Method for automated unsupervised ontological investigation of structural appearances in electron micrographs

    公开(公告)号:US11288491B2

    公开(公告)日:2022-03-29

    申请号:US16326359

    申请日:2018-07-02

    Inventor: Martin Ryner

    Abstract: The method is for dividing dark objects, sub-structures and background of an image from an electron microscope into segments by analyzing pixel values. The segments are transformed and aligned so that the transformed objects, sub-structures and background are meaningfully comparable. The transformed segments are clustered into classes which are used for ontological investigation of samples that are visualized by using electron microscopy. A triangle inequality comparison can be used to further cluster groups of objects to transfer understanding from different interactions between objects and to associate interactions with each other.

    METHOD FOR AUTOMATED UNSUPERVISED ONTOLOGICAL INVESTIGATION OF STRUCTURAL APPEARANCES IN ELECTRON MICROGRAPHS

    公开(公告)号:US20220157069A1

    公开(公告)日:2022-05-19

    申请号:US17665684

    申请日:2022-02-07

    Inventor: Martin Ryner

    Abstract: The method is for dividing dark objects, substructures and background of an image from an electron microscope into segments by analyzing pixel values. The segments are transformed and aligned so that the transformed objects, sub-structures and background are meaningfully comparable. The transformed segments are clustered into classes which are used for ontological investigation of samples that are visualized by using electron microscopy. A triangle inequality comparison can be used to further cluster groups of objects to transfer understanding from different interactions between objects and to associate interactions with each other.

    METHOD FOR QUANTIFICATION OF PURITY OF SUB-VISIBLE PARTICLE SAMPLES

    公开(公告)号:US20190011378A1

    公开(公告)日:2019-01-10

    申请号:US16068232

    申请日:2017-09-11

    Abstract: The method is for quantification of purity of sub-visible particle samples. A sample to be analyzed is place in an electron microscope to obtain an electron microscopy image of the sample. The sample contains objects. The objects that have sizes being different from a size range of primary particles and sizes being within the size range of primary particles are enhanced. The objects are detected as being primary particles or debris. The detected primary particles are excluded from the objects so that the objects contain debris but no primary particles. A first total area (T1) of the detected debris is measured. A second total area (T2) of the detected primary particles is measured.

    Method for automated unsupervised ontological investigation of structural appearances in electron micrographs

    公开(公告)号:US11574486B2

    公开(公告)日:2023-02-07

    申请号:US17665684

    申请日:2022-02-07

    Inventor: Martin Ryner

    Abstract: The method is for dividing dark objects, substructures and background of an image from an electron microscope into segments by analyzing pixel values. The segments are transformed and aligned so that the transformed objects, sub-structures and background are meaningfully comparable. The transformed segments are clustered into classes which are used for ontological investigation of samples that are visualized by using electron microscopy. A triangle inequality comparison can be used to further cluster groups of objects to transfer understanding from different interactions between objects and to associate interactions with each other.

    METHOD FOR AUTOMATED UNSUPERVISED ONTOLOGICAL INVESTIGATION OF STRUCTURAL APPEARANCES IN ELECTRON MICROGRAPHS

    公开(公告)号:US20210286969A1

    公开(公告)日:2021-09-16

    申请号:US16326359

    申请日:2018-07-02

    Inventor: Martin Ryner

    Abstract: The method is for dividing dark objects, substructures and background of an image from an electron microscope into segments by analysing pixel values. The segments are transformed and aligned so that the transformed objects, sub-structures and background are meaningfully comparable. The transformed segments are clustered into classes which are used for ontological investigation of samples that are visualized by using electron microscopy. A triangle inequality comparison can be used to further cluster groups of objects to transfer understanding from different interactions between objects and to associate interactions with each other.

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