公开(公告)号：US20210028869A1

公开(公告)日：2021-01-28

申请号：US17068300

申请日：2020-10-12

Applicant: Huawei Technologies Co., Ltd.

Inventor： Bo Hao ,  Xiaopeng Li ,  Xubo Zhao

IPC: H04B17/10 ,  H04B17/12 ,  G01R29/10

Abstract: A test method includes transmitting, by a transmit device, N signal sequences using a transmit antenna array, obtaining, from a test device, a phase offset that is of each signal sequence in the signal sequences and that is generated after the signal sequence passes through a channel, adjusting an initial test signal based on the phase offset that is of each signal sequence and that is generated after the signal sequence passes through the channel, to obtain a target test signal in-phase superposed at the test device, where the target test signal includes a plurality of signal sequences obtained by separately performing phase adjustment on the initial test signal based on the phase offset that is of each signal sequence and that is generated after the signal sequence passes through a respective channel, and transmitting the target test signal using the transmit antenna array.