AMORPHOUS CARBON FOR GAP FILL
    1.
    发明申请

    公开(公告)号:US20220076945A1

    公开(公告)日:2022-03-10

    申请号:US17014039

    申请日:2020-09-08

    Abstract: Methods for depositing an amorphous carbon layer on a substrate and for filling a substrate feature with an amorphous carbon gap fill are described. The method comprises performing a deposition cycle comprising: introducing a hydrocarbon source into a processing chamber; introducing a plasma initiating gas into the processing chamber; generating a plasma in the processing chamber at a temperature of greater than 600° C.; forming an amorphous carbon layer on a substrate with a deposition rate of greater than 200 nm/hr; and purging the processing chamber.

    AMORPHOUS CARBON FOR GAP FILL
    2.
    发明公开

    公开(公告)号:US20240363332A1

    公开(公告)日:2024-10-31

    申请号:US18768570

    申请日:2024-07-10

    Abstract: Methods for depositing an amorphous carbon layer on a substrate and for filling a substrate feature with an amorphous carbon gap fill are described. The method comprises performing a deposition cycle comprising: introducing a hydrocarbon source into a processing chamber; introducing a plasma initiating gas into the processing chamber; generating a plasma in the processing chamber at a temperature of greater than 600° C.; forming an amorphous carbon layer on a substrate with a deposition rate of greater than 200 nm/hr; and purging the processing chamber.

    Amorphous carbon for gap fill
    3.
    发明授权

    公开(公告)号:US12062536B2

    公开(公告)日:2024-08-13

    申请号:US17014039

    申请日:2020-09-08

    Abstract: Methods for depositing an amorphous carbon layer on a substrate and for filling a substrate feature with an amorphous carbon gap fill are described. The method comprises performing a deposition cycle comprising: introducing a hydrocarbon source into a processing chamber; introducing a plasma initiating gas into the processing chamber; generating a plasma in the processing chamber at a temperature of greater than 600° C.; forming an amorphous carbon layer on a substrate with a deposition rate of greater than 200 nm/hr; and purging the processing chamber.

Patent Agency Ranking