公开(公告)号：US20180321304A1

公开(公告)日：2018-11-08

申请号：US15587696

申请日：2017-05-05

申请人： Integrated Technology Corporation

发明人： Steven T. Clauter ,  Ausin Hsu ,  Gary B. Rogers ,  Bradley Thomas Wolford

IPC分类号： G01R31/28 ,  G01R31/27 ,  G01R31/26

CPC分类号： G01R31/2849 ,  G01R31/2628 ,  G01R31/27 ,  G01R31/2839

摘要： A device and method for performing Avalanche Mode Delta VsD testing of a semiconductor device under test (DUT), include a current source configured to provide energy in the form of a substantially non-decaying current to a DUT for heating of the DUT during an avalanche mode; and test circuitry electrically couplable to the current source and the DUT and configured to perform Avalanche Mode Delta VsD testing of the DUT.