Optical element, light diffusing element, and image display apparatus
    1.
    发明授权
    Optical element, light diffusing element, and image display apparatus 有权
    光学元件,光漫射元件和图像显示装置

    公开(公告)号:US09036261B2

    公开(公告)日:2015-05-19

    申请号:US13972027

    申请日:2013-08-21

    IPC分类号: G02B5/02 F21V5/00 G09G5/10

    摘要: An optical element using visible light from wavelengths λS to λL (λL>λS), is formed of a translucent material having refractive indexes nS and nL, respectively, for light having the wavelengths λS and λL. The optical element includes an incident face; an exit face; and a micro convexo-concave structure used as an anti-reflection structure (ARS), being formed at least one of the incident face and the exit face. An average distance P between adjacent micro convexo-concave structures satisfies condition (1) P≦0.8·λS/nS. Dimensionless parameters mS and mL satisfy condition (2) 0.8≦mS≦1.1 and condition (3) 0.8≦mL≦1.1. The parameters mS and mL, an average height H, the wavelengths λS and λL, and the refractive indexes nS and nL of the micro convexo-concave structure satisfy condition (4) mS·λS/(2·nS)≦H≦mL·λL/(2·nL).

    摘要翻译: 使用波长λS〜λL(λL>λS)的可见光的光学元件分别由具有波长λS和λL的光的折射率nS和nL的半透明材料形成。 光学元件包括入射面; 出口面 以及用作防反射结构(ARS)的微型凹凸结构,形成入射面和出射面中的至少一个。 相邻的微凹凸结构之间的平均距离P满足条件(1)P≦̸ 0.8·λS/ nS。 无量纲参数mS和mL满足条件(2)0.8≦̸ mS≦̸ 1.1和条件(3)0.8≦̸ mL≦̸ 1.1。 微凹凸结构的参数mS和mL,平均高度H,波长λS和λL以及折射率nS和nL满足条件(4)mS·λS/(2·nS)≦̸ H≦̸ mL ·λL/(2·nL)。

    OPTICAL ELEMENT, LIGHT DIFFUSING ELEMENT, AND IMAGE DISPLAY APPARATUS
    2.
    发明申请
    OPTICAL ELEMENT, LIGHT DIFFUSING ELEMENT, AND IMAGE DISPLAY APPARATUS 有权
    光学元件,光扩散元件和图像显示设备

    公开(公告)号:US20140071026A1

    公开(公告)日:2014-03-13

    申请号:US13972027

    申请日:2013-08-21

    IPC分类号: F21V5/00 G09G5/10

    摘要: An optical element using visible light from wavelengths λS to λL (λL>λS), is formed of a translucent material having refractive indexes nS and nL, respectively, for light having the wavelengths λS and λL. The optical element includes an incident face; an exit face; and a micro convexo-concave structure used as an anti-reflection structure (ARS), being formed at least one of the incident face and the exit face. An average distance P between adjacent micro convexo-concave structures satisfies condition (1) P≦0.8·λS/nS. Dimensionless parameters mS and mL satisfy condition (2) 0.8≦mS≦1.1 and condition (3) 0.8≦mL≦1.1. The parameters mS and mL, an average height H, the wavelengths λS and λL, and the refractive indexes nS and nL of the micro convexo-concave structure satisfy condition (4) mS·λS/(2·nS)≦H≦mL·λL/(2·nL).

    摘要翻译: 使用波长λS到λL(λL>λS)的可见光的光学元件分别由具有λS和λL波长的光的折射率为nS和nL的半透明材料形成。 光学元件包括入射面; 出口面 以及用作防反射结构(ARS)的微型凹凸结构,形成入射面和出射面中的至少一个。 相邻的微凹凸结构之间的平均距离P满足条件(1)P @0..8λ/λ。 无量纲参数mS和mL满足条件(2)0.8 @ mS @ 1.1和条件(3)0.8 @ mL @ 1.1。 微凸凹结构的参数mS和mL,平均高度H,波长λS和λL以及折射率nS和nL满足条件(4)mS·λS/(2·nS)@ H @ mL· lambdaL /(2·nL)。

    Optical element, mold, and optical device
    3.
    发明授权
    Optical element, mold, and optical device 有权
    光学元件,模具和光学装置

    公开(公告)号:US09500778B2

    公开(公告)日:2016-11-22

    申请号:US14163224

    申请日:2014-01-24

    IPC分类号: G02B1/118 G02B13/14

    CPC分类号: G02B1/118 G02B13/14

    摘要: An optical element having an antireflection effect includes an incident plane and an emission plane and a conical microstructure formed on at least one plane of the incident plane and the emission plane. The conical microstructure includes a first structure formed of a plurality of conical microprojections with an average height H1 and a second structure formed of a plurality of conical microrecesses with an average height H2. The average height H1 satisfies an inequality H1≦1/3*λ/n and the average height H2 satisfies an inequality H2≦1/3*λ/n. An average pitch P between the first structure and the second structure satisfies following conditions: H1/2≦P≦1/3*λ/n, and H2/2≦P≦1/3*λ/n, in which the use wavelength is defined as λ and the refractive index relative to the use wavelength is n.

    摘要翻译: 具有防反射效果的光学元件包括在入射面和发射面的至少一个平面上形成的入射面和发射面以及圆锥形微结构。 圆锥形微结构包括由具有平均高度H1的多个锥形微喷射体形成的第一结构和由具有平均高度H2的多个锥形微过程形成的第二结构。 平均高度H1满足不等式H1≤1/ 3 *λ/ n,平均高度H2满足不等式H2≤1/ 3 *λ/ n。 第一结构和第二结构之间的平均间距P满足以下条件:H1 /2≤P≤1/ 3 *λ/ n,H2 /2≤P≤1/ 3 *λ/ n,其中使用波长 被定义为λ,相对于使用波长的折射率为n。

    Data usage method, system, and program thereof employing blockchain network (BCN)

    公开(公告)号:US11636477B2

    公开(公告)日:2023-04-25

    申请号:US16473671

    申请日:2017-12-28

    申请人: Takayuki Nakamura

    发明人: Takayuki Nakamura

    摘要: The purpose of the present invention is to provide a new data utilization system in which, while an individual independently uses and utilizes one's own personal data, security and anonymity of the data can be effected. An information processing device used by an individual comprises: a function of transmitting, over a network, data relating to an address on a blockchain network used by the individual to a provider-side information processing device comprising a storage device that is a provision source of data associated with information about the individual; a function of referring to access data (ACT) that includes the data relating to the blockchain network address and data for identifying the provision source of the data and that is issued by the provision-side information processing device for the blockchain network address; and a function of, on the basis of the access data (ACT), acquiring the data associated with the information about the individual from the provider-side storage device and storing said data at least in a storage device or a memory of said individual.

    Pattern inspection apparatus and pattern inspection method
    7.
    发明授权
    Pattern inspection apparatus and pattern inspection method 有权
    图案检验装置和图案检验方法

    公开(公告)号:US08698081B2

    公开(公告)日:2014-04-15

    申请号:US13317860

    申请日:2011-10-31

    IPC分类号: H01J37/28

    CPC分类号: H01J37/28 G01N23/225

    摘要: The pattern inspection apparatus includes: an irradiator irradiating a sample with an electron beam; an electron detector detecting an amount of electrons generated on the sample having a pattern formed thereon, by the irradiation of the electron beam; an image processor generating a SEM image of the pattern on the basis of the electron amount; and a controller acquiring defect position information on the pattern formed on the sample from an optical defect inspection device. The controller specifies a defect candidate pattern from the SEM image on the basis of the defect position information and judges whether a defect in the defect candidate pattern is to be transferred onto a wafer. The controller determines a view field of the SEM image on the basis of the defect position information and specifies the defect candidate pattern from image information on patterns displayed in the view field.

    摘要翻译: 图案检查装置包括:用电子束照射样品的照射器; 电子检测器,通过电子束的照射检测在其上形成有图案的样品上产生的电子的量; 基于电子量产生图案的SEM图像的图像处理器; 以及控制器从光学缺陷检查装置获取关于在样品上形成的图案的缺陷位置信息。 控制器基于缺陷位置信息从SEM图像指定缺陷候选图案,并判断缺陷候选图案中的缺陷是否被转印到晶片上。 控制器基于缺陷位置信息确定SEM图像的视野,并根据视场中显示的图案的图像信息指定缺陷候选模式。

    GUIDE ASSEMBLY FOR ENDOSCOPE
    9.
    发明申请
    GUIDE ASSEMBLY FOR ENDOSCOPE 审中-公开
    内镜指南大会

    公开(公告)号:US20120302830A1

    公开(公告)日:2012-11-29

    申请号:US13479598

    申请日:2012-05-24

    IPC分类号: A61B1/00

    摘要: An endoscope includes a head assembly having a first central axis for entry in a body cavity. In combination with the endoscope, a guide assembly includes a shaft sleeve having a lumen, for mounting on the head assembly therewith. An endless track device is supported around the shaft sleeve, for endlessly moving along the first central axis, for propulsion of the head assembly inside the body cavity. A support sleeve is disposed between the shaft sleeve and the endless track device, having a second central axis different from the first central axis, for supporting the endless track device movably. Preferably, the endoscope includes an imaging window area formed in a distal surface of the head assembly and offset from the first central axis. A position shift between the first and second central axes is predetermined according to a position shift between the imaging window area and the first central axis.

    摘要翻译: 内窥镜包括具有用于进入体腔的第一中心轴线的头部组件。 与内窥镜组合,引导组件包括具有内腔的轴套,用于安装在头部组件上。 环形轨道装置被支撑在轴套周围,用于沿着第一中心轴线不停地移动,用于将头部组件推进到体腔内。 支撑套筒设置在轴套和环形轨道装置之间,具有不同于第一中心轴线的第二中心轴线,用于可移动地支撑环形轨道装置。 优选地,内窥镜包括形成在头部组件的远侧表面中并与第一中心轴线偏移的成像窗口区域。 第一和第二中心轴之间的位置偏移根据成像窗口区域和第一中心轴线之间的位置偏移而预先确定。