DETECTING UNRELIABLE BITS IN TRANSISTOR CIRCUITRY

    公开(公告)号:US20190074984A1

    公开(公告)日:2019-03-07

    申请号:US15694809

    申请日:2017-09-03

    Abstract: A method for detecting unreliable bits in transistor circuitry includes applying a controllable physical parameter to a transistor circuitry, thereby causing a variation in a digital code of a cryptologic element in the transistor circuitry, the variation being a tilt or bias in a positive or negative direction. An amount of variation in the digital code of the cryptologic element is determined. Unreliable bits in the transistor circuitry are defined as those bits for which the variation is in a range defined as unreliable.

    Switch capacitor in bandgap voltage reference (BGREF)

    公开(公告)号:US10061336B1

    公开(公告)日:2018-08-28

    申请号:US15796807

    申请日:2017-10-29

    Inventor: Joseph Shor

    CPC classification number: G05F1/59 G05F3/30

    Abstract: A bandgap reference (BGREF) circuit includes at least one switch capacitor impedance element including a capacitor coupled with switches that receive a reference frequency. The at least one switch capacitor element is coupled with at least one diode. The BGREF circuit is operative to create a voltage reference.

    PHYSICAL UNCLONABLE FUNCTIONS RELATED TO INVERTER TRIP POINTS

    公开(公告)号:US20190165953A1

    公开(公告)日:2019-05-30

    申请号:US15825457

    申请日:2017-11-29

    Abstract: A physical unclonable function (PUF) array includes a plurality of PUF transistor cells each of which includes at least one inverter. An input and an output of the at least one inverter are shorted to a first reference node. There is adjustment circuitry for adjusting a reference voltage of the first reference node, and measurement circuitry for measuring a trip point of the at least one inverter. If the trip point is close to the reference voltage then bits of the at least one inverter are defined as unstable.

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