公开(公告)号：US20230333006A1

公开(公告)日：2023-10-19

申请号：US18028962

申请日：2020-09-28

Applicant: JASCO CORPORATION

Inventor： Masaru SHIMIZU ,  Jun KOSHOBU

IPC: G01N21/19 ,  G01N21/35

CPC classification number: G01N21/19 ,  G01N21/35 ,  G01N2201/06113 ,  G01N2201/0683

Abstract: A circular dichroism measurement apparatus includes a laser light source (QCL) capable of sweeping a wavenumber of a laser light in an infrared wavenumber range containing at least one peak of the sample; a sample chamber where the sample is disposed; a photoelastic modulator that modulates a polarization state of the laser light before or after the laser light of a specific wavenumber in a wavenumber sweep transmits the sample; a detector that detects a variation in intensity of the laser light which transmitted the sample and of which its polarization state is modulated; and a signal processing device that extracts an alternating-current component (AC) that synchronize with a modulation frequency and a direct-current component (DC) from a detected signal of the detector, and calculates a value of infrared circular dichroism of the sample based on a ratio (AC/DC) of the AC and DC.

公开(公告)号：US20180307018A1

公开(公告)日：2018-10-25

申请号：US15954679

申请日：2018-04-17

Applicant: JASCO Corporation

Inventor： Kento AIZAWA ,  Hiroshi SUGIYAMA ,  Jun KOSHOBU

IPC: G02B21/00 ,  G01N21/35

CPC classification number: G02B21/0032 ,  G01N21/35 ,  G02B21/0048 ,  G02B21/006

Abstract: The problem to be solved by the present invention is to provide an infrared microscope with good measuring accuracy and less crosstalk.The infrared microscope 10 comprises a light source 12, an irradiating unit 14 for irradiating the infrared light from the light source to a sample 16, a focusing unit 18 for focusing the infrared light transmitted through or reflected by the sample 16, and a detector 20 for detecting the focused infrared light. The irradiating unit 14 comprises a first aperture 24, and the first aperture is disposed at a position where the infrared light from the light source passes therethrough. The focusing unit 18 comprises a second aperture 30, and the second aperture is disposed at an imaging position of the infrared light at the first aperture 24. The first aperture has a plurality of holes, and the holes are disposed at intervals corresponding to the arrangement of the light-receiving elements provided in the detector 20 to detect the infrared light as a detecting light. The second aperture 30 has holes that have the same size and arrangement as the first aperture 24.

公开(公告)号：US20190041268A1

公开(公告)日：2019-02-07

申请号：US16075346

申请日：2017-02-02

Applicant: JASCO CORPORATION

Inventor： Tetsuji SUNAMI ,  Takashi SHIMAMURA ,  Norio WAKIMOTO ,  Jun KOSHOBU

IPC: G01J3/45 ,  G01N21/35

Abstract: A method for measuring spectrum by Fourier-transforming an interferogram of an infrared interference wave acquired with an interferometer, including a step of over-sampling intensity signals of the interference wave at positions (D1, D2, . . . ) of a movable mirror set on the basis of a wavelength λ1 of a semi-conductor laser, and a step of interpolating intensity signals (I1′, I2′, . . . ) that would be obtained when the interference wave is sampled at positions (D1′, D2′, . . . ) of the movable mirror set on the basis of a wavelength λ0 of a He—Ne laser, by using the over-sampled intensity signals (I1, I2, . . . ), for calculating the spectrum with the interferogram based on the interpolated intensity signals (I1′, I2′, . . . ) and for an efficient use of conventional stored spectrum data which are measured based on the wavelength λ0.

公开(公告)号：US20180335382A1

公开(公告)日：2018-11-22

申请号：US15982444

申请日：2018-05-17

Applicant: JASCO Corporation

Inventor： Noriaki SOGA ,  Hiroshi SUGIYAMA ,  Jun KOSHOBU

IPC: G01N21/552 ,  G01N21/33 ,  G02B21/00

CPC classification number: G01N21/552 ,  G01N21/33 ,  G02B21/0004 ,  G02B21/04

Abstract: To provide a total reflection measurement device that can improve a light utilization rate more than a Cassegrain type objective mirror, is capable of total reflection measurement at low magnification, and can maintain compatibility with a conventional objective mirror. The device (1) includes: a pair of plane mirrors (2a, 2b) disposed on a central axis (P1); a pair of intermediate mirrors (4a, 4b) opposing to the plane mirrors (2a, 2b), respectively; a pair of ellipsoidal mirrors (6a, 6b) opposing to the intermediate mirrors (4a, 4b), respectively; and an ATR crystal (8) provided at a position nearer to the sample side than the pair of plane mirrors (2a, 2b) on the central axis (P1). The ellipsoidal mirrors (6a, 6b) are provided so that each one focal position (C1) formed by the intermediate mirror (4a, 4b) and the plane mirror (2a, 2b) are at same position on the central axis (P1), and each another focal position (C2) formed by only the intermediate mirror (4a, 4b) are also at same position on the central axis (P1). Further, the another focal position (C2) coincides with a boundary surface between the ATR crystal (8) and the sample.

公开(公告)号：US20200041408A1

公开(公告)日：2020-02-06

申请号：US16606421

申请日：2018-04-11

Applicant: JASCO CORPORATION

Inventor： Jun KOSHOBU ,  Noriaki SOGA ,  Hiroshi SUGIYAMA

IPC: G01N21/552 ,  G02B5/04

Abstract: The present invention provides a total reflection prism that can be used in multiple reflection method and that can make the contact area with the sample small. A total reflection prism is made of a plate-shaped optical member, has a leading-in part and a leading-out part of a measurement light provided at positions deviated from the center of either of the front and back surfaces, and has a plurality of plane parts that are formed perpendicularly to the front and back surfaces respectively on an outer periphery of the prism excluding the front and back surfaces of the prism. The leading-in part is provided to irradiate the measurement light that is guided inside at an angle of incidence of total reflection toward either of the front and back surfaces. The front and back surfaces are provided so that the measurement light travels while totally reflected alternately.

公开(公告)号：US20190086332A1

公开(公告)日：2019-03-21

申请号：US16089146

申请日：2017-03-23

Applicant: JASCO CORPORATION

Inventor： Noriaki SOGA ,  Tetsuji SUNAMI ,  Tsubasa ASATSUMA ,  Hiroshi SUGIYAMA ,  Jun KOSHOBU

IPC: G01N21/552 ,  G01N21/3563

CPC classification number: G01N21/552 ,  G01N21/3563

Abstract: An ATR optical instrument condensing an infrared light to a sample-side surface of a ATR crystal to measure a total reflection absorption spectrum includes: an incident-side ellipsoidal mirror condensing the infrared light to the sample-side surface at an incident angle equal to or larger than a critical angle θc inside; an exiting-side ellipsoidal mirror condensing a total reflection light from the sample-side surface; dichroic mirrors guiding an illumination light coaxially to the ellipsoidal mirrors; and a ZnS lens condensing a visible light from the sample-side surface to observe a contact state of the sample. The dichroic mirrors are configured to guide the illumination light to the ellipsoidal mirrors such that the illumination light is condensed to the sample-side surface at an angle less that a critical angle θc′ of the visible light. Accordingly, the ATR optical instrument becomes compact, and can visually observe the contact state of the sample surface.