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公开(公告)号：US20160377657A1
公开(公告)日：2016-12-29
申请号：US15188024
申请日：2016-06-21
发明人： Rodney E. Schwartz , John K. Geist
摘要： A method is provided for using a loop-back test device to verify continuity between loop-back probes electrically connected to each other on a probe card, the loop-back test device including a first conductive region electrically connected to a substrate, a second conductive region electrically isolated from the substrate, the second conductive region spaced apart from the first conductive region such that when a first loop-back probe contacts the first conductive region a second loop-back probe contacts the second conductive region, The method includes placing the first loop-back probe in electrical contact with the first conductive region, and placing the second loop-back probe in electrical contact with the second conductive region. Continuity between the substrate and the second conductive region is then measured.
摘要翻译： 提供了一种使用回环测试装置来验证在探针卡上彼此电连接的环回探针之间的连续性的方法，所述环回测试装置包括电连接到衬底的第一导电区域，第二导电 所述第二导电区域与所述第一导电区域间隔开，使得当第一环回探针接触所述第一导电区域时，第二环回探针接触所述第二导电区域。所述方法包括将所述第一环回探针 环回探针与第一导电区域电接触，并且将第二环回探针与第二导电区域电接触。 然后测量衬底和第二导电区域之间的连续性。
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公开(公告)号：US10768206B2
公开(公告)日：2020-09-08
申请号：US15188024
申请日：2016-06-21
摘要： A method is provided for using a loop-back test device to verify continuity between loop-back probes electrically connected to each other on a probe card, the loop-back test device including a first conductive region electrically connected to a substrate, a second conductive region electrically isolated from the substrate, the second conductive region spaced apart from the first conductive region such that when a first loop-back probe contacts the first conductive region a second loop-back probe contacts the second conductive region, The method includes placing the first loop-back probe in electrical contact with the first conductive region, and placing the second loop-back probe in electrical contact with the second conductive region. Continuity between the substrate and the second conductive region is then measured.
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公开(公告)号：US20180321304A1
公开(公告)日：2018-11-08
申请号：US15587696
申请日：2017-05-05
CPC分类号： G01R31/2849 , G01R31/2628 , G01R31/27 , G01R31/2839
摘要： A device and method for performing Avalanche Mode Delta VsD testing of a semiconductor device under test (DUT), include a current source configured to provide energy in the form of a substantially non-decaying current to a DUT for heating of the DUT during an avalanche mode; and test circuitry electrically couplable to the current source and the DUT and configured to perform Avalanche Mode Delta VsD testing of the DUT.
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公开(公告)号：US11009540B2
公开(公告)日：2021-05-18
申请号：US15455810
申请日：2017-03-10
摘要： An energy supply for a test device includes an energy source configured to provide energy via an inductive element for use by test circuitry; and an energy recovery circuit electrically couplable to the energy source and configured to direct unused energy from the inductive element to the energy source.
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公开(公告)号：US20180259568A1
公开(公告)日：2018-09-13
申请号：US15455810
申请日：2017-03-10
摘要： An energy supply for a test device includes an energy source configured to provide energy via an inductive element for use by test circuitry; and an energy recovery circuit electrically couplable to the energy source and configured to direct unused energy from the inductive element to the energy source.
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公开(公告)号：US09304147B2
公开(公告)日：2016-04-05
申请号：US14317499
申请日：2014-06-27
发明人： Rodney Schwartz , Gary Rogers , Steven Clauter
CPC分类号： G01R1/06794 , G01R27/205
摘要： A method and circuit for implementing high current capability Kelvin connections and measuring the resistance of the contacts and connections to verify that the conducting path is capable of carrying the high current without damage or degraded performance. Included as well is the means and circuit for efficiently dividing a high current test stimulus current into 2 paths with low losses and voltage drops.
摘要翻译： 一种用于实现高电流能力开尔文连接并测量触点和连接的电阻的方法和电路，以验证导电路径能够承载高电流而不损坏或降低性能。 还包括用于将高电流测试激励电流有效地分成具有低损耗和电压降的2个路径的装置和电路。
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公开(公告)号：US20140354319A1
公开(公告)日：2014-12-04
申请号：US14317499
申请日：2014-06-27
发明人： Rodney Schwartz , Gary Rogers , Steven Clauter
CPC分类号： G01R1/06794 , G01R27/205
摘要： A method and circuit for implementing high current capability Kelvin connections and measuring the resistance of the contacts and connections to verify that the conducting path is capable of carrying the high current without damage or degraded performance. Included as well is the means and circuit for efficiently dividing a high current test stimulus current into 2 paths with low losses and voltage drops.
摘要翻译： 一种用于实现高电流能力开尔文连接并测量触点和连接的电阻的方法和电路，以验证导电路径能够承受高电流而不损坏或降低性能。 还包括用于将高电流测试激励电流有效地分成具有低损耗和电压降的2个路径的装置和电路。
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