SAMPLE FOR ELECTRON MICROSCOPY AND METHOD OF MANUFACTURING THE SAME
    1.
    发明申请
    SAMPLE FOR ELECTRON MICROSCOPY AND METHOD OF MANUFACTURING THE SAME 有权
    电子显微镜样品及其制造方法

    公开(公告)号:US20140026672A1

    公开(公告)日:2014-01-30

    申请号:US13934225

    申请日:2013-07-03

    Abstract: A sample for electron microscopy includes a base member and a sensor. The sensor is configured to measure data on the sample. The sensor includes an insulating member and a measuring element. The insulating member is deposited in or near an area of observation that is defined on a surface of the base member. The measuring element is deposited on a surface of the insulating member or over the surface of the base member and the surface of the insulating member.

    Abstract translation: 用于电子显微镜的样品包括基底构件和传感器。 传感器被配置为测量样品上的数据。 传感器包括绝缘构件和测量元件。 绝缘构件沉积在限定在基底构件的表面上的观察区域中或附近。 测量元件沉积在绝缘构件的表面上或者在基底构件的表面和绝缘构件的表面上。

    LINER CONFIGURING MEMBER, HIGH PRESSURE TANK, AND METHOD OF MANUFACTURING SAME

    公开(公告)号:US20200088351A1

    公开(公告)日:2020-03-19

    申请号:US16570135

    申请日:2019-09-13

    Abstract: A liner configuring member configuring a liner includes a main body section which is configured from a resin material and has both ends opened. That is, both ends of the main body section are, respectively, a first open end and a second open end. There is provided in a vicinity of the first open end a first flange section where a first annular recess is formed by a first bottom section and a first side section. On the other hand, there is provided in a vicinity of the second open end a second flange section where a second annular recess is formed by a second bottom section and a second side section.

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