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1.
公开(公告)号:US10806030B2
公开(公告)日:2020-10-13
申请号:US14597730
申请日:2015-01-15
Inventor: Jean Audet , Edmund D. Blackshear , Masahiro Fukui , Charles L. Reynolds , Kenji Terada , Tomoyuki Yamada
Abstract: A multi-layer substrate with metal layers as a moisture diffusion barrier for reduced electrical performance degradation over time after moisture exposure and methods of design and manufacture. The method includes determining a diffusion rate of an insulator material provided between an upper metal layer and an underlying signal line. The method further includes calculating a diffusion distance between a plane opening of the upper metal layer and the underlying signal line using the diffusion rate of the insulator material.
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2.
公开(公告)号:US10813215B2
公开(公告)日:2020-10-20
申请号:US15068891
申请日:2016-03-14
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor: Jean Audet , Edmund D. Blackshear , Masahiro Fukui , Charles L. Reynolds , Kenji Terada , Tomoyuki Yamada
Abstract: A multi-layer substrate with metal layers as a moisture diffusion barrier for reduced electrical performance degradation over time after moisture exposure and methods of design and manufacture. The method includes determining a diffusion rate of an insulator material provided between an upper metal layer and an underlying signal line. The method further includes calculating a diffusion distance between a plane opening of the upper metal layer and the underlying signal line using the diffusion rate of the insulator material.
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3.
公开(公告)号:US10687420B2
公开(公告)日:2020-06-16
申请号:US15068884
申请日:2016-03-14
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor: Jean Audet , Edmund D. Blackshear , Masahiro Fukui , Charles L. Reynolds , Kenji Terada , Tomoyuki Yamada
Abstract: A multi-layer substrate with metal layers as a moisture diffusion barrier for reduced electrical performance degradation over time after moisture exposure and methods of design and manufacture. The method includes determining a diffusion rate of an insulator material provided between an upper metal layer and an underlying signal line. The method further includes calculating a diffusion distance between a plane opening of the upper metal layer and the underlying signal line using the diffusion rate of the insulator material.
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