Polarimeter for detecting polarization rotation

    公开(公告)号:US10578492B2

    公开(公告)日:2020-03-03

    申请号:US16146523

    申请日:2018-09-28

    Abstract: A polarimeter for measuring a polarization rotation caused by a measurement object is provided, the polarimeter including an optically active material. The polarimeter includes a light source unit for irradiating a measurement object with light having a specific polarization; an anisotropic meta surface element for splitting reaction light, obtained by reacting the light of the specific polarization irradiated by the light source unit with the measurement object, into first and second reaction light; and a detection unit for detecting the first and second reaction light separated by the anisotropic meta surface element according to polarization. The polarization rotation caused by the measurement object may be calculated by comparing detection signals of the first and second reaction light detected by the detection unit.

    SPECTROMETER INCLUDING METASURFACE
    10.
    发明申请

    公开(公告)号:US20220011161A1

    公开(公告)日:2022-01-13

    申请号:US17486326

    申请日:2021-09-27

    Abstract: A spectrometer includes a transparent substrate including a first surface and a second surface that face each other and are substantially parallel to each other; a slit provided on the first surface and through which light is incident onto the transparent substrate; a spectrum optical system including metasurface including a plurality of nanostructures that are two-dimensionally arranged and satisfy a sub-wavelength scattering condition, wherein the metasurface includes a focusing metasurface which includes first nanostructures of the plurality of nanostructures, and is configured to reflect, disperse, and focus the light incident thereon through the slit, at different angles based on respective wavelengths; and a sensor configured to receive the light from the focusing metasurface. When L is a total length of an optical path from the slit to the sensor and D is a thickness of the transparent substrate, L and D satisfy the following inequality: L/D>3.

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