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公开(公告)号：US10333462B2
公开(公告)日：2019-06-25
申请号：US15382739
申请日：2016-12-19
Applicant: Industrial Technology Research Institute
Inventor： Ren-Chin Shr , Yean-San Long , En-Yun Wang , Min-An Tsai , Hung-Sen Wu , Teng-Chun Wu , Cho-Fan Hsieh , Chin Lien
IPC: H02S50/10
Abstract: A measuring apparatus for solar cell is provided, which is configured to measure a solar cell to obtain a characteristic curve thereof. The measuring apparatus includes a signal measurement control circuit and a signal transmitting control circuit. The signal measurement control circuit is configured to output at least one control signal for controlling a resistance circuit thereof to provide a measurement loading. The signal transmitting control circuit includes at least one path separating circuit, each path separating circuit is configured to provide at least two signal transmitting paths with different signal transmitting directions. The signal measurement control circuit outputs the control signal to the resistance circuit by using the signal transmitting control circuit, so that the resistance circuit can be controlled to provide the measurement loading.
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Patent Agency Ranking
公开(公告)号：US10461690B2
公开(公告)日：2019-10-29
申请号：US15830010
申请日：2017-12-04
Applicant: Industrial Technology Research Institute
Inventor： Yean-San Long , En-Yun Wang , Ren-Chin Shr , Yu-Ting Yen , Hsiang-Ying Cheng
Abstract: A defect inspection method and a defect inspection system for a solar cell are proposed, where the method includes the following steps. Output voltages and output currents of the solar cell are measured by a measuring device. A stepwise current-voltage curve (stepwise IV curve) and a fitted current-voltage curve (fitted IV curve) are generated by a processing device according to the output voltages and the output currents, and whether a first error of the fitted IV curve is less than a first error tolerance is determined by the processing device. When the first error is not less than the first error tolerance, whether there exists at least one surge in steps of the stepwise IV curve is determined by the processing device so as to determine whether the solar cell has a defect. Next, a determined result of the processing device is outputted by the output device.
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公开(公告)号：US20190173423A1
公开(公告)日：2019-06-06
申请号：US15830010
申请日：2017-12-04
Applicant: Industrial Technology Research Institute
Inventor： Yean-San Long , En-Yun Wang , Ren-Chin Shr , Yu-Ting Yen , Hsiang-Ying Cheng
Abstract: A defect inspection method and a defect inspection system for a solar cell are proposed, where the method includes the following steps. Output voltages and output currents of the solar cell are measured by a measuring device. A stepwise current-voltage curve (stepwise IV curve) and a fitted current-voltage curve (fitted IV curve) are generated by a processing device according to the output voltages and the output currents, and whether a first error of the fitted IV curve is less than a first error tolerance is determined by the processing device. When the first error s not less than the first error tolerance, whether there exists at least one surge in steps of the stepwise IV curve is determined by the processing device so as to determine whether the solar cell has a defect. Next, a determined result of the processing device is outputted by the output device.
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公开(公告)号：US20180154029A1
公开(公告)日：2018-06-07
申请号：US15886850
申请日：2018-02-02
Applicant: Industrial Technology Research Institute
Inventor： Ren-Chin Shr , Teng-Chun Wu , Wei-Yun Liang , Chih-Wei Kuo
CPC classification number: A61L2/10 , A61N5/0624 , E05B1/0069 , Y10T29/49002
Abstract: A sterilizing device comprises a light guiding member and an ultraviolet (UV) light source. The light guiding member has a surface. The UV light source emits UV light rays such that the UV light rays are guided into the guiding member based on a total internal reflection. When an object contacts or comes close to the surface, an evanescent wave from the UV light rays irradiates on the object.
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公开(公告)号：US20210135624A1
公开(公告)日：2021-05-06
申请号：US16728058
申请日：2019-12-27
Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
Inventor： Ren-Chin Shr , Jhong-Yuan Wang , Chin Lien , Kuan-Wu Lu
Abstract: Provided a connector including a first female connector and a first male connector. The first female connector includes a first male sleeve, and a probe is disposed on the first male sleeve. The first male connector includes a first female sleeve, in which an elastic structure is disposed in the first female sleeve. The probe passes through a hole on the first male sleeve and is electrically connected to a second female sleeve in a second male connector. The elastic structure is electrically connected to a second male sleeve in a second female connector.
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公开(公告)号：US20180123510A1
公开(公告)日：2018-05-03
申请号：US15382739
申请日：2016-12-19
Applicant: Industrial Technology Research Institute
Inventor： Ren-Chin Shr , Yean-San Long , En-Yun Wang , Min-An Tsai , Hung-Sen Wu , Teng-Chun Wu , Cho-Fan Hsieh , Chin Lien
IPC: H02S50/10
CPC classification number: H02S50/10
Abstract: A measuring apparatus for solar cell is provided, which is configured to measure a solar cell to obtain a characteristic curve thereof. The measuring apparatus includes a signal measurement control circuit and a signal transmitting control circuit. The signal measurement control circuit is configured to output at least one control signal for controlling a resistance circuit thereof to provide a measurement loading. The signal transmitting control circuit includes at least one path separating circuit, each path separating circuit is configured to provide at least two signal transmitting paths with different signal transmitting directions. The signal measurement control circuit outputs the control signal to the resistance circuit by using the signal transmitting control circuit, so that the resistance circuit can be controlled to provide the measurement loading.
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