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    Evaluation method of probe mark of probe needle of probe card
    1.
    发明申请
    Evaluation method of probe mark of probe needle of probe card 失效
    探针卡探针探针标记评估方法

    公开(公告)号：US20070170937A1

    公开(公告)日：2007-07-26

    申请号：US11408158

    申请日：2006-04-21

    Applicant: Yoshihiko Endou ,  Yoshikazu Arisaka ,  Tatsuya Miyazaki

    Inventor： Yoshihiko Endou ,  Yoshikazu Arisaka ,  Tatsuya Miyazaki

    IPC: G01R31/02

    CPC classification number: G01R31/2891

    Abstract: An evaluation method of a probe mark of a probe needle of a probe card, includes the steps of: forming the probe mark of the probe needle on a probe mark evaluation wafer; recognizing the probe mark with imaging; and overlapping an imaginary electrode pad with the probe mark recognized by imaging so that the probe mark is evaluated.

    Abstract translation: 探针卡的探针的探针的评价方法包括以下步骤：在探针标记评价用晶片上形成探针的探针标记; 用成像识别探针标记; 并且与通过成像识别的探针标记重叠虚拟电极焊盘，以便评估探针标记。

    Self-testing circuit in semiconductor memory device
    2.
    发明授权
    Self-testing circuit in semiconductor memory device 有权
    半导体存储器件中的自检电路

    公开(公告)号：US07171592B2

    公开(公告)日：2007-01-30

    申请号：US10360862

    申请日：2003-02-10

    Applicant: Kenji Togashi ,  Morihiko Hamada ,  Shigekazu Aoki ,  Katsumi Shigenobu ,  Yukio Saka ,  Yoshikazu Arisaka ,  Toyoji Sawada ,  Tadashi Asai

    Inventor： Kenji Togashi ,  Morihiko Hamada ,  Shigekazu Aoki ,  Katsumi Shigenobu ,  Yukio Saka ,  Yoshikazu Arisaka ,  Toyoji Sawada ,  Tadashi Asai

    IPC: G06F11/00

    CPC classification number: G11C29/4401 ,  G11C29/789 ,  G11C29/848

    Abstract: A semiconductor memory device includes a self-testing circuit and a self-redundancy circuit with simple structures. The self-testing circuit includes a comparison circuit which compares write data with read data with respect to normal memory blocks and redundant memory blocks, and a decision circuit which decides if the semiconductor memory device is good or defective based on the plurality of comparison result signals. A signal transfer and holding circuit is connected between the comparison circuit and the decision circuit to transfer the plurality of comparison result signals to the decision circuit and to supply the plurality of comparison result signals to the self-redundancy circuit as a test result.

    Abstract translation: 半导体存储器件包括具有简单结构的自检电路和自冗余电路。 自检电路包括比较电路，其将写入数据与读取数据相对于正常存储器块和冗余存储器块进行比较，以及判定电路，其基于多个比较结果信号来判定半导体存储器件是否良好或有缺陷 。 信号传送和保持电路连接在比较电路和判定电路之间，以将多个比较结果信号传送到判定电路，并将多个比较结果信号提供给自冗余电路作为测试结果。

    Testing device and testing method of a semiconductor device
    3.
    发明申请
    Testing device and testing method of a semiconductor device 有权

    公开(公告)号：US20060220667A1

    公开(公告)日：2006-10-05

    申请号：US11211094

    申请日：2005-08-25

    Applicant: Kazuhiro Tashiro ,  Yasuyuki Itou ,  Shigeyuki Maruyama ,  Yoshikazu Arisaka

    Inventor： Kazuhiro Tashiro ,  Yasuyuki Itou ,  Shigeyuki Maruyama ,  Yoshikazu Arisaka

    IPC: G01R31/02

    CPC classification number: G01R31/2887

    Abstract: A testing device can perform a test on an arbitrary one of a plurality of semiconductor devices by pressing the semiconductor devices onto a contactor from a back side of the semiconductor device. A test circuit board has a contactor provided with contact pieces corresponding to external connection terminals of semiconductor devices to be tested. A support board is capable of mounting the semiconductor devices thereon in an aligned state. A stage supports the support board. A press head presses the semiconductor devices to be tested mounted on the support board so as to cause external connection terminals of the semiconductor devices to be tested to contact with the contact pieces of the contactor. The stage is movable to a position at which at least one of the semiconductor devices to be tested, which are mounted on the support board, faces the contactor.

    Contactor for electronic parts and a contact method
    5.
    发明授权
    Contactor for electronic parts and a contact method 有权
    电子零件接触器和接触方式

    公开(公告)号：US07471096B2

    公开(公告)日：2008-12-30

    申请号：US11339836

    申请日：2006-01-26

    Applicant: Naohito Kohashi ,  Shigeyuki Maruyama ,  Yoshikazu Arisaka ,  Hiroyuki Murotani ,  Katsuhiko Ono

    Inventor： Naohito Kohashi ,  Shigeyuki Maruyama ,  Yoshikazu Arisaka ,  Hiroyuki Murotani ,  Katsuhiko Ono

    IPC: G01R31/02

    CPC classification number: G01R1/0466 ,  G01R1/0483

    Abstract: A contactor for electronic parts can provide an appropriate and uniform contact with respect to a plurality of electrode terminals in an electronic part such as an IC. Each of a plurality of contact members has a first contact portion on one end thereof and a second contact portion on the other end thereof, the first contract portion having a recessed portion that receives one of the electrode terminals of the electronic part. A base accommodates and supports the plurality of the contact members. The first contact portion is movable in a horizontal direction.

    Abstract translation: 用于电子部件的接触器可以提供相对于诸如IC的电子部件中的多个电极端子的适当且均匀的接触。 多个接触构件中的每一个在其一端具有第一接触部分和另一端的第二接触部分，第一接合部分具有容纳电子部件的电极端子之一的凹部。 基座容纳并支撑多个接触构件。 第一接触部分可沿水平方向移动。

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