公开(公告)号：US20110236704A1

公开(公告)日：2011-09-29

申请号：US13128721

申请日：2009-10-13

Applicant: Antoine Barbier ,  Odile Bezencenet ,  Daniel Bonamy

Inventor： Antoine Barbier ,  Odile Bezencenet ,  Daniel Bonamy

IPC: H01F10/00 ,  B05D3/00 ,  B32B9/00

CPC classification number: H01F41/32 ,  B82Y25/00 ,  B82Y40/00 ,  H01F10/002 ,  H01F41/14 ,  H01F41/302 ,  H01F41/303 ,  Y10T428/325

Abstract: A process for fabricating an antiferromagnetic layer includes depositing on a substrate a first layer with a sufficient thickness to establish a specific magnetic order from among one of the following orders, ferrimagnetic, ferromagnetic, paramagnetic, diamagnetic; after establishing the ferrimagnetic, ferromagnetic, paramagnetic or diamagnetic order, applying a magnetic field with sufficient amplitude and duration to shift walls of the magnetic domains of the first layer from a first statistical distribution to a second statistical distribution, the second statistical distribution presenting a minimum magnetic domain size strictly greater than the minimum magnetic domain size of the first statistical distribution and; for a given area, magnetic domains in which the perimeter is greater than that of domains from the first statistical distribution; and depositing on the first layer whose magnetic domain walls have been shifted, a second layer of an antiferromagnetic material in which at least one of the components of material of the first layer may be integrated by diffusion during growth.

Abstract translation: 制造反铁磁性层的方法包括在基底上沉积足够厚度的第一层，以从以下顺序之一建立特定磁性顺序，亚铁磁性，铁磁性，顺磁性，抗磁性; 在建立铁磁性，铁磁性，顺磁性或抗磁性顺序之后，施加足够的幅度和持续时间的磁场将第一层的磁畴的壁从第一统计分布转移到第二统计分布，第二统计分布呈现最小值 磁畴尺寸严格大于最小磁畴尺寸的第一次统计分布; 对于给定区域，其周长大于来自第一统计分布的域的磁畴; 并且沉积在其磁畴壁已经移动的第一层上，第二层反铁磁性材料，其中第一层的材料的至少一种成分可通过生长期间的扩散而被整合。

公开(公告)号：US20070213942A1

公开(公告)日：2007-09-13

申请号：US11311280

申请日：2005-12-20

Applicant: Laurent Ponson ,  Elisabeth Bouchaud ,  Daniel Bonamy

Inventor： Laurent Ponson ,  Elisabeth Bouchaud ,  Daniel Bonamy

IPC: G01M19/00 ,  G01B21/30 ,  G01B21/20

CPC classification number: G01N3/068 ,  G01N2203/0066 ,  G01N2203/0218 ,  G06K9/4604

Abstract: The present invention relates to a method and to a system for determining, in a solid structure that has failed along at least one fracture surface, the propagation path of at least one crack at the origin of said or each fracture surface. The method according to the invention comprises a step a) for the acquisition of topographical data for said or each surface either in a case (i) by extraction of height profiles along a plurality of directions or in a case (ii) by acquisition of a height contour map, and with a resolution for which said structure is heterogeneous and rough, which method includes, after this step a), an analysis of the statistical roughness properties of the or each surface that displays an anisotropy of these properties along said plurality of directions, in order to deduce from this anisotropy at least one propagation direction X of the or each crack that defines all or part of said path.

Abstract translation: 本发明涉及一种用于确定沿着至少一个断裂表面失效的固体结构中的所述或每个断裂表面的原点处的至少一个裂纹的传播路径的方法和系统。 根据本发明的方法包括以下步骤：a）用于在所述或每个表面中获取地形数据，或者在（i）通过沿着多个方向提取高度分布或者通过获取一个 高度轮廓图，并且具有所述结构是异质和粗糙的分辨率，该方法包括在该步骤a）之后，对沿着所述多个图形显示这些属性的各向异性的每个表面的统计粗糙度特性的分析 方向，以便从该各向异性推断出限定所述或所述路径的全部或部分的每个裂纹的至少一​​个传播方向X.