公开(公告)号：US20130113508A1

公开(公告)日：2013-05-09

申请号：US13547094

申请日：2012-07-12

申请人： Shin-Cheng Chu ,  Ching-Tsung Chen ,  Teng-Hui Lee ,  Chia-Jen Kao

发明人： Shin-Cheng Chu ,  Ching-Tsung Chen ,  Teng-Hui Lee ,  Chia-Jen Kao

IPC分类号： G01R31/00

CPC分类号： G01R1/00 ,  G01R3/00 ,  G01R5/00 ,  G01R7/00 ,  G01R9/00 ,  G01R11/00 ,  G01R13/00 ,  G01R17/00 ,  G01R19/00 ,  G01R31/002 ,  G01R31/129 ,  G01R35/00

摘要： Electronic test system and associated method, including a first and a second connection terminals respectively coupled to two pins of a chip under test, a signal source terminal coupled to a signal generator, a first and a second measurement terminals coupled to a tester, a fifth switch, a seventh switch and a switch circuit which has a first and a fourth front terminals coupled to the signal source terminal, has a first and a fourth back terminals coupled to the first and second connection terminals, and controls conduction between the first front terminal and the first back terminal, as well as conduction between the fourth front terminal and the fourth back terminal. The fifth switch is coupled between the fourth back terminal and the first measurement terminal, and the seventh switch is coupled between the first connection terminal and the second measurement terminal.

摘要翻译： 电子测试系统和相关方法，包括分别耦合到被测芯片的两个引脚的第一和第二连接端子，耦合到信号发生器的信号源端子，耦合到测试器的第一和第二测量端子，第五 开关，第七开关和开关电路，其具有耦合到信号源端子的第一和第四前端，具有耦合到第一和第二连接端子的第一和第四后端子，并且控制第一前端子 和第一后端子，以及第四前端子和第四后端子之间的导通。 第五开关耦合在第四后端子和第一测量端子之间，第七开关耦合在第一连接端子和第二测量端子之间。

公开(公告)号：US08816708B2

公开(公告)日：2014-08-26

申请号：US13547094

申请日：2012-07-12

申请人： Shin-Cheng Chu ,  Ching-Tsung Chen ,  Teng-Hui Lee ,  Chia-Jen Kao

发明人： Shin-Cheng Chu ,  Ching-Tsung Chen ,  Teng-Hui Lee ,  Chia-Jen Kao

IPC分类号： G01R31/00 ,  G01R1/00 ,  G01R3/00 ,  G01R5/00 ,  G01R7/00 ,  G01R9/00 ,  G01R11/00 ,  G01R13/00 ,  G01R17/00 ,  G01R19/00 ,  G01R35/00

CPC分类号： G01R1/00 ,  G01R3/00 ,  G01R5/00 ,  G01R7/00 ,  G01R9/00 ,  G01R11/00 ,  G01R13/00 ,  G01R17/00 ,  G01R19/00 ,  G01R31/002 ,  G01R31/129 ,  G01R35/00

摘要： Electronic test system and associated method, including a first and a second connection terminals respectively coupled to two pins of a chip under test, a signal source terminal coupled to a signal generator, a first and a second measurement terminals coupled to a tester, a fifth switch, a seventh switch and a switch circuit which has a first and a fourth front terminals coupled to the signal source terminal, has a first and a fourth back terminals coupled to the first and second connection terminals, and controls conduction between the first front terminal and the first back terminal, as well as conduction between the fourth front terminal and the fourth back terminal. The fifth switch is coupled between the fourth back terminal and the first measurement terminal, and the seventh switch is coupled between the first connection terminal and the second measurement terminal.

摘要翻译： 电子测试系统和相关方法，包括分别耦合到被测芯片的两个引脚的第一和第二连接端子，耦合到信号发生器的信号源端子，耦合到测试器的第一和第二测量端子，第五 开关，第七开关和开关电路，其具有耦合到信号源端子的第一和第四前端，具有耦合到第一和第二连接端子的第一和第四后端子，并且控制第一前端子 和第一后端子，以及第四前端子和第四后端子之间的导通。 第五开关耦合在第四后端子和第一测量端子之间，第七开关耦合在第一连接端子和第二测量端子之间。