Testing base
    1.
    发明授权

    公开(公告)号:US12130318B2

    公开(公告)日:2024-10-29

    申请号:US17985911

    申请日:2022-11-14

    发明人: Su-Wei Chang

    IPC分类号: G01R29/10

    CPC分类号: G01R29/10

    摘要: A testing base includes a housing, a carrier, a wave absorber, and a filler. The housing has an inner surface. The carrier is disposed on the housing. The carrier includes an upper surface, a lower surface, and a groove recessed in the upper surface. The groove is adapted for accommodating a component to be tested. The lower surface and the inner surface of the housing define a cavity body together. The wave absorber is disposed on the inner surface of the housing. The filler is filled in the cavity body and contacts the wave absorber and the carrier. A relative permittivity of the filler is less than or equal to 2.

    TEST DEVICE FOR HIGH-FREQUENCY APPLICATIONS
    3.
    发明公开

    公开(公告)号:US20240345148A1

    公开(公告)日:2024-10-17

    申请号:US18577425

    申请日:2022-06-23

    IPC分类号: G01R29/08 G01R29/10

    CPC分类号: G01R29/0878 G01R29/10

    摘要: A test probe (10) for contactlessly measuring the electromagnetic properties of a radio unit (20), in particular an antenna unit, having a hollow conductor (1) for transmitting electromagnetic waves, a filling element (2) which is disposed in the hollow conductor and made of a dielectric material, a lens element (3) which is disposed on the end face of the hollow conductor (1) and made of a dielectric material for coupling electromagnetic waves into the hollow conductor (1), and a contact portion (4) which is disposed on the hollow conductor end opposite the lens element (3) and which serves to decouple a measurement signal.

    Measuring radio frequency electromagnetic waves using Rydberg electrometry

    公开(公告)号:US12117474B1

    公开(公告)日:2024-10-15

    申请号:US18503062

    申请日:2023-11-06

    IPC分类号: G01R29/08 G01R23/04 G01R29/10

    CPC分类号: G01R29/0885

    摘要: In a general aspect, a radio frequency (RF) measurement device includes first and second mode converters, each configured to convert a mode of the RF electromagnetic wave between a first RF waveguide mode and a second RF waveguide mode. The RF measurement device also includes an internal cavity between the first and second mode converters that contains a vapor or a source of the vapor. The vapor includes Ryberg atoms or molecules. The RF measurement device additionally includes an RF waveguide extending between the first and second mode converters and configured to carry the second RF waveguide mode through the internal cavity. In some variations, the RF waveguide includes first and second longitudinal portions disposed on respective, opposite sides of the device and configured to establish a target RF profile in an interaction region of the internal cavity.

    SYSTEM FOR TESTING ANTENNA PERFORMANCE
    5.
    发明公开

    公开(公告)号:US20240241164A1

    公开(公告)日:2024-07-18

    申请号:US18013834

    申请日:2021-06-30

    申请人: AMOSENSE CO.,LTD

    IPC分类号: G01R29/10 G01R29/08 G01R35/00

    摘要: Presented is a system for testing antenna performance, in which antenna performance is tested by reflecting the loss of a cable used in the antenna performance test. The presented system for testing antenna performance comprises a tester having a test port, the test port being connected, via a cable, to an antenna that communicates with a terminal to be tested, in a shield box, when a test mode is set, wherein the tester outputs a test signal to the test port, receives a response signal corresponding to the test signal via the test port, and obtains a value, as a communication performance measurement value, by adding a calibration value to a reception signal strength of the response signal.

    Atom-based closed-loop control for electromagnetic radiation measurement, communications, and information processing

    公开(公告)号:US12000877B2

    公开(公告)日:2024-06-04

    申请号:US18173290

    申请日:2023-02-23

    IPC分类号: G01R29/08 G01R29/10

    摘要: A method for atom-based closed-loop control includes exciting atoms of a gas into one or more Rydberg states, applying one or more signal processing functions to the one or more Rydberg states, and regulating a characteristic of the applied one or more signal processing functions based on, at least in part, a response of the one or more Rydberg states to the one or more signal processing functions. A system for internal quantum-state-space interferometry includes an atomic receiver, an interferometric pathway, and a detector. The interferometer includes an atomic vapor with first atomic states and second atomic states. The interferometric pathway from RF phases between the first and second atomic states is closed by a quantum-state-space. The detector is configured to detect a readout of an interferometric signal. Embodiments include atom-based automatic level control, baseband processors, phase-locked loops, voltage transducers, raster RF imagers and waveform analyzers.

    ANECHOIC CHAMBER AND CONSTRUCTION METHOD THEREOF

    公开(公告)号:US20240159808A1

    公开(公告)日:2024-05-16

    申请号:US18503230

    申请日:2023-11-07

    IPC分类号: G01R29/08 G01R29/10

    CPC分类号: G01R29/0821 G01R29/105

    摘要: An anechoic chamber and a construction method thereof are provided, the anechoic chamber includes a top surface, being a polygon; trapezoid surfaces, corresponding to edges of top surface, upper edge lengths of trapezoid surface being equal to edge lengths of top surface, trapezoid surfaces being connected to edges of top surface through the upper edges, the trapezoid surfaces being sequentially connected along a circumferential direction of top surface, and being at angle to the top surface; rectangular surfaces, corresponding to the trapezoid surfaces, upper edge lengths of rectangular surface being equal to lower edge lengths of trapezoid surface, rectangular surfaces being connected to the trapezoid surfaces through the upper edges, the rectangular surfaces being sequentially connected along a circumferential direction of the lower edges of trapezoid surfaces, and being perpendicular to the top surface; and an absorbing material, disposed on the top surface, the trapezoid surfaces and the rectangular surfaces.

    Test system
    8.
    发明授权

    公开(公告)号:US11933829B2

    公开(公告)日:2024-03-19

    申请号:US17715581

    申请日:2022-04-07

    发明人: Corbett Rowell

    IPC分类号: G01R29/10 G01R29/08

    CPC分类号: G01R29/105 G01R29/0821

    摘要: A test system for testing a device under test is provided including at least one feed antenna, a shielded chamber, and at least a first reflector and a second reflector. The test system is a compact antenna test range. The first reflector and the second reflector are arranged inside the shielded chamber. The first reflector is configured and arranged such that it redirects outgoing test signals emitted by the at least one feed antenna towards the second reflector and incoming test signals coming from the second reflector towards the at least one feed antenna. The device under test is arranged outside the shielded chamber. The shielded chamber includes at least a first interface associated with the device under test. The first interface and the feed antenna are located at different sides of the shielded chamber, which are perpendicular to each other.

    Phased array over the air testing

    公开(公告)号:US11916302B2

    公开(公告)日:2024-02-27

    申请号:US17541175

    申请日:2021-12-02

    申请人: Tektronix, Inc.

    摘要: A test and measurement system includes a test and measurement device having input channels, a reference array of antennas connected to the input channels, one or more processors in the test and measurement device configured to execute code to cause the one or more processors to receive a first signal from a phased array of antennas connected to a device under test directed at a first side of the reference array, receive a second signal from the phased array of antennas connected to the device under test directed at a second side of the reference array, without moving the device under test, the phased array, or the reference array. A method of testing a device under test using a phased array of antennas includes tuning the phased array to a first location at a first side of a reference array of antennas, by adjusting a phase for each antenna in the phased array, receiving a first signal from the device under test at the first location, tuning the phased array to a second location at a second side of the reference array of antennas, and receiving a second signal from the device under test at the second location. A test and measurement device includes at least two input channels, an array of at least two reference antennas, each antenna connected to one of the input channels, one or more processors in the test and measurement device configured to execute code to cause the one or more processors to receive an input signal from one or more of the reference antennas, and measure the input signal from one or more of the reference antennas.

    A SUPPORT STRUCTURE FOR A DEVICE UNDER TEST ALLOWING ROTATION

    公开(公告)号:US20240044962A1

    公开(公告)日:2024-02-08

    申请号:US18258800

    申请日:2021-12-02

    申请人: VERKOTAN OY

    发明人: Pertti MÄKIKYRÖ

    IPC分类号: G01R29/10 G01R29/08

    CPC分类号: G01R29/10 G01R29/0892

    摘要: A support structure for a device under test, (DUT), allows rotation, through a rotatable inner compartment applicable to fix, rotate and/or move the DUT. The inner compartment is manufactured of polymethacrylimide or other substantially RF-transparent material, and the inner compartment encloses, holds or attaches to the DUT, so that the inner compartment is made immobile relative to the DUT. The inner compartment is rotated by a first motor, so the DUT is placeable in a desired alignment angle between two conducted measurements requiring two different alignment angles. When measuring, the inner compartment remains in place and fixed with the DUT. A second motor is applicable for linear movement of the arrangement. A testing method for the DUT tests different temperatures by using two concentric compartments, and by feeding air having a desired temperature to the intermediate volume, and having through-holes on the wall of the inner compartment.