Lib anode coating measurement with dual x-ray

    公开(公告)号:US11982523B2

    公开(公告)日:2024-05-14

    申请号:US17450762

    申请日:2021-10-13

    CPC classification number: G01B15/02 G01N23/00 H01M4/0404

    Abstract: A system includes a top scanner head configured over a coated substrate. An x-ray sensor and a second x-ray sensor scan the coated substrate. At least one of the x-ray sensor and second x-ray sensor is tuned to an energy level below an absorption peak and at least one of the x-ray sensor and second x-ray sensor is tuned to an energy level above the absorption peak. The x-ray sensor and second x-ray sensor scan a same sheet spot on the coated substrate. A bottom scanner head is configured underneath the coated substrate to provide a location for a detection of x-rays for the x-ray sensor and the second x-ray sensor.

    LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY

    公开(公告)号:US20230113133A1

    公开(公告)日:2023-04-13

    申请号:US17450762

    申请日:2021-10-13

    Abstract: A system includes a top scanner head configured over a coated substrate. An x-ray sensor and a second x-ray sensor scan the coated substrate. At least one of the x-ray sensor and second x-ray sensor is tuned to an energy level below an absorption peak and at least one of the x-ray sensor and second x-ray sensor is tuned to an energy level above the absorption peak. The x-ray sensor and second x-ray sensor scan a same sheet spot on the coated substrate. A bottom scanner head is configured underneath the coated substrate to provide a location for a detection of x-rays for the x-ray sensor and the second x-ray sensor.

    LIB ANODE COATING MEASUREMENT WITH DUAL X-RAY

    公开(公告)号:US20240280360A1

    公开(公告)日:2024-08-22

    申请号:US18653451

    申请日:2024-05-02

    CPC classification number: G01B15/02 G01N23/00 H01M4/0404

    Abstract: A system includes a top scanner head configured over a coated substrate. An x-ray sensor and a second x-ray sensor scan the coated substrate. At least one of the x-ray sensor and second x-ray sensor is tuned to an energy level below an absorption peak and at least one of the x-ray sensor and second x-ray sensor is tuned to an energy level above the absorption peak. The x-ray sensor and second x-ray sensor scan a same sheet spot on the coated substrate. A bottom scanner head is configured underneath the coated substrate to provide a location for a detection of x-rays for the x-ray sensor and the second x-ray sensor.

    APPARATUS FOR COMPOSITE SHEET WEIGHT DETERMINATIONS

    公开(公告)号:US20200096380A1

    公开(公告)日:2020-03-26

    申请号:US16560170

    申请日:2019-09-04

    Abstract: A measurement apparatus for weight measuring composite sheet including a sheet material having a second material thereon as a coating and/or as embedded particles therein. The apparatus includes an x-ray sensor for providing an x-ray signal from x-ray irradiating the composite sheet and an infrared (IR) sensor for providing an IR signal from IR irradiating the composite sheet. A computing device is coupled to receive the x-ray signal and the IR signal that includes a processor having an associated memory for implementing an algorithm, where the algorithm uses the x-ray signal and the IR signal to compute a plurality of weights selected from a weight of the sheet material, a weight of the second material, and a total weight of the composite sheet.

    Apparatus for simultaneously determining weights of composite sheets

    公开(公告)号:US11333544B2

    公开(公告)日:2022-05-17

    申请号:US16443543

    申请日:2019-06-17

    Abstract: A measurement apparatus includes a beta gauge for generating a first sensor response signal from a composite sheet including a sheet material having a coating thereon including a high-z material or the sheet material has particles including the high-z material embedded in the sheet material. A second sensor being an x-ray or an infrared (IR) sensor provides a second sensor response signal from the composite sheet. A computing device is coupled to receive the first and the second sensor response signal that includes a processor having an associated memory for implementing an algorithm that uses the first and the second sensor response signal to simultaneously compute two or more weight measures selected from (i) a weight per unit area of the high-z material, (ii) a weight per unit area of the sheet material, and (iii) a total weight per unit area of the composite sheet.

    Thickness measurement with inductive and optical displacement sensors

    公开(公告)号:US11143495B2

    公开(公告)日:2021-10-12

    申请号:US16569214

    申请日:2019-09-12

    Abstract: A sensor system includes an eddy current sensor including at least one coil with excitation electronics coupled across the coil. An optical displacement sensor is secured to the eddy current sensor so that a vertical distance between the sensors is fixed. The optical displacement sensor is located on top of and concentric with the coil so that a measurement axis of the optical displacement sensor is collinear with an axis of symmetry of the coil. A computing device including a processor and memory is coupled to receive sensor data from the eddy current sensor and the optical displacement sensor that is adapted for analyzing the sensor data obtained from measuring a coated substrate including a coating layer on at least one side of a metal substrate to determine at least a thickness of the coating layer.

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