Connector port frame for processor package

    公开(公告)号:US10109940B2

    公开(公告)日:2018-10-23

    申请号:US15377254

    申请日:2016-12-13

    Abstract: Embodiments herein relate to port frames and connectors for direct connections to integrated circuit packages. In various embodiments, a port frame to receive a connector and maintain a connection between the connector and a computer processor package may include a protrusion to provide stable attachment of the port frame to a bolster frame, a first wall, a second wall opposite the first wall, a first detent in the first wall, and a second detent in the second wall where the connector is to be received between the first wall and the second wall, and where the first detent is to receive a first locking protrusion extending from the connector and the second detent is to receive a second locking protrusion extending from the connector. Other embodiments may be described and/or claimed.

    Universal linear edge connector
    4.
    发明授权

    公开(公告)号:US10044115B2

    公开(公告)日:2018-08-07

    申请号:US14757626

    申请日:2015-12-23

    Abstract: An apparatus comprises a cable connector including: a first connector body portion including a first plurality of electrical contacts arranged to contact electrical contacts of a first surface of an edge connector substrate; a second connector body portion separate from the first connector body portion and including a second plurality of electrical contacts arranged to oppose the first plurality of electrical contacts of the first connector body portion and to contact electrical contacts of a second surface of the edge connector substrate, wherein the first and second plurality of electrical contacts are electrically coupled to one or more cables; and a joining mechanism configured to join the first connector body portion and the second connector body portion together and to apply a bias force to the edge connector substrate when the edge connector substrate is arranged between the first connector body portion and the second connector body portion.

    Double-beam test probe
    6.
    发明授权

    公开(公告)号:US11543454B2

    公开(公告)日:2023-01-03

    申请号:US16141422

    申请日:2018-09-25

    Abstract: Embodiments herein relate to a test probe. The test probe may have a first plurality of beams and a second plurality of beams. An intermediate substrate may be positioned between the first plurality of beams and the second plurality of beams. In embodiments, both the first and second plurality of beams may be angled. Other embodiments may be described or claimed.

    Low force liquid metal interconnect solutions

    公开(公告)号:US11622466B2

    公开(公告)日:2023-04-04

    申请号:US16902048

    申请日:2020-06-15

    Abstract: Embodiments disclosed herein include an electronic package. In an embodiment, the electronic package comprises a package substrate having a first surface and a second surface opposite from the first surface, and a die on the first surface of the package substrate. In an embodiment, the electronic package further comprises a socket interface on the second surface of the package substrate. In an embodiment, the socket interface comprises a first layer, wherein the first layer comprises a plurality of wells, a liquid metal within the plurality of wells, and a second layer over the plurality of wells.

    DOUBLE-BEAM TEST PROBE
    8.
    发明申请

    公开(公告)号:US20200096567A1

    公开(公告)日:2020-03-26

    申请号:US16141422

    申请日:2018-09-25

    Abstract: Embodiments herein relate to a test probe. The test probe may have a first plurality of beams and a second plurality of beams. An intermediate substrate may be positioned between the first plurality of beams and the second plurality of beams. In embodiments, both the first and second plurality of beams may be angled. Other embodiments may be described or claimed.

Patent Agency Ranking