2020-08-18
申请号：US15015893
申请日：2016-02-04
Applicant: Keithley Instruments, Inc.
Inventor： Michael D. Rayman , Gregory Sobolewski
Abstract: A connection interface for connecting one or more devices under test (DUTs) to one or more remote test and measurement instruments includes a device-under-test connector for connecting a DUT to the interface, a host-instrument connector for connecting the interface to a host test and measurement instrument, and an electrical path between the device-under-test connector and the host-instrument connector. The connection interface also includes a display that has a first portion visually associated with the device-under-test connector and configured to display an identifier for a particular connection point on the DUT. In some embodiments, the first portion of the display is configured to display measurement data from the particular connection point on the DUT. In some embodiments, the display has a second portion that is configured to display information related to the host test and measurement instrument, or to display a name for a particular measurement of the DUT.
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公开(公告)号：US10802520B2
公开(公告)日：2020-10-13
申请号：US13862135
申请日：2013-04-12
Applicant: Keithley Instruments, Inc.
Inventor： Kevin Cawley , Wayne Goeke , Gregory Sobolewski
IPC: G05F1/575 , G01R31/317 , H04M1/24
Abstract: A system can include a device under test (DUT) having a DUT voltage, a cable connected to the DUT, the cable having a cable inductance, and a power supply configured as a current source to provide a wide bandwidth voltage source to the DUT, wherein the DUT voltage is independent of the cable inductance.
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公开(公告)号：US20160231354A1
公开(公告)日：2016-08-11
申请号：US15015893
申请日：2016-02-04
Applicant: Keithley Instruments, Inc.
Inventor： Michael D. Rayman , Gregory Sobolewski
Abstract: A connection interface for connecting one or more devices under test (DUTs) to one or more remote test and measurement instruments includes a device-under-test connector for connecting a DUT to the interface, a host-instrument connector for connecting the interface to a host test and measurement instrument, and an electrical path between the device-under-test connector and the host-instrument connector. The connection interface also includes a display that has a first portion visually associated with the device-under-test connector and configured to display an identifier for a particular connection point on the DUT. In some embodiments, the first portion of the display is configured to display measurement data from the particular connection point on the DUT. In some embodiments, the display has a second portion that is configured to display information related to the host test and measurement instrument, or to display a name for a particular measurement of the DUT.
Abstract translation: 用于将一个或多个待测器件（DUT）连接到一个或多个远程测试和测量仪器的连接接口包括用于将DUT连接到接口的测试用连接器，用于将接口连接到接口的主机 - 仪器连接器 主机测试和测量仪器，以及被测设备连接器和主机仪器连接器之间的电气路径。 连接接口还包括显示器，其具有与被测设备连接器可视地相关联的第一部分，并且被配置为在DUT上显示特定连接点的标识符。 在一些实施例中，显示器的第一部分被配置为从DUT上的特定连接点显示测量数据。 在一些实施例中，显示器具有被配置为显示与主机测试和测量仪器相关的信息的第二部分，或者显示DUT的特定测量的名称。
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公开(公告)号：US20140376201A1
公开(公告)日：2014-12-25
申请号：US13921550
申请日：2013-06-19
Applicant: Keithley Instruments, Inc.
Inventor： James A. Niemann , Gregory Sobolewski , Martin J. Rice , Wayne Goeke
CPC classification number: H05K1/0213 , H05K1/0225 , H05K1/0256 , H05K1/142 , H05K1/145 , H05K3/306 , H05K3/4038 , H05K3/4697 , H05K2201/0792 , H05K2201/09063 , H05K2201/093 , H05K2201/09618 , H05K2201/0969 , H05K2201/09981 , Y10T29/49139
Abstract: A device with low dielectric absorption includes a printed circuit board (PCB), a component connection area including a first conductor layered on a top surface of the component connection area and a second conductor layered on a bottom surface of the component connection area, an aperture surrounding the component connection area, a low-leakage component connecting the component connection area to the PCB across the aperture, and a guard composed of a third conductor at least substantially surrounding the aperture on a top surface of the PCB and a fourth conductor at least substantially surrounding the aperture on a bottom surface of the PCB.
Abstract translation: 具有低介电吸收率的器件包括印刷电路板（PCB），包括层叠在部件连接区域的顶表面上的第一导体的部件连接区域和层叠在部件连接区域的底表面上的第二导体， 围绕部件连接区域，将部件连接区域连接到穿过孔的PCB的低泄漏部件以及由至少基本上围绕PCB顶表面上的孔的第三导体组成的防护件和至少 基本上围绕PCB的底表面上的孔。
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公开(公告)号：US09326369B2
公开(公告)日：2016-04-26
申请号：US13921550
申请日：2013-06-19
Applicant: Keithley Instruments, Inc.
Inventor： James A. Niemann , Gregory Sobolewski , Martin J. Rice , Wayne Goeke
CPC classification number: H05K1/0213 , H05K1/0225 , H05K1/0256 , H05K1/142 , H05K1/145 , H05K3/306 , H05K3/4038 , H05K3/4697 , H05K2201/0792 , H05K2201/09063 , H05K2201/093 , H05K2201/09618 , H05K2201/0969 , H05K2201/09981 , Y10T29/49139
Abstract: A device with low dielectric absorption includes a printed circuit board (PCB), a component connection area including a first conductor layered on a top surface of the component connection area and a second conductor layered on a bottom surface of the component connection area, an aperture surrounding the component connection area, a low-leakage component connecting the component connection area to the PCB across the aperture, and a guard composed of a third conductor at least substantially surrounding the aperture on a top surface of the PCB and a fourth conductor at least substantially surrounding the aperture on a bottom surface of the PCB.
Abstract translation: 具有低介电吸收率的器件包括印刷电路板（PCB），包括层叠在部件连接区域的顶表面上的第一导体的部件连接区域和层叠在部件连接区域的底表面上的第二导体， 围绕部件连接区域，将部件连接区域连接到穿过孔的PCB的低泄漏部件以及由至少基本上围绕PCB顶表面上的孔的第三导体组成的防护件和至少 基本上围绕PCB的底表面上的孔。
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Patent Agency Ranking
公开(公告)号：US20150171627A1
公开(公告)日：2015-06-18
申请号：US14258916
申请日：2014-04-22
Applicant: Keithley Instruments, Inc.
Inventor： Matthew A. Holtz , Gregory Sobolewski , Jerold A. Williamson
IPC: H02H9/04
Abstract: A switch protection circuit includes a discharging circuit and, optionally, a clamping circuit. The discharge circuit operates prior to the switch completing the switching action to discharge capacitance from a signal line of a cable connected to a device under test to a ground voltage. When not discharging, the discharge circuit presents low leakage to a measurement circuit so as not to interfere with such measurement. If present, the clamping circuit clamps a signal line of the cable to a guard structure of the cable so that the discharge circuit can couple both the signal line and the guard structure to ground. The protection circuit operates without significantly worsening low current performance of the measurement instrument.
Abstract translation: 开关保护电路包括放电电路和可选的钳位电路。 放电电路在开关完成切换动作之前操作，以将电容从连接到被测器件的电缆的信号线放电至接地电压。 放电电路不放电时，对测量电路的泄漏量低，不会影响测量。 如果存在，钳位电路将电缆的信号线夹紧到电缆的保护结构，使得放电电路可以将信号线和保护结构耦合到地。 保护电路在测量仪器的低电流性能没有显着恶化的情况下运行。
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公开(公告)号：US09680300B2
公开(公告)日：2017-06-13
申请号：US14258916
申请日：2014-04-22
Applicant: Keithley Instruments, Inc.
Inventor： Matthew A. Holtz , Gregory Sobolewski , Jerold A. Williamson
Abstract: A switch protection circuit includes a discharging circuit and, optionally, a clamping circuit. The discharge circuit operates prior to the switch completing the switching action to discharge capacitance from a signal line of a cable connected to a device under test to a ground voltage. When not discharging, the discharge circuit presents low leakage to a measurement circuit so as not to interfere with such measurement. If present, the clamping circuit clamps a signal line of the cable to a guard structure of the cable so that the discharge circuit can couple both the signal line and the guard structure to ground. The protection circuit operates without significantly worsening low current performance of the measurement instrument.
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公开(公告)号：US09553559B2
公开(公告)日：2017-01-24
申请号：US14521969
申请日：2014-10-23
Applicant: Keithley Instruments, Inc.
Inventor： Gregory Sobolewski
CPC classification number: H03H7/465 , G01R19/00 , G01R19/0015 , G01R27/025 , G01R31/2822 , G01R31/2889 , H01P1/2007 , H01P5/00 , H03H7/0123 , H03H7/46
Abstract: Bias tees, according to certain embodiments of the present invention, include switches in the AC signal path, the DC signal path, or both, to improve the capability of the bias tees to be used for high impedance AC measurement, low current DC measurement, or both. Optical control of the switches, as well as control of the switches using a DC bias present within the AC signal input to the bias tee, is described. Including a set of diodes into the DC signal path, rather than a switch, provides enhanced capability of the bias tee to be used for high impedance AC measurements.
Abstract translation: 根据本发明的某些实施例的偏置三通包括交流信号路径，直流信号路径或两者中的开关，以提高偏置三通的能力用于高阻抗AC测量，低电流DC测量， 或两者。 描述了开关的光学控制，以及使用存在于输入到偏置三通的AC信号内的DC偏压来控制开关。 将一组二极管包括在DC信号路径中，而不是开关，提供了用于高阻抗AC测量的偏置三通的增强功能。
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公开(公告)号：US20160084878A1
公开(公告)日：2016-03-24
申请号：US14846121
申请日：2015-09-04
Applicant: Keithley Instruments, Inc.
Inventor： Wayne C. Goeke , Gregory Sobolewski
CPC classification number: G01R1/0416 , G01R27/28 , G01R31/06 , G01R31/18 , G01R31/24 , G01R31/2607 , G01R31/2822 , G01R31/2889
Abstract: Embodiments of the present invention provide an improved two-cable connection system for connecting electrical test instrumentation to a device under test (DUT). In one embodiment, a single pair of equal-length triaxial cables each has a desired characteristic impedance. Each cable has a center connecter, intermediate conductor, and outer conductor. The proximal end of each cable is connected to the test instrumentation, and the distal ends are located at the DUT. At the distal end, the center conductors are connected to the DUT, the intermediate conductors are allowed to float, and the outer conductors are connected to each other. The proximal end of each cable is connected to the device using an appropriate connection for the test that will be performed. This allows the test instrumentation to perform different types of tests without changing connections to the DUT.
Abstract translation: 本发明的实施例提供了一种用于将电测试仪器连接到被测器件（DUT）的改进的双电缆连接系统。 在一个实施例中，单对等长三轴电缆各具有期望的特性阻抗。 每个电缆都有一个中心连接器，中间导体和外部导体。 每个电缆的近端连接到测试仪器，并且远端位于DUT。 在远端，中心导体连接到DUT，允许中间导体浮动，外导体彼此连接。 每个电缆的近端使用适当的连接连接到设备，用于要执行的测试。 这允许测试仪器执行不同类型的测试，而不改变与DUT的连接。
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公开(公告)号：US20150270823A1
公开(公告)日：2015-09-24
申请号：US14521969
申请日：2014-10-23
Applicant: Keithley Instruments, Inc.
Inventor： Gregory Sobolewski
CPC classification number: H03H7/465 , G01R19/00 , G01R19/0015 , G01R27/025 , G01R31/2822 , G01R31/2889 , H01P1/2007 , H01P5/00 , H03H7/0123 , H03H7/46
Abstract: Bias tees, according to certain embodiments of the present invention, include switches in the AC signal path, the DC signal path, or both, to improve the capability of the bias tees to be used for high impedance AC measurement, low current DC measurement, or both. Optical control of the switches, as well as control of the switches using a DC bias present within the AC signal input to the bias tee, is described. Including a set of diodes into the DC signal path, rather than a switch, provides enhanced capability of the bias tee to be used for high impedance AC measurements.
Abstract translation: 根据本发明的某些实施例的偏置三通包括交流信号路径，直流信号路径或两者中的开关，以提高偏置三通的能力用于高阻抗AC测量，低电流DC测量， 或两者。 描述了开关的光学控制，以及使用存在于输入到偏置三通的AC信号内的DC偏压来控制开关。 将一组二极管包括在DC信号路径中，而不是开关，提供了用于高阻抗AC测量的偏置三通的增强功能。
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