Method for producing boehmite particles and method for producing alumina particles
    1.
    发明授权
    Method for producing boehmite particles and method for producing alumina particles 有权
    勃姆石颗粒的制造方法和氧化铝粒子的制造方法

    公开(公告)号:US08226924B2

    公开(公告)日:2012-07-24

    申请号:US12542852

    申请日:2009-08-18

    IPC分类号: C01F7/02

    摘要: A method for producing boehmite particles includes subjecting powder of aluminum hydroxide to hydrothermal reaction together with a nucleation agent, thereby obtaining boehmite particles having an average primary particle size of 0.6 μm or less and including primary particles each having a hexahedral shape. A method for producing alumina particles includes: drying the boehmite particles produced by the above described method; calcining the boehmite particles, which have been dried, to obtain alumina particles; and disintegrating the obtained alumina particles.

    摘要翻译: 勃姆石粒子的制造方法包括将氢氧化铝粉末与成核剂一起进行水热反应,得到平均一次粒径为0.6μm以下的勃姆石粒子,并且包含各自具有六面体形状的一次粒子。 一种生产氧化铝颗粒的方法包括:干燥由上述方法生产的勃姆石颗粒; 煅烧已经干燥的勃姆石颗粒,得到氧化铝颗粒; 并使得到的氧化铝颗粒分解。

    Polishing composition
    2.
    发明授权
    Polishing composition 有权
    抛光组成

    公开(公告)号:US09157011B2

    公开(公告)日:2015-10-13

    申请号:US13818554

    申请日:2011-08-25

    摘要: A polishing composition contains colloidal silica. The colloidal silica satisfies the expression A×D×E×F≧350,000 where “A” denotes the average aspect ratio (dimensionless) of the colloidal silica, “D” denotes the average particle diameter (units: nm) of the colloidal silica, “E” denotes the standard deviation of the particle size (units: nm) of the colloidal silica, and “F” denotes the volume fraction (units: %) of particles having a diameter of 1 to 300 nm in the colloidal silica. The volume fraction of particles having a diameter of 1 to 300 nm in the colloidal silica is 90% or greater.

    摘要翻译: 抛光组合物含有胶体二氧化硅。 胶体二氧化硅满足A×D×E×F≥350,000的表达式,其中“A”表示胶体二氧化硅的平均纵横比(无量纲),“D”表示胶体二氧化硅的平均粒径(单位:nm) “E”表示胶体二氧化硅的粒径(单位:nm)的标准偏差,“F”表示胶体二氧化硅中直径为1〜300nm的粒子的体积分数(单位:%)。 胶体二氧化硅中直径为1〜300nm的粒子的体积分率为90%以上。

    POLISHING COMPOSITION
    3.
    发明申请
    POLISHING COMPOSITION 有权
    抛光组合物

    公开(公告)号:US20130205682A1

    公开(公告)日:2013-08-15

    申请号:US13818554

    申请日:2011-08-25

    IPC分类号: C09G1/02

    摘要: A polishing composition contains colloidal silica. The colloidal silica satisfies the expression A×D×E×F≧350,000 where “A” denotes the average aspect ratio (dimensionless) of the colloidal silica, “D” denotes the average particle diameter (units: nm) of the colloidal silica, “E” denotes the standard deviation of the particle size (units: nm) of the colloidal silica, and “F” denotes the volume fraction (units: %) of particles having a diameter of 1 to 300 nm in the colloidal silica. The volume fraction of particles having a diameter of 1 to 300 nm in the colloidal silica is 90% or greater.

    摘要翻译: 抛光组合物含有胶体二氧化硅。 胶体二氧化硅满足A×D×E×F> = 350,000的表达式,其中“A”表示胶态二氧化硅的平均纵横比(无量纲),“D”表示胶体二氧化硅的平均粒径(单位:nm) ,“E”表示胶体二氧化硅的粒径(单位:nm)的标准偏差,“F”表示胶体二氧化硅中直径为1〜300nm的粒子的体积分数(单位:%)。 胶体二氧化硅中直径为1〜300nm的粒子的体积分率为90%以上。

    Method for producing boehmite particles and method for producing alumina particles
    4.
    发明申请
    Method for producing boehmite particles and method for producing alumina particles 有权
    勃姆石颗粒的制造方法和氧化铝粒子的制造方法

    公开(公告)号:US20100040536A1

    公开(公告)日:2010-02-18

    申请号:US12542852

    申请日:2009-08-18

    IPC分类号: C01F7/38 C01F7/02

    摘要: A method for producing boehmite particles includes subjecting powder of aluminum hydroxide to hydrothermal reaction together with a nucleation agent, thereby obtaining boehmite particles having an average primary particle size of 0.6 μm or less and including primary particles each having a hexahedral shape. A method for producing alumina particles includes: drying the boehmite particles produced by the above described method; calcining the boehmite particles, which have been dried, to obtain alumina particles; and disintegrating the obtained alumina particles.

    摘要翻译: 勃姆石粒子的制造方法包括将氢氧化铝粉末与成核剂一起进行水热反应,得到平均一次粒径为0.6μm以下的勃姆石粒子,并且包括各自具有六面体形状的一次粒子。 一种生产氧化铝颗粒的方法包括:干燥由上述方法生产的勃姆石颗粒; 煅烧已经干燥的勃姆石颗粒,得到氧化铝颗粒; 并使得到的氧化铝颗粒分解。

    Aluminum oxide particle and polishing composition containing the same
    5.
    发明申请
    Aluminum oxide particle and polishing composition containing the same 审中-公开
    氧化铝颗粒和含有它的抛光组合物

    公开(公告)号:US20110258938A1

    公开(公告)日:2011-10-27

    申请号:US12997455

    申请日:2009-06-12

    IPC分类号: C09G1/02 C09K3/14

    摘要: Aluminum oxide particles are provided that include primary particles each having a hexahedral shape and an aspect ratio of 1 to 5. The aluminum oxide particles preferably have an average primary particle size of 0.01 to 0.6 μm. The aluminum oxide particles preferably have an alpha conversion rate of 5 to 70%. Further, the aluminum oxide particles preferably have an average secondary particle size of 0.01 to 2 μm, and the value obtained by dividing the 90% particle size of the aluminum oxide particles by the 10% particle size of the aluminum oxide particles is preferably 3 or less. The aluminum oxide particles are used, for example, as abrasive grains in the applications of polishing semiconductor device substrates, hard disk substrates, or display substrates.

    摘要翻译: 提供氧化铝颗粒,其包括各自具有六面体形状和长宽比为1至5的一次颗粒。氧化铝颗粒的平均一次粒径优选为0.01至0.6μm。 优选氧化铝粒子的α转化率为5〜70%。 此外,氧化铝粒子的平均二次粒径优选为0.01〜2μ​​m,通过将氧化铝粒子的90%粒径除以氧化铝粒子的10%粒径而得到的值优选为3或 减。 氧化铝粒子例如在研磨半导体器件基板,硬盘基板或显示基板的应用中用作磨粒。

    Polishing composition
    6.
    发明授权
    Polishing composition 有权
    抛光组成

    公开(公告)号:US09028574B2

    公开(公告)日:2015-05-12

    申请号:US13878362

    申请日:2011-10-06

    IPC分类号: C09K3/14 C09G1/02 H01L21/3105

    摘要: A polishing composition contains colloidal silica particles having protrusions on the surfaces thereof. The average of values respectively obtained by dividing the height of a protrusion on the surface of each particle belonging to the part of the colloidal silica particles that has larger particle diameters than the volume average particle diameter of the colloidal silica particles by the width of a base portion of the same protrusion is no less than 0.245. Preferably, the part of the colloidal silica particles that has larger particle diameter than the volume average particle diameter of the colloidal silica particles has an average aspect ratio of no less than 1.15. Preferably, the protrusions on the surfaces of particles belonging to the part of the colloidal silica particles that has larger particle diameters than the volume average particle diameter of the colloidal silica particles have an average height of no less than 3.5 nm.

    摘要翻译: 抛光组合物包含其表面上具有突起的胶体二氧化硅颗粒。 分别通过将属于粒径比胶体二氧化硅粒子的体积平均粒径大的胶体二氧化硅粒子的一部分的粒子的表面上的突起的高度除以碱的宽度而得到的值的平均值 相同突起的部分不小于0.245。 优选地,粒径比胶体二氧化硅粒子的体积平均粒径大的胶态二氧化硅粒子的平均长径比优选为1.15以上。 优选地,粒径比胶态二氧化硅粒子的体积平均粒径大的胶体二氧化硅粒子的粒子的表面上的突起的平均高度优选为3.5nm以上。

    POLISHING COMPOSITION
    7.
    发明申请
    POLISHING COMPOSITION 有权
    抛光组合物

    公开(公告)号:US20130199106A1

    公开(公告)日:2013-08-08

    申请号:US13878362

    申请日:2011-10-06

    IPC分类号: C09K3/14

    摘要: A polishing composition contains colloidal silica particles having protrusions on the surfaces thereof. The average of values respectively obtained by dividing the height of a protrusion on the surface of each particle belonging to the part of the colloidal silica particles that has larger particle diameters than the volume average particle diameter of the colloidal silica particles by the width of a base portion of the same protrusion is no less than 0.245. Preferably, the part of the colloidal silica particles that has larger particle diameter than the volume average particle diameter of the colloidal silica particles has an average aspect ratio of no less than 1.15. Preferably, the protrusions on the surfaces of particles belonging to the part of the colloidal silica particles that has larger particle diameters than the volume average particle diameter of the colloidal silica particles have an average height of no less than 3.5 nm.

    摘要翻译: 抛光组合物包含其表面上具有突起的胶体二氧化硅颗粒。 分别通过将属于粒径比胶体二氧化硅粒子的体积平均粒径大的胶体二氧化硅粒子的一部分的粒子的表面上的突起的高度除以碱的宽度而得到的值的平均值 相同突起的部分不小于0.245。 优选地,粒径比胶体二氧化硅粒子的体积平均粒径大的胶态二氧化硅粒子的平均长径比优选为1.15以上。 优选地,粒径比胶态二氧化硅粒子的体积平均粒径大的胶体二氧化硅粒子的粒子的表面上的突起的平均高度优选为3.5nm以上。

    FILTRATION METHOD FOR NON-DEAIRED LIQUID
    9.
    发明申请
    FILTRATION METHOD FOR NON-DEAIRED LIQUID 审中-公开
    非液体液体过滤方法

    公开(公告)号:US20130134107A1

    公开(公告)日:2013-05-30

    申请号:US13581922

    申请日:2011-02-23

    IPC分类号: B01D37/00

    摘要: Disclosed is a filtration method that extends filter life and achieves high filtration efficiency, and also abrasive slurry produced by the method. In this filtration method, deaired solvent is passed through a filter before a non-deaired liquid is filtered by the filter, after which the filter is used for filtering.

    摘要翻译: 公开了一种延长过滤器寿命并实现高过滤效率的过滤方法,以及通过该方法生产的磨料浆料。 在这种过滤方法中,在使用过滤器过滤未经过干燥的液体之前,将经过过滤的溶剂通过过滤器,然后过滤。

    SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND METHOD FOR REDUCING MICROROUGHNESS OF SEMICONDUCTOR SURFACE
    10.
    发明申请
    SEMICONDUCTOR DEVICE MANUFACTURING METHOD AND METHOD FOR REDUCING MICROROUGHNESS OF SEMICONDUCTOR SURFACE 审中-公开
    半导体器件制造方法和减少半导体表面微观的方法

    公开(公告)号:US20120329284A1

    公开(公告)日:2012-12-27

    申请号:US13601157

    申请日:2012-08-31

    IPC分类号: H01L21/306

    CPC分类号: H01L21/02052 H01L21/02074

    摘要: Surface treatment is performed with a liquid, while shielding a semiconductor surface from light. When the method is employed for surface treatment in wet processes such as cleaning, etching and development of the semiconductor surface, increase of surface microroughness can be reduced. Thus, electrical characteristics and yield of the semiconductor device are improved.

    摘要翻译: 用液体进行表面处理,同时将半导体表面从光屏蔽。 当在诸如清洁,蚀刻和半导体表面的显影的湿法中使用该方法进行表面处理时,可以降低表面微粗糙度的增加。 因此,提高了半导体器件的电特性和产量。