5T high density nvDRAM cell
    1.
    发明授权
    5T high density nvDRAM cell 失效
    5T高密度nvDRAM电池

    公开(公告)号:US08488379B2

    公开(公告)日:2013-07-16

    申请号:US13270995

    申请日:2011-10-11

    CPC classification number: G11C14/0018

    Abstract: A memory circuit includes a high voltage region providing storage of a nonvolatile bit, and a low voltage region providing at least partial storage of a volatile bit. The high and low voltage regions are isolated from one another and formed by a plurality of transistors in series between a current source and a bit line.

    Abstract translation: 存储电路包括提供非易失性位的存储的高电压区域和提供至少部分存储易失性位的低电压区域。 高电压区域和低电压区域彼此隔离并且由在电流源和位线之间串联的多个晶体管形成。

    Read and volatile NV standby disturb
    2.
    发明申请
    Read and volatile NV standby disturb 有权
    读取和挥发NV备用打扰

    公开(公告)号:US20090168517A1

    公开(公告)日:2009-07-02

    申请号:US12006225

    申请日:2007-12-31

    CPC classification number: G11C16/0466

    Abstract: A method of operating a nonvolatile memory circuit having a plurality of transistors arranged in series between a voltage/current source node and recall sink node includes asserting a gate bias on an isolation transistor between the source node and a charge storage transistor during nonvolatile STANDBY.

    Abstract translation: 一种操作具有串联布置在电压/电流源节点和调用汇聚节点之间的多个晶体管的非易失性存储器电路的方法包括在非易失性STANDBY期间在源节点和电荷存储晶体管之间的隔离晶体管上确定栅极偏置。

    5T HIGH DENSITY NVDRAM CELL
    4.
    发明申请
    5T HIGH DENSITY NVDRAM CELL 失效
    5T高密度NVDRAM单元

    公开(公告)号:US20120113718A1

    公开(公告)日:2012-05-10

    申请号:US13270995

    申请日:2011-10-11

    CPC classification number: G11C14/0018

    Abstract: A memory circuit includes a high voltage region providing storage of a nonvolatile bit, and a low voltage region providing at least partial storage of a volatile bit. The high and low voltage regions are isolated from one another and formed by a plurality of transistors in series between a current source and a bit line.

    Abstract translation: 存储电路包括提供非易失性位的存储的高电压区域和提供至少部分存储易失性位的低电压区域。 高电压区域和低电压区域彼此隔离并且由在电流源和位线之间串联的多个晶体管形成。

    Combined volatile nonvolatile array
    8.
    发明授权
    Combined volatile nonvolatile array 有权
    组合易失性非易失性阵列

    公开(公告)号:US07675775B2

    公开(公告)日:2010-03-09

    申请号:US11999684

    申请日:2007-12-05

    CPC classification number: G11C14/0018 G11C14/0063

    Abstract: A memory circuit includes volatile memory cells coupled to bit lines, and nonvolatile memory cells coupled to the volatile memory cells via the bit lines but not via complement bit lines.

    Abstract translation: 存储器电路包括耦合到位线的易失性存储器单元,以及经由位线而非经由补码位线耦合到易失性存储器单元的非易失性存储单元。

    5T high density NVDRAM cell
    10.
    发明授权
    5T high density NVDRAM cell 失效
    5T高密度NVDRAM单元

    公开(公告)号:US08036032B2

    公开(公告)日:2011-10-11

    申请号:US12006270

    申请日:2007-12-31

    CPC classification number: G11C14/0018

    Abstract: A memory circuit includes a high voltage region providing storage of a nonvolatile bit, and a low voltage region providing at least partial storage of a volatile bit. The high and low voltage regions are isolated from one another and formed by a plurality of transistors in series between a current source and a bit line.

    Abstract translation: 存储电路包括提供非易失性位的存储的高电压区域和提供至少部分存储易失性位的低电压区域。 高电压区域和低电压区域彼此隔离并且由在电流源和位线之间串联的多个晶体管形成。

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