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    Apparatus and methods for controlling electron microscope stages
    1.
    发明授权
    Apparatus and methods for controlling electron microscope stages 有权
    用于控制电子显微镜阶段的装置和方法

    公开(公告)号：US09103769B2

    公开(公告)日：2015-08-11

    申请号：US12968024

    申请日：2010-12-14

    申请人： Thomas Duden

    发明人： Thomas Duden

    IPC分类号： G01N23/205 ,  H01J37/20 ,  G01N23/203

    CPC分类号： G01N23/205 ,  G01N23/203 ,  H01J37/20 ,  H01J2237/20285

    摘要： Methods and apparatus for generating an image of a specimen with a microscope (e.g., TEM) are disclosed. In one aspect, the microscope may generally include a beam generator, a stage, a detector, and an image generator. A plurality of crystal parameters, which describe a plurality of properties of a crystal sample, are received. In a display associated with the microscope, an interactive control sphere based at least in part on the received crystal parameters and that is rotatable by a user to different sphere orientations is presented. The sphere includes a plurality of stage coordinates that correspond to a plurality of positions of the stage and a plurality of crystallographic pole coordinates that correspond to a plurality of polar orientations of the crystal sample. Movement of the sphere causes movement of the stage, wherein the stage coordinates move in conjunction with the crystallographic coordinates represented by pole positions so as to show a relationship between stage positions and the pole positions.

    摘要翻译： 公开了用显微镜（例如TEM）产生样本的图像的方法和装置。 在一个方面，显微镜通常可以包括光束发生器，台，检测器和图像发生器。 接收描述晶体样品的多个性质的多个晶体参数。 在与显微镜相关联的显示器中，呈现出至少部分地基于所接收的晶体参数并且可由用户旋转到不同球体取向的交互式控制球。 球包括对应于舞台的多个位置的多个舞台坐标以及对应于晶体样本的多个极性取向的多个结晶极坐标。 球的运动导致舞台的移动，其中舞台坐标与由杆位置表示的结构坐标相结合，以便显示舞台位置与杆位置之间的关系。

    APPARATUS AND METHODS FOR CONTROLLING ELECTRON MICROSCOPE STAGES
    3.
    发明申请
    APPARATUS AND METHODS FOR CONTROLLING ELECTRON MICROSCOPE STAGES 有权
    用于控制电子显微镜阶段的装置和方法

    公开(公告)号：US20110174972A1

    公开(公告)日：2011-07-21

    申请号：US12968024

    申请日：2010-12-14

    申请人： Thomas Duden

    发明人： Thomas Duden

    IPC分类号： G01N23/20 ,  G01N23/00

    CPC分类号： G01N23/205 ,  G01N23/203 ,  H01J37/20 ,  H01J2237/20285

    摘要： Methods and apparatus for generating an image of a specimen with a microscope (e.g., TEM) are disclosed. In one aspect, the microscope may generally include a beam generator, a stage, a detector, and an image generator. A plurality of crystal parameters, which describe a plurality of properties of a crystal sample, are received. In a display associated with the microscope, an interactive control sphere based at least in part on the received crystal parameters and that is rotatable by a user to different sphere orientations is presented. The sphere includes a plurality of stage coordinates that correspond to a plurality of positions of the stage and a plurality of crystallographic pole coordinates that correspond to a plurality of polar orientations of the crystal sample. Movement of the sphere causes movement of the stage, wherein the stage coordinates move in conjunction with the crystallographic coordinates represented by pole positions so as to show a relationship between stage positions and the pole positions.

    摘要翻译： 公开了用显微镜（例如TEM）产生样本的图像的方法和装置。 在一个方面，显微镜通常可以包括光束发生器，台，检测器和图像发生器。 接收描述晶体样品的多个性质的多个晶体参数。 在与显微镜相关联的显示器中，呈现出至少部分地基于所接收的晶体参数并且可由用户旋转到不同球体取向的交互式控制球。 球包括对应于舞台的多个位置的多个舞台坐标以及对应于晶体样本的多个极性取向的多个结晶极坐标。 球的运动导致舞台的移动，其中舞台坐标与由杆位置表示的结构坐标相结合，以便显示舞台位置与杆位置之间的关系。

    CAPACITANCE DISPLACEMENT AND ROTATION SENSOR
    5.
    发明申请
    CAPACITANCE DISPLACEMENT AND ROTATION SENSOR 有权
    电容位移和旋转传感器

    公开(公告)号：US20110175629A1

    公开(公告)日：2011-07-21

    申请号：US13002762

    申请日：2009-07-28

    申请人： Thomas Duden

    发明人： Thomas Duden

    IPC分类号： G01R27/26

    CPC分类号： H01J37/20 ,  G01B7/003 ,  G01B7/30 ,  G02B6/359 ,  G02B21/26 ,  G11B5/5521 ,  G11B5/596 ,  G11B7/0925 ,  H01J37/244 ,  H01J37/26 ,  H01J2237/20292

    摘要： A position measuring sensor formed from opposing sets of capacitor plates measures both rotational displacement and lateral displacement from the changes in capacitances as overlapping areas of capacitors change. Capacitances are measured by a measuring circuit. The measured capacitances are provided to a calculating circuit that performs calculations to obtain angular and lateral displacement from the capacitances measured by the measuring circuit.

    摘要翻译： 由相反的电容器板组形成的位置测量传感器，随着电容重叠区域的变化，测量电容变化时的旋转位移和横向位移。 电容由测量电路测量。 将测量的电容提供给计算电路，其执行计算以从由测量电路测量的电容获得角度和横向位移。

    Lateral displacement and rotational displacement sensor
    7.
    发明授权
    Lateral displacement and rotational displacement sensor 有权
    侧向位移和旋转位移传感器

    公开(公告)号：US08704536B2

    公开(公告)日：2014-04-22

    申请号：US13002762

    申请日：2009-07-28

    申请人： Thomas Duden

    发明人： Thomas Duden

    IPC分类号： G01R27/26

    CPC分类号： H01J37/20 ,  G01B7/003 ,  G01B7/30 ,  G02B6/359 ,  G02B21/26 ,  G11B5/5521 ,  G11B5/596 ,  G11B7/0925 ,  H01J37/244 ,  H01J37/26 ,  H01J2237/20292

    摘要： A position measuring sensor formed from opposing sets of capacitor plates measures both rotational displacement and lateral displacement from the changes in capacitances as overlapping areas of capacitors change. Capacitances are measured by a measuring circuit. The measured capacitances are provided to a calculating circuit that performs calculations to obtain angular and lateral displacement from the capacitances measured by the measuring circuit.

    摘要翻译： 由相反的电容器板组形成的位置测量传感器，随着电容重叠区域的变化，测量电容变化时的旋转位移和横向位移。 电容由测量电路测量。 将测量的电容提供给计算电路，其执行计算以从由测量电路测量的电容获得角度和横向位移。