OPTICAL ARCHITECTURE
    2.
    发明申请
    OPTICAL ARCHITECTURE 审中-公开
    光学建筑

    公开(公告)号:US20090009995A1

    公开(公告)日:2009-01-08

    申请号:US11856004

    申请日:2007-09-14

    IPC分类号: F21V5/00 F21V9/08

    CPC分类号: G02B26/123 H04N9/3129

    摘要: An optical beam-shaping unit comprises a fly-eye lens for modifying light beams into modified light beams with desired profiles. The optical beam-shaping unit is especially useful in modifying collimated light from solid-state illuminators, such as laser sources.

    摘要翻译: 光束成形单元包括用于将光束修改成具有期望的轮廓的修改的光束的飞眼透镜。 光束整形单元特别适用于修正诸如激光源的固态照明器的准直光。

    Microelectromechanical devices with lubricants and getters formed thereon
    3.
    发明申请
    Microelectromechanical devices with lubricants and getters formed thereon 审中-公开
    具有形成在其上的润滑剂和吸气剂的微机电装置

    公开(公告)号:US20050212067A1

    公开(公告)日:2005-09-29

    申请号:US10810076

    申请日:2004-03-26

    摘要: The present invention provides a packaged microelectromechanical device having a plurality of deflectable elements formed on a substrate that has a getter and/or a lubricant disposed thereon. The substrate can be a glass substrate or a semiconductor wafer. The lubricant and/or getter can be disposed on the substrate or held by one or more containers that are attached to the substrate.

    摘要翻译: 本发明提供了一种封装的微机电装置,其具有形成在基板上的多个可偏转元件,所述可偏转元件具有设置在其上的吸气剂和/或润滑剂。 基板可以是玻璃基板或半导体晶片。 润滑剂和/或吸气剂可以设置在基底上或由附着于基底的一个或多个容器保持。

    Routing trace compensation
    4.
    发明授权
    Routing trace compensation 有权
    路由跟踪补偿

    公开(公告)号:US09329731B2

    公开(公告)日:2016-05-03

    申请号:US13612726

    申请日:2012-09-12

    IPC分类号: G06F3/044 G06F3/041

    摘要: A capacitive input device includes first and second pluralities of sensor electrodes disposed in a first region of a substrate. The first and second pluralities of sensor electrodes are substantially orthogonal to one another. The first region is configured to overlap a display screen. At least one routing trace is disposed in a second region of the substrate and is ohmically coupled to a sensor electrode of one of the first and second pluralities of sensor electrodes and also to a processing system. The second region comprises a non-display screen overlapping portion of the substrate. A compensation trace is disposed in the second region and ohmically coupled to the processing system. The compensation trace has substantially the same length as and is substantially parallel and proximate to the at least one routing trace. The compensation trace is not ohmically coupled to any sensor electrode located in the first region.

    摘要翻译: 电容性输入装置包括设置在基板的第一区域中的第一和第二多个传感器电极。 第一和第二多个传感器电极基本上彼此正交。 第一区域被配置为与显示屏幕重叠。 至少一个布线迹线设置在基板的第二区域中,并且被欧姆耦合到第一和第二多个传感器电极中的一个的传感器电极以及处理系统。 第二区域包括基板的非显示屏幕重叠部分。 补偿迹线设置在第二区域中并且欧姆耦合到处理系统。 所述补偿迹线具有与所述至少一个路线迹线基本上相同的长度并且基本上平行并且靠近所述至少一个路线迹线。 补偿迹线不与位于第一区域中的任何传感器电极欧姆耦合。

    ROUTING TRACE COMPENSATION
    5.
    发明申请
    ROUTING TRACE COMPENSATION 有权
    路线跟踪补偿

    公开(公告)号:US20140070875A1

    公开(公告)日:2014-03-13

    申请号:US13612726

    申请日:2012-09-12

    IPC分类号: H03K17/96

    摘要: A capacitive input device includes first and second pluralities of sensor electrodes disposed in a first region of a substrate. The first and second pluralities of sensor electrodes are substantially orthogonal to one another. The first region is configured to overlap a display screen. At least one routing trace is disposed in a second region of the substrate and is ohmically coupled to a sensor electrode of one of the first and second pluralities of sensor electrodes and also to a processing system. The second region comprises a non-display screen overlapping portion of the substrate. A compensation trace is disposed in the second region and ohmically coupled to the processing system. The compensation trace has substantially the same length as and is substantially parallel and proximate to the at least one routing trace. The compensation trace is not ohmically coupled to any sensor electrode located in the first region.

    摘要翻译: 电容性输入装置包括设置在基板的第一区域中的第一和第二多个传感器电极。 第一和第二多个传感器电极基本上彼此正交。 第一区域被配置为与显示屏幕重叠。 至少一个布线迹线设置在基板的第二区域中,并且被欧姆耦合到第一和第二多个传感器电极中的一个的传感器电极以及处理系统。 第二区域包括基板的非显示屏幕重叠部分。 补偿迹线设置在第二区域中并且欧姆耦合到处理系统。 所述补偿迹线具有与所述至少一个路线迹线基本上相同的长度并且基本上平行并且靠近所述至少一个路线迹线。 补偿迹线不与位于第一区域中的任何传感器电极欧姆耦合。

    Performance analyses of micromirror devices
    7.
    发明申请
    Performance analyses of micromirror devices 有权
    微镜器件的性能分析

    公开(公告)号:US20050286045A1

    公开(公告)日:2005-12-29

    申请号:US10875760

    申请日:2004-06-23

    IPC分类号: G01N21/55 G01N21/88 G01N21/95

    CPC分类号: G01N21/55 G01N21/95

    摘要: The invention provides a method and apparatus for evaluating the product quality and performances of micromirror array devices through measurements of the electromechanical responses of the individual micromirrors to the driving forces of electric fields. The electromechanical responses of the micromirrors according to the present invention are described in terms of the rotational angles associated with the operational states, such as the ON and OFF state angles of the ON and OFF state when the micromirror array device is operated in the binary-state mode, and the response speed (i.e. the time interval required for a micromirror device to transit form one state to another) of the individual micromirrors to the driving fields.

    摘要翻译: 本发明提供一种用于通过测量各个微镜对电场驱动力的机电响应来评估微镜阵列器件的产品质量和性能的方法和装置。 根据本发明的微反射镜的机电响应以与操作状态相关联的旋转角度进行描述,例如当微镜阵列器件在二进制编码器中操作时,ON和OFF状态的ON和OFF状态角, 状态模式以及各个微镜对驱动场的响应速度(即,微镜器件从一个状态转移到另一个状态所需的时间间隔)。

    Micromirrors with asymmetric stopping mechanisms
    8.
    发明授权
    Micromirrors with asymmetric stopping mechanisms 有权
    具有不对称停止机制的微镜

    公开(公告)号:US06876485B1

    公开(公告)日:2005-04-05

    申请号:US10703678

    申请日:2003-11-07

    申请人: Jim Dunphy

    发明人: Jim Dunphy

    IPC分类号: B81B3/00 G02B26/00 G02B26/08

    摘要: A micromirror device comprises a plurality of stopping mechanisms that sequentially stop the mirror plate of the micromirror device when the micromirror device is rotating towards a state, such as an ON or OFF state. The mirror plate sequentially separates from the stopping mechanisms when the mirror plate is rotating towards another state, such as the OFF or ON state.

    摘要翻译: 微反射镜装置包括多个停止机构,当微镜装置朝向诸如ON或OFF状态的状态转动时,顺序地停止微镜装置的镜板。 当镜板朝向另一状态(例如OFF或ON状态)旋转时,镜板依次与停止机构分离。

    Performance analyses of micromirror devices
    9.
    发明授权
    Performance analyses of micromirror devices 有权
    微镜器件的性能分析

    公开(公告)号:US07483126B2

    公开(公告)日:2009-01-27

    申请号:US10875760

    申请日:2004-06-23

    IPC分类号: G01N21/88 G02B26/00

    CPC分类号: G01N21/55 G01N21/95

    摘要: The invention provides a method and apparatus for evaluating the product quality and performances of micromirror array devices through measurements of the electromechanical responses of the individual micromirrors to the driving forces of electric fields. The electromechanical responses of the micromirrors according to the present invention are described in terms of the rotational angles associated with the operational states, such as the ON and OFF state angles of the ON and OFF state when the micromirror array device is operated in the binary-state mode, and the response speed (i.e. the time interval required for a micromirror device to transit form one state to another) of the individual micromirrors to the driving fields.

    摘要翻译: 本发明提供一种用于通过测量各个微镜对电场驱动力的机电响应来评估微镜阵列器件的产品质量和性能的方法和装置。 根据本发明的微反射镜的机电响应以与操作状态相关联的旋转角度进行描述,例如当微镜阵列器件在二进制编码器中操作时,ON和OFF状态的ON和OFF状态角, 状态模式以及各个微镜对驱动场的响应速度(即,微镜器件从一个状态转移到另一个状态所需的时间间隔)。

    Performance Analyses of Micromirror Devices
    10.
    发明申请
    Performance Analyses of Micromirror Devices 审中-公开
    微镜器件的性能分析

    公开(公告)号:US20090190825A1

    公开(公告)日:2009-07-30

    申请号:US12360083

    申请日:2009-01-26

    IPC分类号: G06K9/00 G01J1/42

    CPC分类号: G01N21/55 G01N21/95

    摘要: The invention provides a method and apparatus for evaluating the product quality and performances of micromirror array devices through measurements of the electromechanical responses of the individual micromirrors to the driving forces of electric fields. The electromechanical responses of the micromirrors according to the present invention are described in terms of the rotational angles associated with the operational states, such as the ON and OFF state angles of the ON and OFF state when the micromirror array device is operated in the binary-state mode, and the response speed (i.e. the time interval required for a micromirror device to transit form one state to another) of the individual micromirrors to the driving fields.

    摘要翻译: 本发明提供一种用于通过测量各个微镜对电场驱动力的机电响应来评估微镜阵列器件的产品质量和性能的方法和装置。 根据本发明的微反射镜的机电响应以与操作状态相关联的旋转角度进行描述,例如当微镜阵列器件在二进制编码器中操作时,ON和OFF状态的ON和OFF状态角, 状态模式以及各个微镜对驱动场的响应速度(即,微镜器件从一个状态转移到另一个状态所需的时间间隔)。