Test method, apparatus, and system

    公开(公告)号:US12166533B2

    公开(公告)日:2024-12-10

    申请号:US17702181

    申请日:2022-03-23

    Abstract: Example test methods and apparatus are described. One example method includes receiving an uplink radio frequency signal by a test device from a terminal device, where the uplink radio frequency signal is generated by superimposing at least two test signals, and each of the at least two test signal corresponds to one communication protocol. The test device extracts the at least two test signals from the uplink radio frequency signal. The test device separately tests the at least two test signals, and obtains an uplink test result of the terminal device.

    Test Method, Transmit Device, Test Device, and Test System

    公开(公告)号:US20210028869A1

    公开(公告)日:2021-01-28

    申请号:US17068300

    申请日:2020-10-12

    Abstract: A test method includes transmitting, by a transmit device, N signal sequences using a transmit antenna array, obtaining, from a test device, a phase offset that is of each signal sequence in the signal sequences and that is generated after the signal sequence passes through a channel, adjusting an initial test signal based on the phase offset that is of each signal sequence and that is generated after the signal sequence passes through the channel, to obtain a target test signal in-phase superposed at the test device, where the target test signal includes a plurality of signal sequences obtained by separately performing phase adjustment on the initial test signal based on the phase offset that is of each signal sequence and that is generated after the signal sequence passes through a respective channel, and transmitting the target test signal using the transmit antenna array.

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