公开(公告)号：US20210333216A1

公开(公告)日：2021-10-28

申请号：US17264588

申请日：2019-04-09

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Xiangguang MAO ,  Masanori KOBAYASHI ,  Hirotoshi TERADA ,  Ikuo ARATA ,  Masataka IKESU

IPC: G01N21/88 ,  G02B21/33 ,  G01N21/95 ,  G02B21/02 ,  G02B21/36

Abstract: A solid immersion lens unit includes a solid immersion lens having a contact surface for coming into contact with semiconductor device formed of a silicon substrate and a spherical surface to be disposed to face an objective lens; a holder holding the solid immersion lens; and an optical element held by the holder to be positioned between the objective lens and the solid immersion lens. The solid immersion lens transmits light having at least a part of wavelength in a range of 200 nm or greater and 1100 nm or lower. The optical element corrects aberration caused by a difference in refractive indices between the silicon substrate and the solid immersion lens.

公开(公告)号：US20200158633A1

公开(公告)日：2020-05-21

申请号：US16631927

申请日：2018-05-30

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Satoshi YAMAMOTO ,  Masanori MATSUBARA ,  Norikazu SUGIYAMA ,  Masanori KOBAYASHI

IPC: G01N21/51 ,  G01N1/20 ,  G02B5/04 ,  G01N21/53

Abstract: A sample observation device includes a flow cell in which a fluid containing samples flows, an irradiation unit configured to irradiate the samples flowing in the flow cell with planar light, an image formation unit having an observation axis inclined with respect to an irradiation surface for the planar light, and configured to form an image of observation light generated in the sample due to the irradiation with the planar light, a two-dimensional imaging element configured to capture a light image including at least a cross section of the fluid among light images according to the observation light formed by the image formation unit, and outputs image data, and an analysis unit configured to analyze a light intensity profile of the sample in a flow direction of the fluid on the basis of the image data.

公开(公告)号：US20230176352A1

公开(公告)日：2023-06-08

申请号：US17924160

申请日：2021-03-17

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Masanori KOBAYASHI ,  Satoshi YAMAMOTO

IPC: G02B21/00 ,  G01N21/64

CPC classification number: G02B21/0032 ,  G01N21/6456 ,  G01N2201/06113

Abstract: A light irradiation device includes: a light source configured to output light having coherence; a light focusing element having a focusing axis and a non-focusing axis intersecting with the focusing axis and configured to focus the light on a focusing line so as to generate planar light; and an aperture mask having an opening part that limits a part of luminous fluxes of the light transmitted from the light source to the light focusing element. The opening part of the aperture mask has opening edges disposed to extend in a direction along the focusing axis of the light focusing element, and, in a case in which the opening edges are projected onto the focusing line, corresponding projected portions have linear spreads.

公开(公告)号：US20250035901A1

公开(公告)日：2025-01-30

申请号：US18911797

申请日：2024-10-10

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Masanori KOBAYASHI ,  Satoshi YAMAMOTO

IPC: G02B21/00 ,  G01N21/64

Abstract: A light irradiation device includes: a light source configured to output light having coherence; a light focusing element having a focusing axis and a non-focusing axis intersecting with the focusing axis and configured to focus the light on a focusing line so as to generate planar light; and an aperture mask having an opening part that limits a part of luminous fluxes of the light transmitted from the light source to the light focusing element. The opening part of the aperture mask has opening edges disposed to extend in a direction along the focusing axis of the light focusing element, and, in a case in which the opening edges are projected onto the focusing line, corresponding projected portions have linear spreads.

公开(公告)号：US20210116692A1

公开(公告)日：2021-04-22

申请号：US16981969

申请日：2019-01-10

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Masanori KOBAYASHI ,  Satoshi YAMAMOTO

IPC: G02B21/00

Abstract: A sample observation device includes: an emission optical system that emits planar light to a sample; a scanning unit that scans the sample in one direction so as to pass through an emission surface of the planar light; an imaging optical system that has an observation axis inclined with respect to the emission surface and forms an image of observation light generated in the sample by emission of the planar light; an image acquisition unit that acquires image data corresponding to an optical image of the observation light formed by the imaging optical system; and an image generation unit that generates observation image data of the sample based on the image data acquired by the image acquisition unit. The imaging optical system has a non-axisymmetric optical element that bends a light beam on one axis of the observation light but does not bend a light beam on the other axis perpendicular to the one axis.