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公开(公告)号:US20200147751A1
公开(公告)日:2020-05-14
申请号:US16400554
申请日:2019-05-01
Applicant: KCTECH CO., LTD.
Inventor: JUN HO SON , Sung Ho SHIN
Abstract: Provided are a membrane and carrier head using the membrane for polishing apparatus. The membrane comprises a first fixing flap extending inwards from the upper part of a side portion, a second fixing flap extending upwards from the upper part of the side portion, wherein the second fixing flap has a first inclined part, a second inclined part and a third extending part of extending upwards whereby a compensation force generated by the inclined parts realize the constant pressing force to the edge of a substrate during a polishing process.
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公开(公告)号:US20220266415A1
公开(公告)日:2022-08-25
申请号:US17679110
申请日:2022-02-24
Applicant: KCTECH CO., LTD.
Inventor: Sung Ho SHIN , Geun Sik YUN , Hee Cheul JUNG , Tae Hyeon KIM , Kang Jae LEE , Jin Su BAE , Sun Su KIM
IPC: B24B37/015 , B24B57/02
Abstract: A substrate polishing apparatus according to an example embodiment may include a substrate carrier configured to grasp and move a substrate, a polishing pad configured to come into contact with a polishing target surface of the substrate and polish the polishing target surface of the substrate, and a spray unit including a spray member configured to spray a fluid toward the substrate carrier.
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公开(公告)号:US20240286243A1
公开(公告)日:2024-08-29
申请号:US18453322
申请日:2023-08-22
Applicant: KCTECH CO., LTD.
Inventor: Sung Ho SHIN , Hee Cheul JUNG , Soo Ho KIM
IPC: B24B37/015
CPC classification number: B24B37/015
Abstract: Provided is a substrate polishing apparatus. The substrate polishing apparatus includes a carrier configured to grip a substrate, a polishing pad configured to polish a surface to be polished of the substrate gripped by the carrier while rotating, and a temperature control assembly configured to control a temperature of the polishing pad, and the temperature control assembly includes Deionized water (DIW) spraying module configured to spray DIW toward the polishing pad and a guide vane configured to guide at least a portion of the DIW sprayed from the DIW spraying module to an outside of the polishing pad.
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公开(公告)号:US20220305611A1
公开(公告)日:2022-09-29
申请号:US17697891
申请日:2022-03-17
Applicant: KCTECH CO., LTD.
Inventor: Hee Cheul JUNG , Geun Sik YUN , Hyung Seob SHIM , Sung Ho SHIN
IPC: B24B37/015 , B24B37/20 , B24B57/02 , B24B55/03
Abstract: A substrate polishing method for polishing a substrate through a polishing pad according to an embodiment may comprise: a preheating step of increasing the temperature of the polishing pad by supplying heated pure water to the polishing pad before polishing the substrate; and a temperature control step of controlling the temperature of the polishing pad by adjusting the temperature of the slurry supplied to the polishing pad in a polishing process of the substrate.
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