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公开(公告)号：US12054437B2
公开(公告)日：2024-08-06
申请号：US17545475
申请日：2021-12-08
Applicant: General Electric Company
Inventor： Scott Alan Gold
CPC classification number: C04B38/0625 , B22D29/001 , C04B38/0615 , C04B38/062 , C08J9/0066 , C08J9/26 , C08J2201/026 , C08J2201/042 , C08J2300/00 , C08J2333/04 , C08J2363/00 , C04B38/062 , C04B35/01 , C04B38/0054 , C04B38/0074 , C04B40/001 , C04B38/0615 , C04B35/01 , C04B38/0054 , C04B38/0074 , C04B40/001
Abstract: A ceramic resin is provided, along with its methods of formation and use. The ceramic resin may include a crosslinkable precursor, a photoinitiator, ceramic particles, and pore forming particles. The ceramic resin may be utilized to form a ceramic casting element, such as via a method that includes forming a layer of the ceramic resin; applying light onto the ceramic resin such that the photoinitiator initiates polymerization of the crosslinkable precursor to form a crosslinked polymeric matrix setting the ceramic particles and the pore forming particles; and thereafter, heating the crosslinked polymeric matrix to a first temperature to burn out the pore forming particles.
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公开(公告)号：US11851763B2
公开(公告)日：2023-12-26
申请号：US15631955
申请日：2017-06-23
Applicant: GENERAL ELECTRIC COMPANY
Inventor： Scott Alan Gold
IPC: B22F7/04 , C23C16/50 , B33Y10/00 , B33Y30/00 , B28B1/00 , B33Y40/00 , C23C16/04 , C23C16/52 , B23K15/00 , B23K26/342 , B23K26/082 , B29C64/153 , B22F7/06 , B29C64/165 , B29C64/20 , B22F7/02 , B33Y40/20 , B22F10/14 , B22F10/28 , B22F12/49 , B22F12/67 , B22F12/70 , B22F10/50 , B22F10/62 , B22F3/24 , B22F12/00 , B22F10/36 , B22F10/64
CPC classification number: C23C16/50 , B22F7/02 , B22F7/04 , B22F7/06 , B22F10/14 , B22F10/28 , B22F10/50 , B22F10/62 , B22F12/49 , B22F12/67 , B22F12/70 , B23K15/0086 , B23K26/082 , B23K26/342 , B28B1/001 , B29C64/153 , B29C64/165 , B29C64/20 , B33Y10/00 , B33Y30/00 , B33Y40/00 , B33Y40/20 , C23C16/04 , C23C16/52 , B22F3/24 , B22F10/36 , B22F10/64 , B22F12/224 , B22F2003/242 , B22F2999/00 , B22F2999/00 , B22F2003/242 , C23C16/00
Abstract: The present disclosure generally relates to methods and apparatuses for chemical vapor deposition (CVD) during additive manufacturing (AM) processes. Such methods and apparatuses can be used to embed chemical signatures into manufactured objects, and such embedded chemical signatures may find use in anti-counterfeiting operations and in manufacture of objects with multiple materials.
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公开(公告)号：US11717910B2
公开(公告)日：2023-08-08
申请号：US17088231
申请日：2020-11-03
Applicant: GENERAL ELECTRIC COMPANY
Inventor： Scott Alan Gold
CPC classification number: B23K15/0086 , B23K15/002 , B23K15/0013 , B23K15/0026 , B23K15/02 , B33Y30/00 , B33Y50/02 , G01N29/12 , G01N29/2443 , G01N2291/0289
Abstract: Devices, systems, methods, and kits of parts for monitoring operation of an electron beam additive manufacturing systems are disclosed. A monitoring system includes one or more measuring devices positioned on the at least one wall in the interior of a build chamber of the additive manufacturing system. Each one of the one or more measuring devices includes a piezoelectric crystal. The monitoring system further includes an analysis component communicatively coupled to the one or more measuring devices. The analysis component is programmed to receive information pertaining to a frequency of oscillation of the piezoelectric crystal. A collection of material on the one or more measuring devices during formation of an article within the build chamber causes a change to the frequency of oscillation of the piezoelectric crystal that is detectable by the analysis component and usable to determine a potential build anomaly of the article.
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公开(公告)号：US20220134467A1
公开(公告)日：2022-05-05
申请号：US17088231
申请日：2020-11-03
Applicant: GENERAL ELECTRIC COMPANY
Inventor： Scott Alan Gold
Abstract: Devices, systems, methods, and kits of parts for monitoring operation of an electron beam additive manufacturing systems are disclosed. A monitoring system includes one or more measuring devices positioned on the at least one wall in the interior of a build chamber of the additive manufacturing system. Each one of the one or more measuring devices includes a piezoelectric crystal. The monitoring system further includes an analysis component communicatively coupled to the one or more measuring devices. The analysis component is programmed to receive information pertaining to a frequency of oscillation of the piezoelectric crystal. A collection of material on the one or more measuring devices during formation of an article within the build chamber causes a change to the frequency of oscillation of the piezoelectric crystal that is detectable by the analysis component and usable to determine a potential build anomaly of the article.
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公开(公告)号：US20190285455A1
公开(公告)日：2019-09-19
申请号：US16430770
申请日：2019-06-04
Applicant: General Electric Company
Inventor： Scott Alan Gold , James Harding Shealy , Lucas Christian Jones
Abstract: A method of characterizing gas flow within a housing includes: positioning one or more gas flow sensors in the housing; introducing a gas flow into the housing; using the one or more gas flow sensors to generate two or more gas flow measurements at spaced-apart locations within the housing; and recording the two or more measurements to create a gas flow map.
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Patent Agency Ranking
公开(公告)号：US10113894B2
公开(公告)日：2018-10-30
申请号：US15972742
申请日：2018-05-07
Applicant: General Electric Company
Inventor： Scott Alan Gold , James Harding Shealy , Lucas Christian Jones
Abstract: A method of characterizing gas flow within a housing includes: positioning one or more gas flow sensors in the housing; introducing a gas flow into the housing; using the one or more gas flow sensors to generate two or more gas flow measurements at spaced-apart locations within the housing; and recording the two or more measurements to create a gas flow map.
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公开(公告)号：US20180293372A1
公开(公告)日：2018-10-11
申请号：US15479352
申请日：2017-04-05
Applicant: General Electric Company
Inventor： Scott Alan Gold , Thomas Graham Spears
CPC classification number: G06F21/44 , G06F16/955
Abstract: A system and method for authenticating an additively manufactured component are provided. The method includes locating an identifying region on the component which may be positioned at a predetermined location relative to an identifiable datum feature. The identifying region may be scanned to determine a component identifier of the component. A reference identifier may be obtained from a database and compared to the component identifier to determine whether the component is authentic.
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公开(公告)号：US11642725B2
公开(公告)日：2023-05-09
申请号：US15001050
申请日：2016-01-19
Applicant: GENERAL ELECTRIC COMPANY
Inventor： Scott Alan Gold
IPC: B33Y50/02 , B33Y10/00 , B29C64/153 , B22F10/28 , B22F12/90 , B22F10/31 , B22F10/366
CPC classification number: B22F12/90 , B22F10/28 , B22F10/31 , B22F10/366 , B29C64/153 , B33Y10/00 , B33Y50/02 , Y02P10/25
Abstract: This invention relates to a method for calibrating the delay settings of a laser or scanner head in a laser additive manufacturing process. More particularly, the invention relates to calibrating delay settings during run-ins and run-outs of a laser scanning process.
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9.发明申请公开(公告)号：US20230129572A1
公开(公告)日：2023-04-27
申请号：US18069544
申请日：2022-12-21
Applicant: General Electric Company
Inventor： Scott Alan Gold , Thomas Graham Spears , Ajay Kumar Anand
IPC: B29C64/153 , B33Y10/00 , B33Y30/00 , B33Y50/02 , B23K26/342 , B23K26/70 , B23K26/03 , B23K26/14 , B23K31/00 , B22F10/28
Abstract: A system and method of monitoring a powder-bed additive manufacturing process is provided where a layer of additive powder is fused using an energy source and electromagnetic emission signals are measured by a melt pool monitoring system to monitor the print process. The measured emission signals are analyzed to identify outlier emissions and clusters of outliers are identified by assessing the spatial proximity of the outlier emissions, e.g., using clustering algorithms, spatial control charts, etc. An alert may be provided or a process adjustment may be made when a cluster is identified or when a magnitude of a cluster exceeds a predetermined cluster threshold.
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公开(公告)号：US11559854B2
公开(公告)日：2023-01-24
申请号：US16662621
申请日：2019-10-24
Applicant: General Electric Company
Inventor： Scott Alan Gold , Thomas Graham Spears , Ajay Kumar Anand
Abstract: A system and method of monitoring a powder-bed additive manufacturing process is provided where a layer of additive powder is fused using an energy source and electromagnetic emission signals are measured by a melt pool monitoring system to monitor the print process. The measured emission signals are analyzed to identify outlier emissions and clusters of outliers are identified by assessing the spatial proximity of the outlier emissions, e.g., using clustering algorithms, spatial control charts, etc. An alert may be provided or a process adjustment may be made when a cluster is identified or when a magnitude of a cluster exceeds a predetermined cluster threshold.
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