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公开(公告)号:US09831074B2
公开(公告)日:2017-11-28
申请号:US14062627
申请日:2013-10-24
Applicant: Applied Materials, Inc.
Inventor: Joung Joo Lee , Guojun Liu , Wei W. Wang , Prashanth Kothnur
CPC classification number: H01J37/3447 , C23C14/042 , C23C14/22 , C23C14/3471 , H01J37/3426
Abstract: The present invention provides an apparatus including a bipolar collimator disposed in a physical vapor deposition chamber and methods of using the same. In one embodiment, an apparatus includes a chamber body and a chamber lid disposed on the chamber body defining a processing region therein, a collimator disposed in the processing region, and a power source coupled to the collimator.
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公开(公告)号:US09953813B2
公开(公告)日:2018-04-24
申请号:US14707825
申请日:2015-05-08
Applicant: APPLIED MATERIALS, INC.
Inventor: Xianmin Tang , Joung Joo Lee , Guojun Liu
CPC classification number: H01J37/3447 , C23C14/35 , H01J37/3405 , H01J37/345 , H01J37/3452 , H01J2237/3322 , H01L21/02104
Abstract: Methods and apparatus for improved metal ion filtering are provided herein. In some embodiments, a substrate processing apparatus includes: a chamber body and a chamber lid disposed on the chamber body defining a processing region within the chamber body beneath the lid; a collimator disposed in the processing region; a power source coupled to the collimator; and a first set of magnets disposed around the chamber body above the collimator and a second set of magnets disposed around the chamber body and below the collimator that together create a guidance magnetic field that is substantially orthogonal to the collimator.
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3.
公开(公告)号:US09466524B2
公开(公告)日:2016-10-11
申请号:US13742596
申请日:2013-01-16
Applicant: Applied Materials, Inc.
Inventor: Paul F. Ma , Guojun Liu , Annamalai Lakshmanan , Dien-Yeh Wu , Anantha K. Subramani
IPC: H01L21/44 , H01L21/768 , C23C16/34 , C23C16/455 , H01L21/285
CPC classification number: H01L21/76838 , C23C16/34 , C23C16/45542 , H01L21/28562 , H01L21/76841 , H01L21/76862
Abstract: Methods for depositing metal layers, and more specifically TaN layers, using CVD and ALD techniques are provided. In one or more embodiments, the method includes sequentially exposing a substrate to a metal precursor, or more specifically a tantalum precursor, followed by a high frequency plasma.
Abstract translation: 提供了使用CVD和ALD技术沉积金属层,更具体地TaN层的方法。 在一个或多个实施例中,该方法包括将衬底顺序地暴露于金属前体,或更具体地钽前体,接着是高频等离子体。
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