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公开(公告)号:US09888528B2
公开(公告)日:2018-02-06
申请号:US14634711
申请日:2015-02-27
Applicant: APPLIED MATERIALS, INC.
Inventor: Tomoharu Matsushita , Jallepally Ravi , Cheng-Hsiung Tsai , Aravind Kamath , Xiaoxiong Yuan , Manjunatha Koppa
CPC classification number: H05B3/26 , H01L21/67103 , H05B2203/037
Abstract: Embodiments of substrate supports are provided herein. In some embodiments, a substrate support may include a body having a support surface; and a first heater disposed within the body and having a first heating coil and multiple heating zones, wherein a pitch of windings of the first heating coil vary among each of the multiple heating zones to define a predetermined heating ratio between the multiple heating zones.
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公开(公告)号:US11031273B2
公开(公告)日:2021-06-08
申请号:US16213816
申请日:2018-12-07
Applicant: APPLIED MATERIALS, INC.
Inventor: Bonnie T Chia , Ross Marshall , Tomoharu Matsushita , Cheng-Hsiung Tsai
IPC: H01L21/683 , H01L21/67 , F24F3/00 , H02N13/00
Abstract: Embodiments of an electrostatic chuck are provided herein. In some embodiments an electrostatic chuck includes an electrode, a dielectric body having a disk shape and covering the electrode, the dielectric body including a central region and a peripheral region, and the dielectric body including a lower surface having a central opening and an upper surface having a first opening in the central region and a plurality of second openings in the peripheral region, wherein the upper surface includes a plurality of protrusions and a diameter of each of the plurality of second openings is greater than 25.0 mils, and gas distribution channels that extend from the lower surface to the upper surface to define a plenum within the dielectric body.
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公开(公告)号:US12228395B2
公开(公告)日:2025-02-18
申请号:US17530538
申请日:2021-11-19
Applicant: Applied Materials, Inc.
Inventor: Tomoharu Matsushita , Aravind Kamath , Jallepally Ravi , Cheng-Hsiung Tsai , Hiroyuki Takahama
IPC: G01B5/004 , H01L21/68 , H01L21/683 , B25J11/00
Abstract: Methods and apparatus for substrate position calibration for substrate supports in substrate processing systems are provided herein. In some embodiments, a method for positioning a substrate on a substrate support includes: obtaining a plurality of backside pressure values corresponding to a plurality of different substrate positions on a substrate support by repeatedly placing a substrate in a position on the substrate support, and vacuum chucking the substrate to the substrate support and measuring a backside pressure; and analyzing the plurality of backside pressure values to determine a calibrated substrate position.
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公开(公告)号:US11201078B2
公开(公告)日:2021-12-14
申请号:US15468509
申请日:2017-03-24
Applicant: APPLIED MATERIALS, INC.
Inventor: Tomoharu Matsushita , Aravind Kamath , Jallepally Ravi , Cheng-Hsiung Tsai , Hiroyuki Takahama
IPC: H01L21/683 , G01L21/02 , H01L21/67
Abstract: Methods and apparatus for substrate position calibration for substrate supports in substrate processing systems are provided herein. In some embodiments, a method for positioning a substrate on a substrate support includes: obtaining a plurality of backside pressure values corresponding to a plurality of different substrate positions on a substrate support by repeatedly placing a substrate in a position on the substrate support, and vacuum chucking the substrate to the substrate support and measuring a backside pressure; and analyzing the plurality of backside pressure values to determine a calibrated substrate position.
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公开(公告)号:US10134615B2
公开(公告)日:2018-11-20
申请号:US15019573
申请日:2016-02-09
Applicant: APPLIED MATERIALS, INC.
Inventor: Aravind Miyar Kamath , Cheng-Hsiung Tsai , Jallepally Ravi , Tomoharu Matsushita , Yu Chang
IPC: H01L21/687 , H01L21/67 , H01J37/32
Abstract: Apparatus for processing a substrate are provided herein. In some embodiments, a substrate support includes a body having a support surface; an RF electrode disposed in the body proximate the support surface to receive RF current from an RF source; a shaft to support the body; a conductive element having an interior volume and extending through the shaft, wherein the conductive element is coupled to the RF electrode; and an RF gasket; wherein the conductive element includes features that engage the RF gasket to return the RF current to ground.
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