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    Method for accelerated lifetesting of large area OLED lighting panels
    1.
    发明授权
    Method for accelerated lifetesting of large area OLED lighting panels 有权
    大面积OLED照明面板加速生活方法

    公开(公告)号：US08664970B2

    公开(公告)日：2014-03-04

    申请号：US13047221

    申请日：2011-03-14

    申请人： Peter Levermore ,  Huiqing Pang ,  Lech Michalski ,  Mike Weaver

    发明人： Peter Levermore ,  Huiqing Pang ,  Lech Michalski ,  Mike Weaver

    IPC分类号： G01R31/26

    CPC分类号： H01L51/0031 ,  G09G3/006 ,  G09G3/3208 ,  G09G2320/029 ,  G09G2320/043 ,  H01L51/504

    摘要： A method for accelerated life testing of organic devices is provided. The lifetime of each of one or more individual organic emissive devices is measured at a non-heating current density. Based upon the measured lifetimes of the one or more devices, the device lifetime is determined for a selected luminance. An organic emissive panel is also obtained having a second organic stack that consists essentially of the one or more organic layers of the first organic stack. The junction temperature of the organic emissive panel is then determined at a heating current density. Based upon the junction temperature and the device lifetime of the one or more individual organic emissive devices, the expected lifetime of the organic emissive panel is then determined at the heating current density.

    摘要翻译： 提供了一种有机器件加速寿命测试方法。 在非加热电流密度下测量一个或多个单独的有机发射装置中的每一个的寿命。 基于所测量的一个或多个器件的寿命，针对所选择的亮度确定器件寿命。 还获得了具有基本上由第一有机叠层的一个或多个有机层组成的第二有机叠层的有机发光面板。 然后在加热电流密度下确定有机发射面板的结温。 基于一个或多个单个有机发射器件的结温和器件寿命，然后在加热电流密度下确定有机发射面板的预期寿命。

    Method for Accelerated Lifetesting of Large Area OLED Lighting Panels
    2.
    发明申请
    Method for Accelerated Lifetesting of Large Area OLED Lighting Panels 有权
    大面积OLED照明板加速生产方法

    公开(公告)号：US20120235701A1

    公开(公告)日：2012-09-20

    申请号：US13047221

    申请日：2011-03-14

    申请人： Peter Levermore ,  Huiqing Pang ,  Lech Michalski ,  Mike Weaver

    发明人： Peter Levermore ,  Huiqing Pang ,  Lech Michalski ,  Mike Weaver

    IPC分类号： G01R31/26

    CPC分类号： H01L51/0031 ,  G09G3/006 ,  G09G3/3208 ,  G09G2320/029 ,  G09G2320/043 ,  H01L51/504

    摘要： A method for accelerated life testing of organic devices, and in particular large area organic emissive devices, is provided. The first method comprises obtaining one or more individual organic emissive devices, each having a first organic stack comprising one or more organic layers. The lifetime of each of the one or more individual organic emissive devices is measured at one or more temperatures at a non-heating current density. Based upon the measured lifetimes at the non-heating current density of the one or more devices, the device lifetime is determined for a selected luminance. An organic emissive panel is also obtained having a second organic stack that consists essentially of the one or more organic layers of the first organic stack. The junction temperature of the organic emissive panel is then determined at a heating current density. Based upon the junction temperature and the device lifetime of the one or more individual organic emissive devices at the selected luminance, the expected lifetime of the organic emissive panel is then determined at the heating current density.

    摘要翻译： 提供了一种用于有机器件，特别是大面积有机发射器件的加速寿命测试的方法。 第一种方法包括获得一个或多个单独的有机发射器件，每个器件具有包含一个或多个有机层的第一有机堆叠。 在一个或多个温度下以非加热电流密度测量一个或多个单个有机发射器件中的每一个的寿命。 基于在一个或多个器件的非加热电流密度下的测量寿命，针对所选择的亮度确定器件寿命。 还获得了具有基本上由第一有机叠层的一个或多个有机层组成的第二有机叠层的有机发光面板。 然后在加热电流密度下确定有机发射面板的结温。 基于所选亮度下的一个或多个单个有机发射装置的结温和器件寿命，然后在加热电流密度下确定有机发射面板的预期寿命。