METHOD, DEVICE AND MEDIUM FOR CALCULATING RADIATION FIELD OF SATELLITE-BORNE ARRAY ANTENNA

    公开(公告)号:US20250052801A1

    公开(公告)日:2025-02-13

    申请号:US18416899

    申请日:2024-01-19

    Applicant: ZHEJIANG LAB

    Abstract: Disclosed is a method and a device for calculating a radiation field of satellite-borne array antennas. comprising: calculation of a kernel function of an antenna: calculating the kernel function of a very-low-frequency antenna in an ionospheric environment; calculation of an antenna current distribution: establishing and solving N current integral equations satisfied by the array antennas to obtain the current distribution of each antenna in the array; calculation of the radiation fields of the array antennas: calculating and summing the radiation fields of all antenna elements to obtain the radiation field of the array antennas; calculation of an array factor: analyzing a propagation phase difference between the ith antenna and the first antenna, and calculating the array factor of the array antennas accordingly, further simplifying the radiation field of the array antennas. The present disclosure has advantages of less calculation time consumption and high accuracy.

    Testing base
    3.
    发明授权

    公开(公告)号:US12130318B2

    公开(公告)日:2024-10-29

    申请号:US17985911

    申请日:2022-11-14

    Inventor: Su-Wei Chang

    CPC classification number: G01R29/10

    Abstract: A testing base includes a housing, a carrier, a wave absorber, and a filler. The housing has an inner surface. The carrier is disposed on the housing. The carrier includes an upper surface, a lower surface, and a groove recessed in the upper surface. The groove is adapted for accommodating a component to be tested. The lower surface and the inner surface of the housing define a cavity body together. The wave absorber is disposed on the inner surface of the housing. The filler is filled in the cavity body and contacts the wave absorber and the carrier. A relative permittivity of the filler is less than or equal to 2.

    TEST DEVICE FOR HIGH-FREQUENCY APPLICATIONS
    5.
    发明公开

    公开(公告)号:US20240345148A1

    公开(公告)日:2024-10-17

    申请号:US18577425

    申请日:2022-06-23

    CPC classification number: G01R29/0878 G01R29/10

    Abstract: A test probe (10) for contactlessly measuring the electromagnetic properties of a radio unit (20), in particular an antenna unit, having a hollow conductor (1) for transmitting electromagnetic waves, a filling element (2) which is disposed in the hollow conductor and made of a dielectric material, a lens element (3) which is disposed on the end face of the hollow conductor (1) and made of a dielectric material for coupling electromagnetic waves into the hollow conductor (1), and a contact portion (4) which is disposed on the hollow conductor end opposite the lens element (3) and which serves to decouple a measurement signal.

    Measuring radio frequency electromagnetic waves using Rydberg electrometry

    公开(公告)号:US12117474B1

    公开(公告)日:2024-10-15

    申请号:US18503062

    申请日:2023-11-06

    CPC classification number: G01R29/0885

    Abstract: In a general aspect, a radio frequency (RF) measurement device includes first and second mode converters, each configured to convert a mode of the RF electromagnetic wave between a first RF waveguide mode and a second RF waveguide mode. The RF measurement device also includes an internal cavity between the first and second mode converters that contains a vapor or a source of the vapor. The vapor includes Ryberg atoms or molecules. The RF measurement device additionally includes an RF waveguide extending between the first and second mode converters and configured to carry the second RF waveguide mode through the internal cavity. In some variations, the RF waveguide includes first and second longitudinal portions disposed on respective, opposite sides of the device and configured to establish a target RF profile in an interaction region of the internal cavity.

    SYSTEM FOR TESTING ANTENNA PERFORMANCE
    7.
    发明公开

    公开(公告)号:US20240241164A1

    公开(公告)日:2024-07-18

    申请号:US18013834

    申请日:2021-06-30

    CPC classification number: G01R29/10 G01R29/0878 G01R29/0892 G01R35/007

    Abstract: Presented is a system for testing antenna performance, in which antenna performance is tested by reflecting the loss of a cable used in the antenna performance test. The presented system for testing antenna performance comprises a tester having a test port, the test port being connected, via a cable, to an antenna that communicates with a terminal to be tested, in a shield box, when a test mode is set, wherein the tester outputs a test signal to the test port, receives a response signal corresponding to the test signal via the test port, and obtains a value, as a communication performance measurement value, by adding a calibration value to a reception signal strength of the response signal.

    Atom-based closed-loop control for electromagnetic radiation measurement, communications, and information processing

    公开(公告)号:US12000877B2

    公开(公告)日:2024-06-04

    申请号:US18173290

    申请日:2023-02-23

    CPC classification number: G01R29/0885 G01R29/0892 G01R29/10

    Abstract: A method for atom-based closed-loop control includes exciting atoms of a gas into one or more Rydberg states, applying one or more signal processing functions to the one or more Rydberg states, and regulating a characteristic of the applied one or more signal processing functions based on, at least in part, a response of the one or more Rydberg states to the one or more signal processing functions. A system for internal quantum-state-space interferometry includes an atomic receiver, an interferometric pathway, and a detector. The interferometer includes an atomic vapor with first atomic states and second atomic states. The interferometric pathway from RF phases between the first and second atomic states is closed by a quantum-state-space. The detector is configured to detect a readout of an interferometric signal. Embodiments include atom-based automatic level control, baseband processors, phase-locked loops, voltage transducers, raster RF imagers and waveform analyzers.

    ANECHOIC CHAMBER AND CONSTRUCTION METHOD THEREOF

    公开(公告)号:US20240159808A1

    公开(公告)日:2024-05-16

    申请号:US18503230

    申请日:2023-11-07

    CPC classification number: G01R29/0821 G01R29/105

    Abstract: An anechoic chamber and a construction method thereof are provided, the anechoic chamber includes a top surface, being a polygon; trapezoid surfaces, corresponding to edges of top surface, upper edge lengths of trapezoid surface being equal to edge lengths of top surface, trapezoid surfaces being connected to edges of top surface through the upper edges, the trapezoid surfaces being sequentially connected along a circumferential direction of top surface, and being at angle to the top surface; rectangular surfaces, corresponding to the trapezoid surfaces, upper edge lengths of rectangular surface being equal to lower edge lengths of trapezoid surface, rectangular surfaces being connected to the trapezoid surfaces through the upper edges, the rectangular surfaces being sequentially connected along a circumferential direction of the lower edges of trapezoid surfaces, and being perpendicular to the top surface; and an absorbing material, disposed on the top surface, the trapezoid surfaces and the rectangular surfaces.

    Test system
    10.
    发明授权

    公开(公告)号:US11933829B2

    公开(公告)日:2024-03-19

    申请号:US17715581

    申请日:2022-04-07

    Inventor: Corbett Rowell

    CPC classification number: G01R29/105 G01R29/0821

    Abstract: A test system for testing a device under test is provided including at least one feed antenna, a shielded chamber, and at least a first reflector and a second reflector. The test system is a compact antenna test range. The first reflector and the second reflector are arranged inside the shielded chamber. The first reflector is configured and arranged such that it redirects outgoing test signals emitted by the at least one feed antenna towards the second reflector and incoming test signals coming from the second reflector towards the at least one feed antenna. The device under test is arranged outside the shielded chamber. The shielded chamber includes at least a first interface associated with the device under test. The first interface and the feed antenna are located at different sides of the shielded chamber, which are perpendicular to each other.

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