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公开(公告)号：US08961907B2
公开(公告)日：2015-02-24
申请号：US13387076
申请日：2010-07-22
申请人： Stephen John Sowerby
发明人： Stephen John Sowerby
CPC分类号： G01N21/03 , B01L3/5088 , B01L2200/0668 , B01L2300/0832 , B01L2300/0851 , G01N15/1484 , G01N21/0303 , G01N2021/035
摘要： The invention relates to apparatus for the detection of particles and for particle analysis. The apparatus comprises a sample holder comprising a base and a projection extending from the base. The base includes a contact region where, in use, the surface of a fluid sample may contact the projection. The surface of at least the contact region of the projection exhibits properties that allow the surface of the contact region to be substantially wetted by a fluid sample when the apparatus is in use so that the fluid sample forms a meniscus having its apex in contact with the contact region of the projection. The invention also relates to methods for using the apparatus.
摘要翻译： 本发明涉及用于检测颗粒和颗粒分析的装置。 该装置包括样品架，其包括基部和从基部延伸的突起。 底座包括接触区域，其中在使用中，流体样品的表面可以接触突起。 突起的至少接触区域的表面表现出当使用装置时允许接触区域的表面基本上被流体样品润湿的性质，使得流体样品形成其顶点与 投影的接触区域。 本发明还涉及使用该装置的方法。
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2.发明授权公开(公告)号：US08247214B2
公开(公告)日：2012-08-21
申请号：US11721047
申请日：2005-07-13
CPC分类号： G01N15/1218 , B26D7/10 , B26D7/14 , B26F1/00 , B26F1/0084 , B26F1/24 , B26F1/31 , B26F3/02 , G01N15/1031 , G01N15/1245 , G01N2015/0038 , G01N2015/1062 , Y10T137/0391
摘要： A method is provided for detecting, measuring or controlling particles and/or electromagnetic radiation, comprising providing a deformable material containing a deformable aperture defining a path for particles or radiation, adjusting the deformable aperture to a prescribed geometry and/or size by deforming the deformable material to change at least one of the parameters of the path defined by the deformable aperture, and causing the particle or radiation to be detected, measured or controlled to enter the deformable aperture. The method includes the step of monitoring the geometry and/or size of the deformable aperture and controlling the adjustment of the size of the deformable aperture in response to such monitoring. The required apparatus is easily fabricated from inexpensive materials. Furthermore the deformable aperture can be tuned to the appropriate geometry post fabrication, and the ability to adjust the aperture geometry renders it capable of discriminating a plurality of differently sized particles.
摘要翻译： 提供了一种用于检测，测量或控制颗粒和/或电磁辐射的方法，包括提供包含限定用于颗粒或辐射的路径的可变形孔的可变形材料，通过使可变形的 材料以改变由可变形孔径限定的路径的至少一个参数，并且使得可以检测，测量或控制粒子或辐射进入可变形孔径。 该方法包括监测可变形孔径的几何形状和/或尺寸并响应于这种监测来控制可变形孔径尺寸的调节的步骤。 所需的装置容易由廉价的材料制成。 此外，可变形孔可以调整到制造后的适当几何形状，并且调整孔径几何形状的能力使得其能够区分多个不同尺寸的颗粒。
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3.发明申请公开(公告)号：US20130020200A1
公开(公告)日：2013-01-24
申请号：US13560134
申请日：2012-07-27
CPC分类号： G01N15/1218 , B26D7/10 , B26D7/14 , B26F1/00 , B26F1/0084 , B26F1/24 , B26F1/31 , B26F3/02 , G01N15/1031 , G01N15/1245 , G01N2015/0038 , G01N2015/1062 , Y10T137/0391
摘要： A method is provided for detecting, measuring or controlling particles and/or electromagnetic radiation, comprising providing a deformable material containing a deformable aperture defining a path for particles or radiation, adjusting the deformable aperture to a prescribed geometry and/or size by deforming the deformable material to change at least one of the parameters of the path defined by the deformable aperture, and causing the particle or radiation to be detected, measured or controlled to enter the deformable aperture. The method includes the step of monitoring the geometry and/or size of the deformable aperture and controlling the adjustment of the size of the deformable aperture in response to such monitoring. The required apparatus is easily fabricated from inexpensive materials. Furthermore the deformable aperture can be tuned to the appropriate geometry post fabrication, and the ability to adjust the aperture geometry renders it capable of discriminating a plurality of differently sized particles.
摘要翻译： 提供了一种用于检测，测量或控制颗粒和/或电磁辐射的方法，包括提供包含限定用于颗粒或辐射的路径的可变形孔的可变形材料，通过使可变形的 材料以改变由可变形孔径限定的路径的至少一个参数，并且使得可以检测，测量或控制粒子或辐射进入可变形孔径。 该方法包括监测可变形孔径的几何形状和/或尺寸并响应于这种监测来控制可变形孔径尺寸的调节的步骤。 所需的装置容易由廉价的材料制成。 此外，可变形孔可以调整到制造后的适当几何形状，并且调整孔径几何形状的能力使得其能够区分多个不同尺寸的颗粒。
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4.发明申请公开(公告)号：US20100021883A1
公开(公告)日：2010-01-28
申请号：US11721047
申请日：2005-07-13
CPC分类号： G01N15/1218 , B26D7/10 , B26D7/14 , B26F1/00 , B26F1/0084 , B26F1/24 , B26F1/31 , B26F3/02 , G01N15/1031 , G01N15/1245 , G01N2015/0038 , G01N2015/1062 , Y10T137/0391
摘要： A method is provided for detecting, measuring or controlling particles and/or electromagnetic radiation, comprising providing a deformable material containing a deformable aperture defining a path for particles or radiation, adjusting the deformable aperture to a prescribed geometry and/or size by deforming the deformable material to change at least one of the parameters of the path defined by the deformable aperture, and causing the particle or radiation to be detected, measured or controlled to enter the deformable aperture. The method includes the step of monitoring the geometry and/or size of the deformable aperture and controlling the adjustment of the size of the deformable aperture in response to such monitoring. The required apparatus is easily fabricated from inexpensive materials. Furthermore the deformable aperture can be tuned to the appropriate geometry post fabrication, and the ability to adjust the aperture geometry renders it capable of discriminating a plurality of differently sized particles.
摘要翻译： 提供了一种用于检测，测量或控制颗粒和/或电磁辐射的方法，包括提供包含限定用于颗粒或辐射的路径的可变形孔的可变形材料，通过使可变形的 材料，以改变由可变形孔径限定的路径的至少一个参数，并且使得检测，测量或控制粒子或辐射进入可变形孔径。 该方法包括监测可变形孔径的几何形状和/或尺寸并响应于这种监测来控制可变形孔径尺寸的调节的步骤。 所需的装置容易由廉价的材料制成。 此外，可变形孔可以调整到制造后的适当几何形状，并且调整孔径几何形状的能力使得其能够区分多个不同尺寸的颗粒。
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5.发明申请公开(公告)号：US20120135457A1
公开(公告)日：2012-05-31
申请号：US13387076
申请日：2010-07-22
申请人： Stephen John Sowerby
发明人： Stephen John Sowerby
CPC分类号： G01N21/03 , B01L3/5088 , B01L2200/0668 , B01L2300/0832 , B01L2300/0851 , G01N15/1484 , G01N21/0303 , G01N2021/035
摘要： The invention relates to apparatus for the detection of particles and for particle analysis. The apparatus comprises a sample holder comprising a base and a projection extending from the base. The base includes a contact region where, in use, the surface of a fluid sample may contact the projection. The surface of at least the contact region of the projection exhibits properties that allow the surface of the contact region to be substantially wetted by a fluid sample when the apparatus is in use so that the fluid sample forms a meniscus having its apex in contact with the contact region of the projection. The invention also relates to methods for using the apparatus.
摘要翻译： 本发明涉及用于检测颗粒和颗粒分析的装置。 该装置包括样品架，其包括基部和从基部延伸的突起。 底座包括接触区域，其中在使用中，流体样品的表面可以接触突起。 突起的至少接触区域的表面表现出当使用装置时允许接触区域的表面基本上被流体样品润湿的性质，使得流体样品形成其顶点与 投影的接触区域。 本发明还涉及使用该装置的方法。
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