摘要:
A method for inspecting a nano-imprint template, includes irradiating light onto a template for nano-imprinting from a back surface side of the template, the template having a front surface where a pattern is formed, detecting near-field light which is generated near the front surface of the template by the irradiation of the light, and performing an inspection of the template on the basis of the detected near-field light.
摘要:
According to one embodiment, a pattern forming method is disclosed. The method includes contacting a template with light curable resin on a substrate. The template comprises a concave-convex pattern including concave portions and convex portions, and a metal layer provided on a convex portion of the concave-convex pattern. The concave-convex pattern is to be contacted with the light curable resin. The pattern forming method further includes irradiating the light curable resin with light of a predetermined wavelength under a condition ε1=−2ε2. Where ε1 is a complex relative permittivity of the metal layer corresponding to the predetermined wavelength, ε2 is a complex relative permittivity of the light curable resin corresponding to the predetermined wavelength.
摘要:
According to one embodiment, a template for imprint lithography includes a transparent substrate having a pattern with a recess portion and a protruding portion, and a light-shielding portion formed on a bottom surface of the recess portion and on a top surface of the protruding portion. A side wall of the protruding portion is inclined.
摘要:
According to one embodiment, a mask inspection apparatus includes a decompression chamber, a holder, a light irradiation unit, a detection unit, an electrode, and a control unit. The holder is provided in the decompression chamber and holds a mask. The light irradiation unit irradiates a major surface of the mask held by the holder with a light. The detection unit is provided in the decompression chamber to detect electrons generated when the major surface of the mask is irradiated with the light. The electrode is provided between the holder and the detection unit and guides the electrons in a direction from the holder toward the detection unit. The control unit compares a detection result of the electrons detected by the detection unit with a reference value.
摘要:
A surface-treated steel sheet for fuel tanks comprising a Zn--X alloy plating layer + a chromate film, in which the Zn--X alloy plating layer has an X content for the plating metal as a whole of Ni: 9-18 wt %, Co: 0.02-3 wt %, Mn: 25-45 wt %, or Cr: 8-20 wt %, the amount of deposition of the plating layer is 5-40 g/m.sup.2 and the amount of the chromate film is 10-200 mg/m.sup.2 on a metallic Cr basis, the Zn--X alloy plating layer corresponding to at least the inner surface of a tank has: (1) cracks in the surface layer, with the density of the cracks being 1000-150000 in terms of the number of plated regions surrounded by cracks in a visual field of 1 mm.times.1 mm, and the maximum width of the cracks is not more than 0.5 .mu.m, or (2) an X/(X+Zn) atomic percentage (X.sub.2) determined by surface analysis based on ESCA with X.sub.1 .noteq.X.sub.2 (wherein X.sub.1 =average value of the X content of the plating metal as a whole), and with X.sub.2 being Ni: 5-25 at %, Co: 0.009-10 at %, Mn: 15-65 at % or Cr: 5-25 at %.
摘要:
According to one embodiment, a pattern forming apparatus includes a control unit. The control unit is configured to execute a test patterning to same patterns using probes under same conditions, obtain a position error and a size error by comparing a position and a size of the same patterns with a target value, select a normal probe in which the position error and the size error is in an allowable range among the probes, execute a correction process which adjusts sub patterning areas which are patterned by the normal probe among a main patterning area of a substrate, and execute a patterning of the sub patterning areas using the normal probe.
摘要:
A near-field exposure mask according to an embodiment includes: a silicon substrate; and a near-field light generating unit that is formed on the silicon substrate, the near-field light generating unit being a layer containing at least one element selected from the group consisting of Au, Al, Ag, Cu, Cr, Sb, W, Ni, In, Ge, Sn, Pb, Zn, Pd, and C, or a film stack formed with layers made of some of those materials.
摘要:
A near-field exposure mask according to an embodiment includes: a silicon substrate; and a near-field light generating unit that is formed on the silicon substrate, the near-field light generating unit being a layer containing at least one element selected from the group consisting of Au, Al, Ag, Cu, Cr, Sb, W, Ni, In, Ge, Sn, Pb, Zn, Pd, and C, or a film stack formed with layers made of some of those materials.
摘要:
According to one embodiment, a mask inspection apparatus includes a decompression chamber, a holder, a light irradiation unit, a detection unit, an electrode, and a control unit. The holder is provided in the decompression chamber and holds a mask. The light irradiation unit irradiates a major surface of the mask held by the holder with a light. The detection unit is provided in the decompression chamber to detect electrons generated when the major surface of the mask is irradiated with the light. The electrode is provided between the holder and the detection unit and guides the electrons in a direction from the holder toward the detection unit. The control unit compares a detection result of the electrons detected by the detection unit with a reference value.
摘要:
A material which can be improved in its resistance to corrosion caused by alcohol-containing fuels after formation without detriment to weldability and without any substantial cost increase is developed.ConstitutionA chromate film is applied to a Zn--X alloy electroplating layer, in which X is one or more of Ni: 3-18 wt %, Co: 0.02-3 wt %, Mn: 25-45 wt %, or Cr: 8-20 wt %. The Zn--Ni alloy plating layer underlying the chromate film has cracks with a density of 1000-150000 in terms of the number of plated regions surrounded by cracks in a 1 mm.times.1 mm visual field, with cracks having a maximum width of 0.5 .mu.m or less comprising 90% or more of the total number of the cracks, and with cracks having a depth of 80% or more of the thickness of the plating layer comprising 80% or more of the total number of the cracks.