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    System and method to enable detection of viral infection by users of electronic communication devices
    2.
    发明授权
    System and method to enable detection of viral infection by users of electronic communication devices 有权
    用于电子通信设备的用户检测病毒感染的系统和方法

    公开(公告)号：US09075909B2

    公开(公告)日：2015-07-07

    申请号：US13680289

    申请日：2012-11-19

    Applicant: Gal Almogy ,  Gilad Almogy

    Inventor： Gal Almogy ,  Gilad Almogy

    IPC: G06F9/44 ,  G06N7/02 ,  G06N7/06 ,  G06F19/00

    CPC classification number: G16H50/20 ,  G06F19/00 ,  G16H50/80 ,  Y02A90/24

    Abstract: A non-transitory computer readable medium that stores instructions for causing a computerized system to perform the following operations: determining, by the computerized system, that a first person is infected by a first infectious disease; wherein the determination is associated with a first person infection probability attribute; detecting, by the computerized system, based upon location information collected during at least a portion of a first infectious disease manifestation period, the location information being indicative of locations of the first person and other persons, a second person that was within an infection distance from the first person and is potentially infected by the first infectious disease; calculating, by the computerized system, a second person infection probability attribute; and updating, by the computerized system, the first person infection probability attribute in response to the second person infection probability attribute.

    Abstract translation: 存储用于使计算机化系统执行以下操作的指令的非暂时计算机可读介质：由计算机化系统确定第一人被第一感染性疾病感染; 其中所述确定与第一人感染概率属性相关联; 由所述计算机化系统基于在第一感染性疾病表现期间的至少一部分期间收集的位置信息来检测所述位置信息，所述位置信息指示所述第一人和其他人的位置，所述位置信息在距离 第一个人并且可能被第一感染性疾病感染; 通过计算机化系统计算第二人感染概率属性; 并且由所述计算机化系统更新响应于所述第二人感染概率属性的所述第一人感染概率属性。

    CHARGED PARTICLE DETECTOR ASSEMBLY, CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR GENERATING AN IMAGE
    5.
    发明申请
    CHARGED PARTICLE DETECTOR ASSEMBLY, CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR GENERATING AN IMAGE 有权
    充电颗粒检测器组件，充电颗粒光束装置和用于产生图像的方法

    公开(公告)号：US20080191134A1

    公开(公告)日：2008-08-14

    申请号：US11923421

    申请日：2007-10-24

    Applicant: Gilad Almogy ,  Dror Shemesh ,  Pavel Adamec

    Inventor： Gilad Almogy ,  Dror Shemesh ,  Pavel Adamec

    IPC: G01N23/00 ,  G01T1/00

    CPC classification number: H01J37/244 ,  H01J2237/2443 ,  H01J2237/24455 ,  H01J2237/2446 ,  H01J2237/24465 ,  H01J2237/2802 ,  H01J2237/2804

    Abstract: A charged particle detector assembly comprises a particle detector, which has at least one particle sensitive region for detecting at least a portion of the spatial distribution of charged particles and for generating a two-dimensional optical signal which correlates to the detected spatial distribution. Further, an image conduit has an input coupled to the particle sensitive region of the particle detector for transmitting the two-dimensional optical signal to at least one optical detector. Further, a selecting means is adapted for selecting at least a portion of the two-dimensional optical signal.

    Abstract translation: 带电粒子检测器组件包括粒子检测器，该粒子检测器具有至少一个用于检测带电粒子的空间分布的至少一部分的粒子敏感区域，并用于产生与检测到的空间分布相关的二维光信号。 此外，图像导管具有耦合到粒子检测器的粒子敏感区域的输入端，用于将二维光信号传输到至少一个光学检测器。 此外，选择装置适于选择二维光信号的至少一部分。

    System and method for process variation monitor
    7.
    发明授权
    System and method for process variation monitor 有权
    过程变化监测系统和方法

    公开(公告)号：US07054480B2

    公开(公告)日：2006-05-30

    申请号：US11038449

    申请日：2005-01-18

    Applicant: Evgeni Levin ,  Gilad Almogy ,  Efrat Rozenman

    Inventor： Evgeni Levin ,  Gilad Almogy ,  Efrat Rozenman

    IPC: G06F19/00 ,  G01N21/88 ,  G06K9/00

    CPC classification number: G06T7/001 ,  G01N21/9501 ,  G01N21/956 ,  G01N21/95607 ,  G01N2021/8896 ,  G06T2207/30148 ,  Y10S430/146

    Abstract: A method to extend the process monitoring capabilities of a semiconductor wafer optical inspection system so as to be able to detect low-resolution effects of process variations over the surface of a wafer at much higher sensitivity than heretofore possible. The method consists, in essence, of grouping sensed pixels by geometric blocks over the inspected surface and comparing each block with a corresponding one from another die on the same wager, from another wager of from a stored model image. In one embodiment of the invention, pixel values are compared directly and differences are thresholded at a considerably lower level than during a defects detection process. In another embodiment, there is calculated a signature for each block, based on the sensed light intensity values, and corresponding signatures are compared.

    Abstract translation: 扩展半导体晶片光学检查系统的过程监控能力的方法，以便能够以比以前更高的灵敏度检测晶片表面上的工艺变化的低分辨率效应。 本方法基本上包括通过检查表面上的几何块对感测像素进行分组，并且从相同下注的另一个模具中将每个块与来自另一个管芯的对应的块相比较，从另一个来自存储的模型图像的冲量。 在本发明的一个实施例中，像素值被直接比较，并且差异以比在缺陷检测处理期间低得多的阈值阈值化。 在另一个实施例中，基于感测的光强度值计算每个块的签名，并对相应的签名进行比较。

    Optical inspection method and apparatus utilizing a variable angle design
    9.
    发明授权
    Optical inspection method and apparatus utilizing a variable angle design 有权

    公开(公告)号：US06469784B2

    公开(公告)日：2002-10-22

    申请号：US09941659

    申请日：2001-08-30

    Applicant: Boris Golberg ,  Amir Komem ,  Ron Naftali ,  Gilad Almogy

    Inventor： Boris Golberg ,  Amir Komem ,  Ron Naftali ,  Gilad Almogy

    IPC: G01N2100

    CPC classification number: G01N21/94

    Abstract: Method and apparatus for optical inspection of an article are presented. The apparatus comprises an illumination unit and at least one detection unit. The illumination unit generates an incident beam and directs it onto a predetermined region of the article. The detection unit includes a light collection system and a detector. The light collection system collects light scattered from the illuminated region with a predetermined constant maximum collection angle, and utilizes a variable angle design for selectively selecting from collected light at least one light component propagating with a solid angle segment of the maximum collection angle, and directing it to the detector.

    Multiple beam scanner for an inspection system
    10.
    发明授权
    Multiple beam scanner for an inspection system 失效
    用于检查系统的多光束扫描仪

    公开(公告)号：US06236454B1

    公开(公告)日：2001-05-22

    申请号：US08990462

    申请日：1997-12-15

    Applicant: Gilad Almogy

    Inventor： Gilad Almogy

    IPC: G01N2100

    CPC classification number: G01N21/8806 ,  G01N21/8903 ,  G01N21/9501 ,  G01N2021/8816

    Abstract: An inspection system using dark field imaging includes a multiple beam laser scanning unit and at least one multiple beam dark field imaging unit. The laser scanning unit generates multiple beams which illuminate multiple spots on a surface to be scanned. The imaging unit separately detects light scattered from the multiple spots. The spots are separated by a separation distance which ensures that scattered light from each associated spot are received only by its associated photodetector. Each imaging unit includes collection optics and multiple photodetectors, one per spot. The collection optics and photodetectors are mounted so as to separate the light scattered from the different scan lines. In one embodiment, this separation is provided by arranging the collection optics and photodetectors according to the principles of Scheimpflug imaging.

    Abstract translation: 使用暗场成像的检查系统包括多光束激光扫描单元和至少一个多光束暗场成像单元。 激光扫描单元产生照射要扫描的表面上的多个点的多个光束。 成像单元分别检测从多个点散射的光。 这些光斑被隔开一段间隔距离，确保来自每个相关光点的散射光仅由其相关联的光电检测器接收。 每个成像单元包括收集光学元件和多个光电检测器，每个点一个。 收集光学元件和光电检测器被安装成分离从不同扫描线散射的光。 在一个实施例中，通过根据Scheimpflug成像的原理布置收集光学元件和光电检测器来提供该分离。

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