公开(公告)号：US10277790B2

公开(公告)日：2019-04-30

申请号：US14978482

申请日：2015-12-22

Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

Inventor： Hau-Wei Wang ,  Chun-Hsien Chen ,  Chung-Ning Huang ,  Po-Yi Chang

IPC: H04N5/225 ,  G06T7/00 ,  G06T7/521 ,  G01C3/32 ,  G02B7/28

Abstract: A full-range image detecting system including a planar light source, an image capturing device, a light sensing device, a processing unit and a measuring module is provided. The planar light source projects a photo image with periodical variations onto an object. The image capturing device captures a reflective photo image reflected from the object. The light sensing device detects the coordinates of at least three measuring points on the object for fitting a plane. The processing unit calculates a phase variation of the reflective photo image after phase shift, a relative altitude of the surface profile of the object according to the phase variation, and an absolute altitude of the surface profile of the object with respect to the plane to obtain an information of absolute coordinate. The measuring module detects the surface of the object according to the information of absolute coordinate of the object.

公开(公告)号：US20180120078A1

公开(公告)日：2018-05-03

申请号：US15404776

申请日：2017-01-12

Applicant: INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE

Inventor： Chun-Hsien Chen ,  Shu-Ping Dong ,  Tapilouw Abraham MARIO

IPC: G01B5/20 ,  G01B3/18

CPC classification number: G01B5/20 ,  G01B3/18 ,  G01B5/30 ,  G01B11/306 ,  G01B21/30

Abstract: A flatness measurement device includes a movement platform, a standard component, a first flatness measuring device, a second flatness measuring device and a processor. The movement platform is used for driving a to-be-measured object to move. The standard component and the movement platform move together. The first flatness measuring device is used for measuring a first flatness information of the to-be-measured object when the to-be-measured object moves. The second flatness measuring device is used for measuring a second flatness information of the standard component when the standard component moves. A flatness information of the to-be-measured object is obtained by deducting the second flatness information from the first flatness information by the processor.