公开(公告)号：US12166533B2

公开(公告)日：2024-12-10

申请号：US17702181

申请日：2022-03-23

Applicant: HUAWEI TECHNOLOGIES CO., LTD.

Inventor： Bo Hao ,  Yecun Huang ,  Liang Hu ,  Jutian Guo ,  Wei Zhai ,  Chengwen Yan

IPC: H04B17/00 ,  H03M1/00 ,  H04B17/10 ,  H04B17/20

Abstract: Example test methods and apparatus are described. One example method includes receiving an uplink radio frequency signal by a test device from a terminal device, where the uplink radio frequency signal is generated by superimposing at least two test signals, and each of the at least two test signal corresponds to one communication protocol. The test device extracts the at least two test signals from the uplink radio frequency signal. The test device separately tests the at least two test signals, and obtains an uplink test result of the terminal device.