公开(公告)号：US20190317021A1

公开(公告)日：2019-10-17

申请号：US16258392

申请日：2019-01-25

Applicant: Applied Materials, Inc.

Inventor： Avishek GHOSH ,  Byung-Sung KWAK ,  Todd EGAN ,  Robert Jan VISSER

IPC: G01N21/64 ,  H01L51/52

Abstract: An apparatus for determining a characteristic of a photoluminescent (PL) layer comprises: a light source that generates an excitation light that includes light from the visible or near-visible spectrum; an optical assembly configured to direct the excitation light onto a PL layer; a detector that is configured to receive a PL emission generated by the PL layer in response to the excitation light interacting with the PL layer and generate a signal based on the PL emission; and a computing device coupled to the detector and configured to receive the signal from the detector and determine a characteristic of the PL layer based on the signal.

公开(公告)号：US20220099546A1

公开(公告)日：2022-03-31

申请号：US17033521

申请日：2020-09-25

Applicant: Applied Materials, Inc.

Inventor： Mehdi VAEZ-IRAVANI ,  Avishek GHOSH

IPC: G01N15/02

Abstract: Examples disclosed herein relate to system and method for detecting the size of a particle in a fluid. The system includes a conduit for transporting a fluid and a sample area. Some of the fluid passes through the sample area. A first imaging device has an optical lens and a digital detector. A laser source emits a first laser beam. The digital detector generates a metric of an initial intensity of a scattered light that passes through the optical lens. The scattered light is scattered from particles passing through the sample area, and includes light from the first laser beam, which passes through the sample area. A controller outputs a corrected particle intensity based upon a comparison of the initial intensity to data representative of intensity of a focused and defocused particle. The corrected particle intensity generates a corrected metric corresponding to an actual size of the particles.

公开(公告)号：US20210208077A1

公开(公告)日：2021-07-08

申请号：US17188485

申请日：2021-03-01

Applicant: Applied Materials, Inc.

Inventor： Avishek GHOSH ,  Byung-Sung KWAK ,  Todd EGAN ,  Robert Jan VISSER ,  Gangadhar BANAPPANAVAR ,  Dinesh KABRA

IPC: G01N21/64 ,  H01L51/52

Abstract: An apparatus for determining a characteristic of a photoluminescent (PL) layer comprises: a light source that generates an excitation light that includes light from the visible or near-visible spectrum; an optical assembly configured to direct the excitation light onto a PL layer; a detector that is configured to receive a PL emission generated by the PL layer in response to the excitation light interacting with the PL layer and generate a signal based on the PL emission; and a computing device coupled to the detector and configured to receive the signal from the detector and determine a characteristic of the PL layer based on the signal.

公开(公告)号：US20230266247A1

公开(公告)日：2023-08-24

申请号：US18129503

申请日：2023-03-31

Applicant: Applied Materials, Inc.

Inventor： Avishek GHOSH ,  Byung-Sung KWAK ,  Todd EGAN ,  Robert Jan VISSER ,  Gangadhar BANAPPANAVAR ,  Dinesh KABRA

IPC: G01N21/64 ,  H10K50/10

CPC classification number: G01N21/6489 ,  G01N21/6408 ,  H10K50/182

Abstract: An apparatus for determining a characteristic of a photoluminescent (PL) layer comprises: a light source that generates an excitation light that includes light from the visible or near-visible spectrum; an optical assembly configured to direct the excitation light onto a PL layer; a detector that is configured to receive a PL emission generated by the PL layer in response to the excitation light interacting with the PL layer and generate a signal based on the PL emission; and a computing device coupled to the detector and configured to receive the signal from the detector and determine a characteristic of the PL layer based on the signal.

公开(公告)号：US20190324297A1

公开(公告)日：2019-10-24

申请号：US16459405

申请日：2019-07-01

Applicant: Applied Materials, Inc.

Inventor： Robert Jan VISSER ,  Avishek GHOSH

IPC: G02F1/01 ,  G02F1/00 ,  G02B27/01 ,  G02B5/18

Abstract: Embodiments described herein relate to display devices, e.g., virtual and augmented reality displays and applications. In one embodiment, a planar substrate has stepwise features formed thereon and emitter structures formed on each of the features. An encapsulating layer is disposed on the substrate and a plurality of uniform dielectric nanostructures are formed on the encapsulating layer. Virtual images generated by the apparatus disclosed herein provide for improved image clarity by reducing chromatic aberrations at an image plane.

公开(公告)号：US20180348548A1

公开(公告)日：2018-12-06

申请号：US15992305

申请日：2018-05-30

Applicant: Applied Materials, Inc.

Inventor： Robert Jan VISSER ,  Avishek GHOSH

IPC: G02F1/01 ,  G02B27/01 ,  G02F1/00

CPC classification number: G02F1/0105 ,  G02B5/1809 ,  G02B27/0172 ,  G02B2027/0116 ,  G02B2027/0178 ,  G02B2027/0196 ,  G02F1/0009 ,  G06T19/006

Abstract: Embodiments described herein relate to display devices, e.g., virtual and augmented reality displays and applications. In one embodiment, a planar substrate has stepwise features formed thereon and emitter structures formed on each of the features. An encapsulating layer is disposed on the substrate and a plurality of uniform dielectric nanostructures are formed on the encapsulating layer. Virtual images generated by the apparatus disclosed herein provide for improved image clarity by reducing chromatic aberrations at an image plane.