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Patent Agency Ranking
公开(公告)号：US10217011B2
公开(公告)日：2019-02-26
申请号：US15424700
申请日：2017-02-03
Applicant: Agilent Technologies, Inc.
Inventor： Richard K. Workman , Victor Lim , Varun Raghunathan
Abstract: The present invention includes an apparatus and method that facilitates the manual sorting of slides into slide folders. The apparatus includes a horizontal display surface and a controller configured to receive slides and folders into which the slides are to be placed (or sorted). The controller operates components of the apparatus to selectively illuminate the display surface to guide a user in placing folders at multiple folder locations and in sorting the slides into the folders. In one aspect of the invention, the apparatus is configured to allow multiple folders to be stacked at a folder location during the slide sorting process. In these aspects, the apparatus is configured to determine number of folders stacked at each folder location.
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公开(公告)号：US20190195748A1
公开(公告)日：2019-06-27
申请号：US16169809
申请日：2018-10-24
Applicant: Agilent Technologies, Inc.
Inventor： Victor Lim , Richard K. Workman , Nicholas M. Sampas
CPC classification number: G01N1/06 , G01N1/2813 , G01N1/312 , G01N2001/2833
Abstract: This invention relates to apparatus and methods for transferring a tissue section to a slide. The invention also relates to automated systems and methods for transferring a tissue section onto a slide using a bath at ambient temperature and for smoothly mounting a tissue section on a slide.
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公开(公告)号：US08769710B2
公开(公告)日：2014-07-01
申请号：US13675251
申请日：2012-11-13
Applicant: Agilent Technologies, Inc.
Inventor： Christopher Ryan Moon , Richard K. Workman
CPC classification number: G01Q10/065 , G01Q10/00 , G01Q10/04 , G01Q10/045 , G01Q20/00 , G01Q20/02 , G01Q60/24
Abstract: An atomic force microscope (AFM) system comprises a cantilever arm attached to a probe tip. The system controls a height of the cantilever arm to press the probe tip against a sample and then separate the probe tip from the sample, to detect a disturbance of the cantilever arm after the separation of the probe tip from the surface, and to engage active damping of the cantilever arm to suppress the disturbance.
Abstract translation: 原子力显微镜（AFM）系统包括连接到探针尖端的悬臂。 该系统控制悬臂的高度，以将探针尖端压靠在样品上，然后将探针尖端与样品分开，以在探针尖端与表面分离之后检测悬臂的干扰，并且使活动 悬臂的阻尼来抑制扰动。
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公开(公告)号：US20170301105A1
公开(公告)日：2017-10-19
申请号：US15424700
申请日：2017-02-03
Applicant: Agilent Technologies, Inc.
Inventor： Richard K. Workman , Victor Lim , Varun Raghunathan
CPC classification number: G06K9/183 , G02B21/365 , H04N5/247
Abstract: The present invention includes an apparatus and method that facilitates the manual sorting of slides into slide folders. The apparatus includes a horizontal display surface and a controller configured to receive slides and folders into which the slides are to be placed (or sorted). The controller operates components of the apparatus to selectively illuminate the display surface to guide a user in placing folders at multiple folder locations and in sorting the slides into the folders. In one aspect of the invention, the apparatus is configured to allow multiple folders to be stacked at a folder location during the slide sorting process. In these aspects, the apparatus is configured to determine number of folders stacked at each folder location.
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公开(公告)号：US20140137300A1
公开(公告)日：2014-05-15
申请号：US13675251
申请日：2012-11-13
Applicant: AGILENT TECHNOLOGIES, INC.
Inventor： Christopher Ryan Moon , Richard K. Workman
IPC: G01Q10/00
CPC classification number: G01Q10/065 , G01Q10/00 , G01Q10/04 , G01Q10/045 , G01Q20/00 , G01Q20/02 , G01Q60/24
Abstract: An atomic force microscope (AFM) system comprises a cantilever arm attached to a probe tip. The system controls a height of the cantilever arm to press the probe tip against a sample and then separate the probe tip from the sample, to detect a disturbance of the cantilever arm after the separation of the probe tip from the surface, and to engage active damping of the cantilever arm to suppress the disturbance.
Abstract translation: 原子力显微镜（AFM）系统包括连接到探针尖端的悬臂。 该系统控制悬臂的高度，以将探针尖端压靠在样品上，然后将探针尖端与样品分开，以在探针尖端与表面分离之后检测悬臂的干扰，并且使活动 悬臂的阻尼来抑制扰动。
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