-
公开(公告)号:US12097675B2
公开(公告)日:2024-09-24
申请号:US17393963
申请日:2021-08-04
Applicant: DEXERIALS CORPORATION
Inventor: Yutaka Muramoto , Masanao Kikuchi , Shunichi Kajiya , Takaaki Otowa , Yasuhiro Takahashi
IPC: B29D11/00 , B29C33/38 , B29C33/42 , B29C35/08 , B29C41/28 , B29C59/04 , C03C15/00 , G03F7/00 , G03F7/24 , G11B7/26 , B29L11/00
CPC classification number: B29D11/0074 , B29C33/38 , B29C33/3842 , B29C33/424 , B29C35/0805 , B29C41/28 , B29C59/04 , C03C15/00 , G03F7/0002 , G03F7/24 , G11B7/261 , B29C35/0888 , B29C59/046 , B29K2909/08 , B29L2011/00 , C03C2218/34
Abstract: Provided are a cylindrical base, a master and a method for manufacturing a master enabling a uniform transfer of a fine pattern. A cylindrical base of a quartz glass having an internal strain in terms of birefringence of less than 70 nm/cm is used. A resist layer is deposited to an outer circumference surface of this cylindrical base, a latent image is formed on the resist layer, the latent image formed on the resist layer is developed and the pattern of the developed resist layer is used as a mask for etching to form a structure including concaves or convexes arranged in a plurality of rows on the outer circumference surface of the cylindrical base.
-
公开(公告)号:US10207470B2
公开(公告)日:2019-02-19
申请号:US15026509
申请日:2014-12-04
Applicant: DEXERIALS CORPORATION
Inventor: Yutaka Muramoto , Masanao Kikuchi , Shunichi Kajiya , Takaaki Otowa , Yasuhiro Takahashi
IPC: B29D11/00 , B29C41/28 , G11B7/26 , C03C15/00 , B29C33/38 , B29C59/04 , B29C33/42 , B29C35/08 , G03F7/00 , G03F7/24 , B29L11/00
Abstract: Provided are a cylindrical base, a master and a method for manufacturing a master enabling a uniform transfer of a fine pattern. A cylindrical base of a quartz glass having an internal strain in terms of birefringence of less than 70 nm/cm is used. A resist layer is deposited to an outer circumference surface of this cylindrical base, a latent image is formed on the resist layer, the latent image formed on the resist layer is developed and the pattern of the developed resist layer is used as a mask for etching to form a structure including concaves or convexes arranged in a plurality of rows on the outer circumference surface of the cylindrical base.
-
公开(公告)号:US11090886B2
公开(公告)日:2021-08-17
申请号:US15950596
申请日:2018-04-11
Applicant: DEXERIALS CORPORATION
Inventor: Yutaka Muramoto , Masanao Kikuchi , Shunichi Kajiya , Takaaki Otowa , Yasuhiro Takahashi
IPC: B29C33/42 , G11B7/26 , B29D11/00 , B29C41/28 , B29C33/38 , G03F7/00 , G03F7/24 , C03C15/00 , B29C59/04 , B29C35/08 , B29L11/00
Abstract: Provided are a cylindrical base, a master and a method for manufacturing a master enabling a uniform transfer of a fine pattern. A cylindrical base of a quartz glass having an internal strain in terms of birefringence of less than 70 nm/cm is used. A resist layer is deposited to an outer circumference surface of this cylindrical base, a latent image is formed on the resist layer, the latent image formed on the resist layer is developed and the pattern of the developed resist layer is used as a mask for etching to form a structure including concaves or convexes arranged in a plurality of rows on the outer circumference surface of the cylindrical base.
-
-