公开(公告)号：US07592591B2

公开(公告)日：2009-09-22

申请号：US11784686

申请日：2007-04-09

Applicant: Satoshi Notoya

Inventor： Satoshi Notoya

IPC: H01J37/26

CPC classification number: H01J37/256 ,  G01N23/22 ,  H01J2237/2442 ,  H01J2237/24425 ,  H01J2237/2445 ,  H01J2237/2485 ,  H01J2237/2561

Abstract: An electron probe X-ray analyzer capable of automatically setting appropriate analytical conditions if there are unknown compounds by performing analysis under the analytical conditions adapted for analysis points having different compositions in a case where the numerous analysis points having the plural compositions are analyzed by WDS (wavelength-dispersive X-ray spectrometer). At each analysis point, the analyzer performs quantitative analysis using EDS (energy-dispersive X-ray spectrometer) permitting easy and quick analysis. Based on the results, chemical compounds are identified. If the results indicate that there is any new compound, analytical conditions adapted for the new compound are selected. If the new compound is already registered in a database, the analytical conditions are read from the database. Then, quantitative analysis is performed using WDS.

Abstract translation: 一种电子探针X射线分析仪，其能够通过在具有多种组成的多个分析点的情况下通过对具有不同组成的分析点进行分析的分析条件进行分析来自动设定适当的分析条件， 波长色散X射线光谱仪）。 在每个分析点，分析仪使用EDS（能量色散X射线光谱仪）进行定量分析，可以方便快捷的分析。 根据结果​​，确定了化合物。 如果结果表明存在任何新化合物，则选择适合新化合物的分析条件。 如果新的化合物已经在数据库中注册，则从数据库中读取分析条件。 然后，使用WDS进行定量分析。

公开(公告)号：US6118123A

公开(公告)日：2000-09-12

申请号：US12022

申请日：1998-01-22

Applicant: Satoshi Notoya

Inventor： Satoshi Notoya

IPC: G01Q20/04 ,  G01Q30/02 ,  G01Q30/20 ,  H01J37/21 ,  H01J37/256

CPC classification number: H01J37/256 ,  H01J37/21

Abstract: There is disclosed an electron probe microanalyzer capable of achieving focusing after movement of a specimen in a shorter time than conventional, thus improving the total measuring efficiency. When movement into a specified analysis point on the specimen is completed, an automatic focusing device automatically performs a focusing operation consisting of scanning a relatively narrow range. If this operation is performed unsuccessfully, the automatic focusing device automatically performs a second focusing operation consisting of scanning a wider range. Thus, the instrument searches for a focal point.

Abstract translation: 公开了一种电子探针微量分析仪，其能够在比常规的更短的时间内在样品移动之后实现聚焦，从而提高总测量效率。 当移动到样本上的指定分析点时，自动聚焦装置自动执行由扫描较窄范围组成的聚焦操作。 如果该操作不成功，则自动聚焦装置自动执行由较宽范围的扫描组成的第二聚焦操作。 因此，仪器将搜索焦点。

公开(公告)号：US20080067379A1

公开(公告)日：2008-03-20

申请号：US11784686

申请日：2007-04-09

Applicant: Satoshi Notoya

Inventor： Satoshi Notoya

IPC: G21K7/00

CPC classification number: H01J37/256 ,  G01N23/22 ,  H01J2237/2442 ,  H01J2237/24425 ,  H01J2237/2445 ,  H01J2237/2485 ,  H01J2237/2561

Abstract: An electron probe X-ray analyzer capable of automatically setting appropriate analytical conditions if there are unknown compounds by performing analysis under the analytical conditions adapted for analysis points having different compositions in a case where the numerous analysis points having the plural compositions are analyzed by WDS (wavelength-dispersive X-ray spectrometer). At each analysis point, the analyzer performs quantitative analysis using EDS (energy-dispersive X-ray spectrometer) permitting easy and quick analysis. Based on the results, chemical compounds are identified. If the results indicate that there is any new compound, analytical conditions adapted for the new compound are selected. If the new compound is already registered in a database, the analytical conditions are read from the database. Then, quantitative analysis is performed using WDS.

Abstract translation: 一种电子探针X射线分析仪，其能够通过在具有多种组成的多个分析点的情况下通过对具有不同组成的分析点进行分析的分析条件进行分析来自动设定适当的分析条件， 波长色散X射线光谱仪）。 在每个分析点，分析仪使用EDS（能量色散X射线光谱仪）进行定量分析，可以方便快捷的分析。 根据结果​​，确定了化合物。 如果结果表明存在任何新化合物，则选择适合新化合物的分析条件。 如果新的化合物已经在数据库中注册，则从数据库中读取分析条件。 然后，使用WDS进行定量分析。